Abstract

The extraction of stable local features directly affects the performance of infrared face recognition algorithms. Recent studies on the application of scale invariant feature transform (SIFT) to infrared face recognition show that star-styled window filter (SWF) can filter out errors incorrectly introduced by SIFT. The current letter proposes an improved filter pattern called Y-styled window filter (YWF) to further eliminate the wrong matches. Compared with SWF, YWF patterns are sparser and do not maintain rotation invariance; thus, they are more suitable to infrared face recognition. Our experimental results demonstrate that a YWF-based averaging window outperforms an SWF-based one in reducing wrong matches, therefore improving the reliability of infrared face recognition systems.

© 2011 Chinese Optics Letters

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2010 (2)

Q. Zeng, L. Liu, and J. Li, Chin. Opt. Lett. 8, 573 (2010).

C. Tan, H. Wang, and D. Pei, Tsinghua Sci. Technol. 15, 357 (2010).

2005 (2)

M. Brown, R. Szeliski and S. Winder, in Proceedings of the 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 510 (2005).

S. G. Kong, J. Heo, B. R. Abidi, J. Paik, and M. A. Abidi, Comput. Vis. Image Und. 97, 103 (2005).

2004 (2)

D. G. Lowe, Int. J. Comput. Vision. 60, 91 (2004).

Y. Ke and R. Sukthankar, in Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 2, 506 (2004).

2001 (1)

P. L. Ding, J. F. Mei, L. M. Zhang, J. Infrared Millim. Wav. 20, 5 (2001).

2000 (1)

G. Chen and F. H. Qi, J. Infrared and Millim. Wav. 19, 5 (2000).

1997 (1)

C. Schmid and R. Mohr, IEEE Trans. Pattern Anal. 19, 530 (1997).

Abidi, B. R.

S. G. Kong, J. Heo, B. R. Abidi, J. Paik, and M. A. Abidi, Comput. Vis. Image Und. 97, 103 (2005).

Abidi, M. A.

S. G. Kong, J. Heo, B. R. Abidi, J. Paik, and M. A. Abidi, Comput. Vis. Image Und. 97, 103 (2005).

Brown, M.

M. Brown, R. Szeliski and S. Winder, in Proceedings of the 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 510 (2005).

Chen, G.

G. Chen and F. H. Qi, J. Infrared and Millim. Wav. 19, 5 (2000).

Ding, P. L.

P. L. Ding, J. F. Mei, L. M. Zhang, J. Infrared Millim. Wav. 20, 5 (2001).

Heo, J.

S. G. Kong, J. Heo, B. R. Abidi, J. Paik, and M. A. Abidi, Comput. Vis. Image Und. 97, 103 (2005).

Ke, Y.

Y. Ke and R. Sukthankar, in Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 2, 506 (2004).

Kong, S. G.

S. G. Kong, J. Heo, B. R. Abidi, J. Paik, and M. A. Abidi, Comput. Vis. Image Und. 97, 103 (2005).

Li, J.

Liu, L.

Lowe, D. G.

D. G. Lowe, Int. J. Comput. Vision. 60, 91 (2004).

Mei, J. F.

P. L. Ding, J. F. Mei, L. M. Zhang, J. Infrared Millim. Wav. 20, 5 (2001).

Mohr, R.

C. Schmid and R. Mohr, IEEE Trans. Pattern Anal. 19, 530 (1997).

Paik, J.

S. G. Kong, J. Heo, B. R. Abidi, J. Paik, and M. A. Abidi, Comput. Vis. Image Und. 97, 103 (2005).

Pei, D.

C. Tan, H. Wang, and D. Pei, Tsinghua Sci. Technol. 15, 357 (2010).

Qi, F. H.

G. Chen and F. H. Qi, J. Infrared and Millim. Wav. 19, 5 (2000).

Schmid, C.

C. Schmid and R. Mohr, IEEE Trans. Pattern Anal. 19, 530 (1997).

Sukthankar, R.

Y. Ke and R. Sukthankar, in Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 2, 506 (2004).

Tan, C.

C. Tan, H. Wang, and D. Pei, Tsinghua Sci. Technol. 15, 357 (2010).

Wang, H.

C. Tan, H. Wang, and D. Pei, Tsinghua Sci. Technol. 15, 357 (2010).

Winder, R. Szeliski and S.

M. Brown, R. Szeliski and S. Winder, in Proceedings of the 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 510 (2005).

Zeng, Q.

Zhang, L. M.

P. L. Ding, J. F. Mei, L. M. Zhang, J. Infrared Millim. Wav. 20, 5 (2001).

Chin. Opt. Lett. (1)

Comput. Vis. Image Und. (1)

S. G. Kong, J. Heo, B. R. Abidi, J. Paik, and M. A. Abidi, Comput. Vis. Image Und. 97, 103 (2005).

IEEE Trans. Pattern Anal. (1)

C. Schmid and R. Mohr, IEEE Trans. Pattern Anal. 19, 530 (1997).

in Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (1)

Y. Ke and R. Sukthankar, in Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 2, 506 (2004).

in Proceedings of the 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (1)

M. Brown, R. Szeliski and S. Winder, in Proceedings of the 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition 1, 510 (2005).

Int. J. Comput. Vision. (1)

D. G. Lowe, Int. J. Comput. Vision. 60, 91 (2004).

J. Infrared and Millim. Wav. (1)

G. Chen and F. H. Qi, J. Infrared and Millim. Wav. 19, 5 (2000).

J. Infrared Millim. Wav. (1)

P. L. Ding, J. F. Mei, L. M. Zhang, J. Infrared Millim. Wav. 20, 5 (2001).

Tsinghua Sci. Technol. (1)

C. Tan, H. Wang, and D. Pei, Tsinghua Sci. Technol. 15, 357 (2010).

Other (9)

Andrea Vedaldi, "SIFT for Matlab", http://www.vlfeat. org/vedaldi/code/sift.html (October, 2005).

D. G. Lowe, in Proceedings of International Conference on Computer Vision 1150 (1999).

A. Baumberg, in Proceedings of the International Conference on Computer Vision and Pattern Recognition 774 (2000).

T. Tuytelaars and L. Van Gool, in Proceedings of the 11th British Machine Vision Conference 412 (2000).

M. Brown and D. Lowe, in Proceedings of the 13th British Machine Vision Conference 253 (2002).

D. Socolinsky, L. Wolff, J. Neuheisel, and C. Eveland, in Proceeding of IEEE Workshop Computer Vision and Pattern Recognition 1, I-527 (2001).

A. Selinger, Appearance-Based Facial Recognition Using Visible and Thermal Imagery: a Comparative Study (Equinox Corp, New York, 2006).

F. Prokoski, in Proceeding of IEEE Workshop Computer Vision Beyond Visible Spectrum: Methods and Applications 3, 1688 (2000).

K. Mikolajczyk and C. Schmid, in Proceedings of Computer Vision and Pattern Recognition 2, II-257 (2003).

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