Abstract

The method of fitting damage probability curves of laser-induced damage is introduced to investigate the laser-conditioning mechanism of ZrO2/SiO2 high re°ection (HR) films. The laser-induced damage thresholds (LIDTs) of the sample are tested before and after the laser-conditioning scanning process. The parameters of the defects are obtained through the fitting process of the damage probability curve. It can be concluded that the roles of laser conditioning include two aspects: removing defects with lower threshold and producing new defects with higher threshold. The effect of laser conditioning is dependent on the competition of these two aspects.

© 2010 Chinese Optics Letters

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X. Liu, D. Li, X. Li, Y. Zhao, and J. Shao, Chinese J. Lasers (in Chinese) 36, 1545 (2009).

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J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

2005

H. Krol, L. Gallais, C. Grezes-Besset, J.-Y. Natoli, and M. Commandre, Opt. Commun. 256, 184 (2005).

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Z.-X. Fan, Q. Zhao, H. Qiu, and R.-Y. Fan, Proc. SPIE 3244, 469 (1998).

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L. Sheehan, M. R. Kozlowski, F. Rainer, and M. C. Staggs, Proc. SPIE 2114, 559 (1993).

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M. E. Frink, J. W. Arenberg, D. W. Mordaunt, S. C. Seitel, M. T. Babb, and E. A. Teppo, Appl. Phys. Lett. 51, 415 (1987).

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C. R. Wolfe, M. R. Kozlowski, J. H. Cambell, and F. Rainer, Proc. SPIE 1438, 360 (1989).

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Commandre, M.

J. Capoulade, L. Gallais, J.-Y. Natoli, and M. Commandre, Appl. Opt. 47, 5272 (2008).

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Fan, Z.-X.

Z.-X. Fan, Q. Zhao, H. Qiu, and R.-Y. Fan, Proc. SPIE 3244, 469 (1998).

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M. E. Frink, J. W. Arenberg, D. W. Mordaunt, S. C. Seitel, M. T. Babb, and E. A. Teppo, Appl. Phys. Lett. 51, 415 (1987).

Gallais, L.

Grezes-Besset, C.

H. Krol, L. Gallais, C. Grezes-Besset, J.-Y. Natoli, and M. Commandre, Opt. Commun. 256, 184 (2005).

Hacher, E.

He, H.

Henking, R.

Huang, J.

J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

Jiang, X.

J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

Kaiser, N.

Kennedy, G.

Kozlowski, M. R.

L. Sheehan, M. R. Kozlowski, F. Rainer, and M. C. Staggs, Proc. SPIE 2114, 559 (1993).

M. R. Kozlowski, M. C. Staggs, F. Rainer, and J. Stathis, Proc. SPIE 1441, 269 (1990).

M. R. Kozlowski, C. R. Wolfe, M. C. Staggs, and J. H. Cambell, Proc. SPIE 1438, 376 (1989).

C. R. Wolfe, M. R. Kozlowski, J. H. Cambell, and F. Rainer, Proc. SPIE 1438, 360 (1989).

Krol, H.

H. Krol, L. Gallais, C. Grezes-Besset, J.-Y. Natoli, and M. Commandre, Opt. Commun. 256, 184 (2005).

Leung, K. M.

L. G. Deshazer, B. E. Newnam, and K. M. Leung, Appl. Phys. Lett. 23, 607 (1973).

Li, D.

X. Liu, D. Li, X. Li, Y. Zhao, and J. Shao, Chinese J. Lasers (in Chinese) 36, 1545 (2009).

D. Li, Y. Zhao, J. Shao, Z. Fan, and H. He, Chin. Opt. Lett. 6, 386 (2008).

Li, X.

X. Liu, D. Li, X. Li, Y. Zhao, and J. Shao, Chinese J. Lasers (in Chinese) 36, 1545 (2009).

Liu, X.

X. Liu, D. Li, X. Li, Y. Zhao, and J. Shao, Chinese J. Lasers (in Chinese) 36, 1545 (2009).

Lowdermilk, W. H.

Lu, H.

J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

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Mann, K.

Milam, D.

Mordaunt, D. W.

M. E. Frink, J. W. Arenberg, D. W. Mordaunt, S. C. Seitel, M. T. Babb, and E. A. Teppo, Appl. Phys. Lett. 51, 415 (1987).

Natoli, J. Y.

Natoli, J.-Y.

J. Capoulade, L. Gallais, J.-Y. Natoli, and M. Commandre, Appl. Opt. 47, 5272 (2008).

H. Krol, L. Gallais, C. Grezes-Besset, J.-Y. Natoli, and M. Commandre, Opt. Commun. 256, 184 (2005).

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L. G. Deshazer, B. E. Newnam, and K. M. Leung, Appl. Phys. Lett. 23, 607 (1973).

O'Connell, R. M.

Porteus, J. O.

Qiu, H.

Z.-X. Fan, Q. Zhao, H. Qiu, and R.-Y. Fan, Proc. SPIE 3244, 469 (1998).

