Abstract

We propose improved multilevel filters (IMLFs) involving the absolute value operation into the algorithmic framework of traditional multilevel filters (MLFs) to improve the robustness of infrared small target enhancement techniques under a complex infrared cluttered background. Compared with the widely used small target enhancement methods which only deal with bright targets, the proposed technique can enhance the infrared small target, whether it is bright or dark. Experimental results verify that the proposed technique is efficient and practical.

© 2011 Chinese Optics Letters

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2010

X. Bai and F. Zhou, Signal Process. 90, 2999 (2010).

H. Deng, J. Liu, and Z. Chen, Chin. Opt. Lett. 8, 24 (2010).

2009

2008

Ch.-Q. Gao, J.-W. Tian, and P. Wang, Electron. Lett. 44, 1349 (2008).

X. Bai, F. Zhou, and Y. Xie, J. Electron. Imag. 17, 030501 (2008).

2007

R. M. Liu, L. Yang, E. Liu, and J. Yang, Optical Eng. 46, 046402 (2007).

B. Zhang, T. Zhang, Z. Cao, and K. Zhang, Opt. Eng. 46, 106401 (2007).

2006

M. Zeng, J. Li, and Z. Peng, Infrared Phys. Tech. 48, 67 (2006).

2004

L. Yang, J. Yang, and K. Yang, Electron. Lett. 40, 1803 (2004).

H. M. A. Schleijpen and F. P. Neele, Proc. SPIE 5431, 66 (2004).

2002

F. P. Neele and W. de Jong, Proc. SPIE 4718, 156 (2002).

2001

Y.-S. Moon, T. X. Zhang, Z. R. Zuo, and Z. Zuo, Int. J. Pattern Recogn. Artif. Intell. 14, 907 (2001).

1999

S. D. Deshpande, M. H. Er, V. Ronda, and P. Chan, Proc. SPIE 3809, 74 (1999).

1998

Z. Zuo and T. Zhang, Proc. SPIE 3545, 372 (1998).

Bai, X.

X. Bai and F. Zhou, Signal Process. 90, 2999 (2010).

X. Bai, F. Zhou, and Y. Xie, J. Electron. Imag. 17, 030501 (2008).

Cao, Z.

B. Zhang, T. Zhang, Z. Cao, and K. Zhang, Opt. Eng. 46, 106401 (2007).

Chan, P.

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Chen, Z.

Deng, H.

Deshpande, S. D.

S. D. Deshpande, M. H. Er, V. Ronda, and P. Chan, Proc. SPIE 3809, 74 (1999).

Er, M. H.

S. D. Deshpande, M. H. Er, V. Ronda, and P. Chan, Proc. SPIE 3809, 74 (1999).

Gao, Ch.-Q.

Ch.-Q. Gao, J.-W. Tian, and P. Wang, Electron. Lett. 44, 1349 (2008).

Jong, W. de

F. P. Neele and W. de Jong, Proc. SPIE 4718, 156 (2002).

Li, J.

M. Zeng, J. Li, and Z. Peng, Infrared Phys. Tech. 48, 67 (2006).

Liu, E.

F. Wang, E. Liu, J. Yang, S. Yu, and Y. Zhou, Chin. Opt. Lett. 7, 576 (2009).

R. M. Liu, L. Yang, E. Liu, and J. Yang, Optical Eng. 46, 046402 (2007).

Liu, J.

Liu, R. M.

R. M. Liu, L. Yang, E. Liu, and J. Yang, Optical Eng. 46, 046402 (2007).

Moon, Y.-S.

Y.-S. Moon, T. X. Zhang, Z. R. Zuo, and Z. Zuo, Int. J. Pattern Recogn. Artif. Intell. 14, 907 (2001).

Neele, F. P.

H. M. A. Schleijpen and F. P. Neele, Proc. SPIE 5431, 66 (2004).

F. P. Neele and W. de Jong, Proc. SPIE 4718, 156 (2002).

Peng, Z.

M. Zeng, J. Li, and Z. Peng, Infrared Phys. Tech. 48, 67 (2006).

Ronda, V.

S. D. Deshpande, M. H. Er, V. Ronda, and P. Chan, Proc. SPIE 3809, 74 (1999).

Schleijpen, H. M. A.

H. M. A. Schleijpen and F. P. Neele, Proc. SPIE 5431, 66 (2004).

Tian, J.-W.

