Abstract

Based on structured-light vision measurement technology, we study a measuring method for microdiameter. The measurement principle and mathematical model are described. A novel grayscale barycenter extraction algorithm along the radial direction is proposed, which can precisely gather the image coordinates of the ellipse-shaped light-stripe centers. The accuracy of the measurement result shows marked improvement by using the algorithm. The method executes circle fitting to the measured three-dimensional (3D) data using linear least square method, which can acquire the diameter, surface profile, and other information of the object effectively. On the scene, a line-structured light vision system using the presented method is applied to measure the curvature radius of metal blades. Experimental results show that the measurement precision of the system is higher than 2 \mu m.

© 2010 Chinese Optics Letters

PDF Article

References

  • View by:
  • |
  • |
  • |

  1. Z. Liu, G. Zhang, Z. Wei, and J. Jiang, Acta Opt. Sin. (in Chinese) 29, 3124 (2009).
  2. G. Sansoni, S. Lazzari, S. Peli, and F. Docchio, in IEEE Proceedings of International Conference on Recent Advances in 3-D Digital and Modeling 19 (1997).
  3. C. Sun, B. Liu, and P. Wang, J. Vacuum Sci. Technol. B: Microelectron. Nanometer Structures 27, 1315 (2009).
  4. Q. Wu, J. Li, X. Su, and B. Hui, Chinese J. Lasers (in Chinese) 35, 1224 (2008).
  5. M. Tsai and C. Hung, J. International Measurement Confederation 38, 236 (2005).
  6. R. Y. Tsai, IEEE J. Robotics and Automation 3, 323 (1987).
  7. K. Hu, F. Zhou, and G. Zhang, Chin. J. Scientific Instrument (in Chinese) 27, 1326 (2006).
  8. C. Steger, IEEE Trans. Pattern Analysis and Machine Intelligence 20, 113 (1998).
  9. P. Wang, "Study on key techniques for automatic 3D structured-light scanning system" (in Chinese) PhD. Thesis (Tianjin University, 2009).
  10. A. W. Fitzgibbon, M. Pilu, and R. B. Fisher, IEEE Trans. Pattern Analysis and Machine Intelligence 21, 476 (1999).
  11. K. Peng, S. Liu, X. Zhang, and F. Huang, OptoElectron. Eng. (in Chinese) 33, 101 (2006).
  12. W. Gander, G. H. Golub, and R. Strebel, BIT Numerical Mathematics 34, 558 (1994).
  13. K. Liu, F. Zhou, and G. Zhang, J. Optoelectron. Lasers (in Chinese) 17, 604 (2006).
  14. G. Peng and X. Chen, J. Geodesy and Geodynamics (in Chinese) 28, 92 (2008).

2009 (2)

Z. Liu, G. Zhang, Z. Wei, and J. Jiang, Acta Opt. Sin. (in Chinese) 29, 3124 (2009).

C. Sun, B. Liu, and P. Wang, J. Vacuum Sci. Technol. B: Microelectron. Nanometer Structures 27, 1315 (2009).

2008 (2)

Q. Wu, J. Li, X. Su, and B. Hui, Chinese J. Lasers (in Chinese) 35, 1224 (2008).

G. Peng and X. Chen, J. Geodesy and Geodynamics (in Chinese) 28, 92 (2008).

2006 (3)

K. Liu, F. Zhou, and G. Zhang, J. Optoelectron. Lasers (in Chinese) 17, 604 (2006).

K. Hu, F. Zhou, and G. Zhang, Chin. J. Scientific Instrument (in Chinese) 27, 1326 (2006).

K. Peng, S. Liu, X. Zhang, and F. Huang, OptoElectron. Eng. (in Chinese) 33, 101 (2006).

2005 (1)

M. Tsai and C. Hung, J. International Measurement Confederation 38, 236 (2005).

1999 (1)

A. W. Fitzgibbon, M. Pilu, and R. B. Fisher, IEEE Trans. Pattern Analysis and Machine Intelligence 21, 476 (1999).

1998 (1)

C. Steger, IEEE Trans. Pattern Analysis and Machine Intelligence 20, 113 (1998).

1994 (1)

W. Gander, G. H. Golub, and R. Strebel, BIT Numerical Mathematics 34, 558 (1994).

1987 (1)

R. Y. Tsai, IEEE J. Robotics and Automation 3, 323 (1987).

Chen, X.

