Abstract

A novel personal recognition system utilizing palm vein patterns and a novel technique to analyze these vein patterns is presented. The technique utilizes the curvelet transform to extract features from vein patterns to facilitate recognition. This technique provides optimally sparse representations of objects along the edges. Principal component analysis (PCA) is applied on curvelet-decomposed images for dimensionality reduction. A simple distance-based classifier, such as the nearest-neighbor (NN) classifier, is employed. The experiments are performed using our palm vein database. Experimental results show that the algorithm reaches a recognition accuracy of 99.6% on the database of 500 distinct subjects.

© 2010 Chinese Optics Letters

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2009 (1)

2008 (3)

2006 (1)

E. J. Candµes, L. Demanet, D. L. Donoho, and L. Ying, Multiscale Modeling and Simulation 5, 861 (2006).

2004 (2)

E. J. Candµes and D. L. Donoho, Comm. Pure and Appl. Math. 57, 219 (2004).

C.-L. Lin and K.-C. Fan, IEEE Trans. Circuits and Systems for Video Technol. 14, 199 (2004).

2003 (1)

E. J. Candes, Notices of American Mathematical Society 50, 1402 (2003).

2001 (1)

S.-K. Im, H.-M. Park, Y.-W. Kim, S.-C. Han, S.-W. Kim, and C.-H. Hang, J. Korean Phys. Soc. 38, 268 (2001).

2000 (1)

E. J. Candes and D. L. Donoho, Proc. SPIE 4119, 1 (2000).

1998 (1)

L. Hong, Y. Wan, and A. Jain, IEEE Trans. Pattern Anal. Mach. Intell. 20, 777 (1998).

Candµes, E. J.

E. J. Candµes, L. Demanet, D. L. Donoho, and L. Ying, Multiscale Modeling and Simulation 5, 861 (2006).

E. J. Candµes and D. L. Donoho, Comm. Pure and Appl. Math. 57, 219 (2004).

Candes, E. J.

E. J. Candes, Notices of American Mathematical Society 50, 1402 (2003).

E. J. Candes and D. L. Donoho, Proc. SPIE 4119, 1 (2000).

Cho, D. S.

L. Wang, G. Leedham, and D. S. Cho, Pattern Recognition 41, 920 (2008).

Demanet, L.

E. J. Candµes, L. Demanet, D. L. Donoho, and L. Ying, Multiscale Modeling and Simulation 5, 861 (2006).

Donoho, D. L.

E. J. Candµes, L. Demanet, D. L. Donoho, and L. Ying, Multiscale Modeling and Simulation 5, 861 (2006).

E. J. Candµes and D. L. Donoho, Comm. Pure and Appl. Math. 57, 219 (2004).

E. J. Candes and D. L. Donoho, Proc. SPIE 4119, 1 (2000).

Fan, K.-C.

C.-L. Lin and K.-C. Fan, IEEE Trans. Circuits and Systems for Video Technol. 14, 199 (2004).

Fu, X.

Han, S.-C.

S.-K. Im, H.-M. Park, Y.-W. Kim, S.-C. Han, S.-W. Kim, and C.-H. Hang, J. Korean Phys. Soc. 38, 268 (2001).

Hang, C.-H.

S.-K. Im, H.-M. Park, Y.-W. Kim, S.-C. Han, S.-W. Kim, and C.-H. Hang, J. Korean Phys. Soc. 38, 268 (2001).

He, Z.

Hong, L.

L. Hong, Y. Wan, and A. Jain, IEEE Trans. Pattern Anal. Mach. Intell. 20, 777 (1998).

Im, S.-K.

S.-K. Im, H.-M. Park, Y.-W. Kim, S.-C. Han, S.-W. Kim, and C.-H. Hang, J. Korean Phys. Soc. 38, 268 (2001).

Jain, A.

L. Hong, Y. Wan, and A. Jain, IEEE Trans. Pattern Anal. Mach. Intell. 20, 777 (1998).

Jiang, J.