Rainer, F.

L. Sheehan, M. R. Kozlowski, F. Rainer, and M. C. Staggs, Proc. SPIE 2114, 559 (1993).

M. R. Kozlowski, M. C. Staggs, F. Rainer, and J. Stathis, Proc. SPIE 1441, 269 (1990).

C. R. Wolfe, M. R. Kozlowski, J. H. Cambell, and F. Rainer, Proc. SPIE 1438, 360 (1989).

Raupch, L.

Ristau, D.

Seitel, S. C.

M. E. Frink, J. W. Arenberg, D. W. Mordaunt, S. C. Seitel, M. T. Babb, and E. A. Teppo, Appl. Phys. Lett. 51, 415 (1987).

J. O. Porteus and S. C. Seitel, Appl. Opt. 23, 3796 (1984).

Shao, J.

X. Liu, D. Li, X. Li, Y. Zhao, and J. Shao, Chinese J. Lasers (in Chinese) 36, 1545 (2009).

D. Li, Y. Zhao, J. Shao, Z. Fan, and H. He, Chin. Opt. Lett. 6, 386 (2008).

Sheehan, L.

L. Sheehan, M. R. Kozlowski, F. Rainer, and M. C. Staggs, Proc. SPIE 2114, 559 (1993).

Staggs, M. C.

L. Sheehan, M. R. Kozlowski, F. Rainer, and M. C. Staggs, Proc. SPIE 2114, 559 (1993).

M. R. Kozlowski, M. C. Staggs, F. Rainer, and J. Stathis, Proc. SPIE 1441, 269 (1990).

M. R. Kozlowski, C. R. Wolfe, M. C. Staggs, and J. H. Cambell, Proc. SPIE 1438, 376 (1989).

Stathis, J.

M. R. Kozlowski, M. C. Staggs, F. Rainer, and J. Stathis, Proc. SPIE 1441, 269 (1990).

Temple, P. A.

Teppo, E. A.

M. E. Frink, J. W. Arenberg, D. W. Mordaunt, S. C. Seitel, M. T. Babb, and E. A. Teppo, Appl. Phys. Lett. 51, 415 (1987).

Wang, H.

J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

Weissbrodt, P.

Wolfe, C. R.

C. R. Wolfe, M. R. Kozlowski, J. H. Cambell, and F. Rainer, Proc. SPIE 1438, 360 (1989).

M. R. Kozlowski, C. R. Wolfe, M. C. Staggs, and J. H. Cambell, Proc. SPIE 1438, 376 (1989).

Ye, B.

J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

Yuan, X.

J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

Zhao, Q.

Z.-X. Fan, Q. Zhao, H. Qiu, and R.-Y. Fan, Proc. SPIE 3244, 469 (1998).

Zhao, S.

J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

Zhao, Y.

X. Liu, D. Li, X. Li, Y. Zhao, and J. Shao, Chinese J. Lasers (in Chinese) 36, 1545 (2009).

D. Li, Y. Zhao, J. Shao, Z. Fan, and H. He, Chin. Opt. Lett. 6, 386 (2008).

Zheng, W.

J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

Appl. Opt.

Appl. Phys. Lett.

L. G. Deshazer, B. E. Newnam, and K. M. Leung, Appl. Phys. Lett. 23, 607 (1973).

M. E. Frink, J. W. Arenberg, D. W. Mordaunt, S. C. Seitel, M. T. Babb, and E. A. Teppo, Appl. Phys. Lett. 51, 415 (1987).

Chin. Opt. Lett.

Chinese J. Lasers (in Chinese)

J. Huang, H. Lu, B. Ye, S. Zhao, H. Wang, X. Jiang, X. Yuan, and W. Zheng, Chinese J. Lasers (in Chinese) 34, 723 (2007).

X. Liu, D. Li, X. Li, Y. Zhao, and J. Shao, Chinese J. Lasers (in Chinese) 36, 1545 (2009).

Opt. Commun.

H. Krol, L. Gallais, C. Grezes-Besset, J.-Y. Natoli, and M. Commandre, Opt. Commun. 256, 184 (2005).

Proc. SPIE

Z.-X. Fan, Q. Zhao, H. Qiu, and R.-Y. Fan, Proc. SPIE 3244, 469 (1998).

M. R. Kozlowski, M. C. Staggs, F. Rainer, and J. Stathis, Proc. SPIE 1441, 269 (1990).

L. Sheehan, M. R. Kozlowski, F. Rainer, and M. C. Staggs, Proc. SPIE 2114, 559 (1993).

C. R. Wolfe, M. R. Kozlowski, J. H. Cambell, and F. Rainer, Proc. SPIE 1438, 360 (1989).

M. R. Kozlowski, C. R. Wolfe, M. C. Staggs, and J. H. Cambell, Proc. SPIE 1438, 376 (1989).

Other

ISO standard 11254-1, "Determination of laser-damage threshold of optical surfaces--part 1: 1-on-1 test" (2000).

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