G. Peng and X. Chen, J. Geodesy and Geodynamics (in Chinese) 28, 92 (2008).

Fisher, R. B.

A. W. Fitzgibbon, M. Pilu, and R. B. Fisher, IEEE Trans. Pattern Analysis and Machine Intelligence 21, 476 (1999).

Fitzgibbon, A. W.

A. W. Fitzgibbon, M. Pilu, and R. B. Fisher, IEEE Trans. Pattern Analysis and Machine Intelligence 21, 476 (1999).

Gander, W.

W. Gander, G. H. Golub, and R. Strebel, BIT Numerical Mathematics 34, 558 (1994).

Golub, G. H.

W. Gander, G. H. Golub, and R. Strebel, BIT Numerical Mathematics 34, 558 (1994).

Hu, K.

K. Hu, F. Zhou, and G. Zhang, Chin. J. Scientific Instrument (in Chinese) 27, 1326 (2006).

Huang, F.

K. Peng, S. Liu, X. Zhang, and F. Huang, OptoElectron. Eng. (in Chinese) 33, 101 (2006).

Hui, B.

Q. Wu, J. Li, X. Su, and B. Hui, Chinese J. Lasers (in Chinese) 35, 1224 (2008).

Hung, C.

M. Tsai and C. Hung, J. International Measurement Confederation 38, 236 (2005).

Jiang, J.

Z. Liu, G. Zhang, Z. Wei, and J. Jiang, Acta Opt. Sin. (in Chinese) 29, 3124 (2009).

Li, J.

Q. Wu, J. Li, X. Su, and B. Hui, Chinese J. Lasers (in Chinese) 35, 1224 (2008).

Liu, B.

C. Sun, B. Liu, and P. Wang, J. Vacuum Sci. Technol. B: Microelectron. Nanometer Structures 27, 1315 (2009).

Liu, K.

K. Liu, F. Zhou, and G. Zhang, J. Optoelectron. Lasers (in Chinese) 17, 604 (2006).

Liu, S.

K. Peng, S. Liu, X. Zhang, and F. Huang, OptoElectron. Eng. (in Chinese) 33, 101 (2006).

Liu, Z.

Z. Liu, G. Zhang, Z. Wei, and J. Jiang, Acta Opt. Sin. (in Chinese) 29, 3124 (2009).

Peng, G.

G. Peng and X. Chen, J. Geodesy and Geodynamics (in Chinese) 28, 92 (2008).

Peng, K.

K. Peng, S. Liu, X. Zhang, and F. Huang, OptoElectron. Eng. (in Chinese) 33, 101 (2006).

Pilu, M.

A. W. Fitzgibbon, M. Pilu, and R. B. Fisher, IEEE Trans. Pattern Analysis and Machine Intelligence 21, 476 (1999).

Steger, C.

C. Steger, IEEE Trans. Pattern Analysis and Machine Intelligence 20, 113 (1998).

Strebel, R.

W. Gander, G. H. Golub, and R. Strebel, BIT Numerical Mathematics 34, 558 (1994).

Su, X.

Q. Wu, J. Li, X. Su, and B. Hui, Chinese J. Lasers (in Chinese) 35, 1224 (2008).

Sun, C.

C. Sun, B. Liu, and P. Wang, J. Vacuum Sci. Technol. B: Microelectron. Nanometer Structures 27, 1315 (2009).

Tsai, M.

M. Tsai and C. Hung, J. International Measurement Confederation 38, 236 (2005).

Tsai, R. Y.

