Abstract

Synthetic aperture integral imaging provides the ability to reconstruct partially occluded objects from multi-view images. However, the reconstructed images suffer from degraded contrast due to the superimposition of foreground defocus blur. We propose an algorithm to remove foreground occlusions before reconstructing backgrounds. Occlusions are identified by estimating the color variance on elemental images and then deleting it in the final synthetic image. We demonstrate the superiority of our method by presenting experimental results as well as comparing our method with other approaches.

© 2011 Chinese Optics Letters

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2010 (1)

B.-G. Lee, H.-H. Kang, and E.-S. Kim, 3D Res. 1(2), 6 (2010).

2009 (2)

Y. S. Hwang and E.-S. Kim, Proc. SPIE 7237, 723725 (2009).

M. DaneshPanah and B. Javidi, Opt. Lett. 34, 1105 (2009).

2008 (3)

D.-H. Shin, H. Yoo, C.-W. Tan, B.-G. Lee, and J.-J. Lee, Opt. Commun. 281, 4589 (2008).

M. Cho and B. Javidi, Opt Lett. 33, 2737 (2008).

D.-H. Shin, B.-G. Lee, and J.-J. Lee, Opt. Express 16, 16294 (2008).

2006 (1)

2002 (1)

1990 (1)

H. Gharavi and M. Mills, IEEE Trans. Circuits Syst. 37, 649 (1990).

Cho, M.

M. Cho and B. Javidi, Opt Lett. 33, 2737 (2008).

DaneshPanah, M.

Gharavi, H.

H. Gharavi and M. Mills, IEEE Trans. Circuits Syst. 37, 649 (1990).

Hong, S.-H.

Hwang, Y. S.

Y. S. Hwang and E.-S. Kim, Proc. SPIE 7237, 723725 (2009).

Jang, J.-S.

Javidi, B.

Kang, H.-H.

B.-G. Lee, H.-H. Kang, and E.-S. Kim, 3D Res. 1(2), 6 (2010).

Kim, E.-S.

B.-G. Lee, H.-H. Kang, and E.-S. Kim, 3D Res. 1(2), 6 (2010).

Y. S. Hwang and E.-S. Kim, Proc. SPIE 7237, 723725 (2009).

Lee, B.-G.

B.-G. Lee, H.-H. Kang, and E.-S. Kim, 3D Res. 1(2), 6 (2010).

D.-H. Shin, B.-G. Lee, and J.-J. Lee, Opt. Express 16, 16294 (2008).

D.-H. Shin, H. Yoo, C.-W. Tan, B.-G. Lee, and J.-J. Lee, Opt. Commun. 281, 4589 (2008).

Lee, J.-J.

D.-H. Shin, H. Yoo, C.-W. Tan, B.-G. Lee, and J.-J. Lee, Opt. Commun. 281, 4589 (2008).

D.-H. Shin, B.-G. Lee, and J.-J. Lee, Opt. Express 16, 16294 (2008).

Mills, M.

H. Gharavi and M. Mills, IEEE Trans. Circuits Syst. 37, 649 (1990).

Ponce-Diaz, R.

Shin, D.-H.

D.-H. Shin, H. Yoo, C.-W. Tan, B.-G. Lee, and J.-J. Lee, Opt. Commun. 281, 4589 (2008).

D.-H. Shin, B.-G. Lee, and J.-J. Lee, Opt. Express 16, 16294 (2008).

Tan, C.-W.

D.-H. Shin, H. Yoo, C.-W. Tan, B.-G. Lee, and J.-J. Lee, Opt. Commun. 281, 4589 (2008).

Yoo, H.

D.-H. Shin, H. Yoo, C.-W. Tan, B.-G. Lee, and J.-J. Lee, Opt. Commun. 281, 4589 (2008).

3D Res. (1)

B.-G. Lee, H.-H. Kang, and E.-S. Kim, 3D Res. 1(2), 6 (2010).

IEEE Trans. Circuits Syst. (1)

H. Gharavi and M. Mills, IEEE Trans. Circuits Syst. 37, 649 (1990).

Opt Lett. (1)

M. Cho and B. Javidi, Opt Lett. 33, 2737 (2008).

Opt. Commun. (1)

D.-H. Shin, H. Yoo, C.-W. Tan, B.-G. Lee, and J.-J. Lee, Opt. Commun. 281, 4589 (2008).

Opt. Express (1)

Opt. Lett. (3)

Proc. SPIE (1)

Y. S. Hwang and E.-S. Kim, Proc. SPIE 7237, 723725 (2009).

Other (4)

V. Vaish, R. Szeliski, C. L. Zitnick, and S. B. Kang, and M. Levoy, in Proceedings of IEEE Conference on Computer Vision and Pattern Recognition 2331 (2006).

A. Isaksen, L. McMillan, and S. J. Gortler, in Proceedings of ACM SIGGRAPH 2000 297 (2000).

B. Wilburn, N. Joshi, V. Vaish, E.-V. Talvala, E. Antunez, A. Barth, A. Adams, M. Horowitz, and M. Levoy, in Proceedings of ACM SIGGRAPH 2005 765 (2005).

N. Joshi, S. Avidan, W. Matusik, and D. J. Kriegman, in Proceedings of IEEE Conference on Computer Vision 1502 (2007).

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