Kim, S.-W.

S.-K. Im, H.-M. Park, Y.-W. Kim, S.-C. Han, S.-W. Kim, and C.-H. Hang, J. Korean Phys. Soc. 38, 268 (2001).

Kim, Y.-W.

S.-K. Im, H.-M. Park, Y.-W. Kim, S.-C. Han, S.-W. Kim, and C.-H. Hang, J. Korean Phys. Soc. 38, 268 (2001).

Leedham, G.

L. Wang, G. Leedham, and D. S. Cho, Pattern Recognition 41, 920 (2008).

Lin, C.-L.

C.-L. Lin and K.-C. Fan, IEEE Trans. Circuits and Systems for Video Technol. 14, 199 (2004).

Liu, T.

Park, H.-M.

S.-K. Im, H.-M. Park, Y.-W. Kim, S.-C. Han, S.-W. Kim, and C.-H. Hang, J. Korean Phys. Soc. 38, 268 (2001).

Wan, Y.

L. Hong, Y. Wan, and A. Jain, IEEE Trans. Pattern Anal. Mach. Intell. 20, 777 (1998).

Wang, L.

L. Wang, G. Leedham, and D. S. Cho, Pattern Recognition 41, 920 (2008).

Wang, Y.

Wei, W.

Ye, X.

Ying, L.

E. J. Candµes, L. Demanet, D. L. Donoho, and L. Ying, Multiscale Modeling and Simulation 5, 861 (2006).

Zhao, Z.

Chin. Opt. Lett. (3)

Comm. Pure and Appl. Math. (1)

E. J. Candµes and D. L. Donoho, Comm. Pure and Appl. Math. 57, 219 (2004).

IEEE Trans. Circuits and Systems for Video Technol. (1)

C.-L. Lin and K.-C. Fan, IEEE Trans. Circuits and Systems for Video Technol. 14, 199 (2004).

IEEE Trans. Pattern Anal. Mach. Intell. (1)

L. Hong, Y. Wan, and A. Jain, IEEE Trans. Pattern Anal. Mach. Intell. 20, 777 (1998).

J. Korean Phys. Soc. (1)

S.-K. Im, H.-M. Park, Y.-W. Kim, S.-C. Han, S.-W. Kim, and C.-H. Hang, J. Korean Phys. Soc. 38, 268 (2001).

Multiscale Modeling and Simulation (1)

E. J. Candµes, L. Demanet, D. L. Donoho, and L. Ying, Multiscale Modeling and Simulation 5, 861 (2006).

Notices of American Mathematical Society (1)

E. J. Candes, Notices of American Mathematical Society 50, 1402 (2003).

Pattern Recognition (1)

L. Wang, G. Leedham, and D. S. Cho, Pattern Recognition 41, 920 (2008).

Proc. SPIE (1)

E. J. Candes and D. L. Donoho, Proc. SPIE 4119, 1 (2000).

Other (6)

P. Tao, "Robust digital watermarking in the curvelet domain", PhD. Thesis (The City University of New York, 2008).

S. Fantini and M. A. Franceschini, (eds.) Handbook of Optical Biomedical Diagnostics (SPIE Press, Bellingham, 2002) chap. 7.

E. J. Candµes and D. L. Donoho, in Curves and Surfaces, C. Rabut, A. Cohen, and L. L. Schumaker, (eds.) (Vanderbilt University Press, Nashville, 2000) P. 105.

Fujitsu-Laboratories-Ltd, "Fujitsu laboratories develops technology for world's first contactless palm vein pattern biometric authentication system" http://pr.fujitsu.com/en/news/2003/03/31.html (Mar.31, 2003).

J. M. Cross and C. L. Smith, in Proceedings of IEEE 29th International Carnahan Conference on Security Technology 20 (1995).

S.-K. Im, H.-M. Park, S.-W. Kim, C.-K. Chung, and H.-S. Choi, IEEE Int. Conf. Consumer Electronics Dig. Tech. Paper 2 (2000).

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