R. Y. Tsai, IEEE J. Robotics and Automation 3, 323 (1987).

Wang, P.

C. Sun, B. Liu, and P. Wang, J. Vacuum Sci. Technol. B: Microelectron. Nanometer Structures 27, 1315 (2009).

Wei, Z.

Z. Liu, G. Zhang, Z. Wei, and J. Jiang, Acta Opt. Sin. (in Chinese) 29, 3124 (2009).

Wu, Q.

Q. Wu, J. Li, X. Su, and B. Hui, Chinese J. Lasers (in Chinese) 35, 1224 (2008).

Zhang, G.

Z. Liu, G. Zhang, Z. Wei, and J. Jiang, Acta Opt. Sin. (in Chinese) 29, 3124 (2009).

K. Hu, F. Zhou, and G. Zhang, Chin. J. Scientific Instrument (in Chinese) 27, 1326 (2006).

K. Liu, F. Zhou, and G. Zhang, J. Optoelectron. Lasers (in Chinese) 17, 604 (2006).

Zhang, X.

K. Peng, S. Liu, X. Zhang, and F. Huang, OptoElectron. Eng. (in Chinese) 33, 101 (2006).

Zhou, F.

K. Liu, F. Zhou, and G. Zhang, J. Optoelectron. Lasers (in Chinese) 17, 604 (2006).

K. Hu, F. Zhou, and G. Zhang, Chin. J. Scientific Instrument (in Chinese) 27, 1326 (2006).

Acta Opt. Sin. (in Chinese) (1)

Z. Liu, G. Zhang, Z. Wei, and J. Jiang, Acta Opt. Sin. (in Chinese) 29, 3124 (2009).

BIT Numerical Mathematics (1)

W. Gander, G. H. Golub, and R. Strebel, BIT Numerical Mathematics 34, 558 (1994).

Chin. J. Scientific Instrument (in Chinese) (1)

K. Hu, F. Zhou, and G. Zhang, Chin. J. Scientific Instrument (in Chinese) 27, 1326 (2006).

Chinese J. Lasers (in Chinese) (1)

Q. Wu, J. Li, X. Su, and B. Hui, Chinese J. Lasers (in Chinese) 35, 1224 (2008).

IEEE J. Robotics and Automation (1)

R. Y. Tsai, IEEE J. Robotics and Automation 3, 323 (1987).

IEEE Trans. Pattern Analysis and Machine Intelligence (2)

C. Steger, IEEE Trans. Pattern Analysis and Machine Intelligence 20, 113 (1998).

A. W. Fitzgibbon, M. Pilu, and R. B. Fisher, IEEE Trans. Pattern Analysis and Machine Intelligence 21, 476 (1999).

J. Geodesy and Geodynamics (in Chinese) (1)

G. Peng and X. Chen, J. Geodesy and Geodynamics (in Chinese) 28, 92 (2008).

J. International Measurement Confederation (1)

M. Tsai and C. Hung, J. International Measurement Confederation 38, 236 (2005).

J. Optoelectron. Lasers (in Chinese) (1)

K. Liu, F. Zhou, and G. Zhang, J. Optoelectron. Lasers (in Chinese) 17, 604 (2006).

J. Vacuum Sci. Technol. B: Microelectron. Nanometer Structures (1)

C. Sun, B. Liu, and P. Wang, J. Vacuum Sci. Technol. B: Microelectron. Nanometer Structures 27, 1315 (2009).

OptoElectron. Eng. (in Chinese) (1)

K. Peng, S. Liu, X. Zhang, and F. Huang, OptoElectron. Eng. (in Chinese) 33, 101 (2006).

Other (2)

P. Wang, "Study on key techniques for automatic 3D structured-light scanning system" (in Chinese) PhD. Thesis (Tianjin University, 2009).

G. Sansoni, S. Lazzari, S. Peli, and F. Docchio, in IEEE Proceedings of International Conference on Recent Advances in 3-D Digital and Modeling 19 (1997).

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.