Ch.-Q. Gao, J.-W. Tian, and P. Wang, Electron. Lett. 44, 1349 (2008).

Wang, F.

Wang, P.

Ch.-Q. Gao, J.-W. Tian, and P. Wang, Electron. Lett. 44, 1349 (2008).

Xie, Y.

X. Bai, F. Zhou, and Y. Xie, J. Electron. Imag. 17, 030501 (2008).

Yang, J.

F. Wang, E. Liu, J. Yang, S. Yu, and Y. Zhou, Chin. Opt. Lett. 7, 576 (2009).

R. M. Liu, L. Yang, E. Liu, and J. Yang, Optical Eng. 46, 046402 (2007).

L. Yang, J. Yang, and K. Yang, Electron. Lett. 40, 1803 (2004).

Yang, K.

L. Yang, J. Yang, and K. Yang, Electron. Lett. 40, 1803 (2004).

Yang, L.

R. M. Liu, L. Yang, E. Liu, and J. Yang, Optical Eng. 46, 046402 (2007).

L. Yang, J. Yang, and K. Yang, Electron. Lett. 40, 1803 (2004).

Yu, S.

Zeng, M.

M. Zeng, J. Li, and Z. Peng, Infrared Phys. Tech. 48, 67 (2006).

Zhang, B.

B. Zhang, T. Zhang, Z. Cao, and K. Zhang, Opt. Eng. 46, 106401 (2007).

Zhang, K.

B. Zhang, T. Zhang, Z. Cao, and K. Zhang, Opt. Eng. 46, 106401 (2007).

Zhang, T.

B. Zhang, T. Zhang, Z. Cao, and K. Zhang, Opt. Eng. 46, 106401 (2007).

Z. Zuo and T. Zhang, Proc. SPIE 3545, 372 (1998).

Zhang, T. X.

Y.-S. Moon, T. X. Zhang, Z. R. Zuo, and Z. Zuo, Int. J. Pattern Recogn. Artif. Intell. 14, 907 (2001).

Zhou, F.

X. Bai and F. Zhou, Signal Process. 90, 2999 (2010).

X. Bai, F. Zhou, and Y. Xie, J. Electron. Imag. 17, 030501 (2008).

Zhou, Y.

Zuo, Z.

Y.-S. Moon, T. X. Zhang, Z. R. Zuo, and Z. Zuo, Int. J. Pattern Recogn. Artif. Intell. 14, 907 (2001).

Z. Zuo and T. Zhang, Proc. SPIE 3545, 372 (1998).

Zuo, Z. R.

Y.-S. Moon, T. X. Zhang, Z. R. Zuo, and Z. Zuo, Int. J. Pattern Recogn. Artif. Intell. 14, 907 (2001).

Chin. Opt. Lett.

Electron. Lett.

Ch.-Q. Gao, J.-W. Tian, and P. Wang, Electron. Lett. 44, 1349 (2008).

L. Yang, J. Yang, and K. Yang, Electron. Lett. 40, 1803 (2004).

Infrared Phys. Tech.

M. Zeng, J. Li, and Z. Peng, Infrared Phys. Tech. 48, 67 (2006).

Int. J. Pattern Recogn. Artif. Intell.

Y.-S. Moon, T. X. Zhang, Z. R. Zuo, and Z. Zuo, Int. J. Pattern Recogn. Artif. Intell. 14, 907 (2001).

J. Electron. Imag.

X. Bai, F. Zhou, and Y. Xie, J. Electron. Imag. 17, 030501 (2008).

Opt. Eng.

B. Zhang, T. Zhang, Z. Cao, and K. Zhang, Opt. Eng. 46, 106401 (2007).

Optical Eng.

R. M. Liu, L. Yang, E. Liu, and J. Yang, Optical Eng. 46, 046402 (2007).

Proc. SPIE

Z. Zuo and T. Zhang, Proc. SPIE 3545, 372 (1998).

S. D. Deshpande, M. H. Er, V. Ronda, and P. Chan, Proc. SPIE 3809, 74 (1999).

F. P. Neele and W. de Jong, Proc. SPIE 4718, 156 (2002).

H. M. A. Schleijpen and F. P. Neele, Proc. SPIE 5431, 66 (2004).

Signal Process.

X. Bai and F. Zhou, Signal Process. 90, 2999 (2010).

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