Abstract

Utilizing the intersecting cortical model (ICM) to enhance degraded images under poor illumination is presented. As the key point, the general mapping function (MF) for image enhancement is deduced firstly on the basis of the nature-firing ICM (NF-ICM), which restrains the traditional autowave effect of blurring details and contrast. Then, the sigmoid MF is especially proposed to map the input gray-level to a more proper range for visual looking, and it solves over-enhancement and artifact by the classical logarithm one. For image enhancement application, the optimized parameters, initial threshold, and stopping condition in NF-ICM are all analyzed in detail. Simulation results prove that the proposed method has more contrasted, colorful, and good-visual performance.

© 2010 Chinese Optics Letters

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  10. D. J. Jobson, Z. Rahman, and G. A. Woodell, Proc. SPIE 4736, 25 (2002).
  11. D. Wang, Y. Hou, and J. Peng, PDE for Image Processing (in Chinese) (Science Press, Beijing, 2008).
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  15. J. Yu, H. Chen, W. Wang, and J. Li, Acta Electron. Sin. (in Chinese) 36, 81 (2008).

2010

Z. Wang, Y. Ma, F. Cheng, and L. Yang, Image and Vision Computing 28, 5 (2010).

2009

2008

J. Yu, H. Chen, W. Wang, and J. Li, Acta Electron. Sin. (in Chinese) 36, 81 (2008).

J. Pang, R. Zhang, H. Zhang, X. Huang, and Z. Liu, Chin. Opt. Lett. 6, 491 (2008).

2007

W. Gong, K. Si, X. Ye, and W. Gu, Chin. J. Sensors and Actuators (in Chinese) 20, 2024 (2007).

2006

Z. Chen, B. R. Abidi, D. L. Page, and M. A. Abidi, IEEE Trans. Image Processing 15, 2290 (2006).

2004

U. Ekblad and J. M. Kinser, Signal Processing 84, 1131(2004).

L. Zhang and L. Huang, J. Optoelectron. Laser (in Chinese) 15, 877 (2004).

2003

J. Zhang and T. Lu, Computer Engineering and Application (in Chinese) 39, (19) 93 (2003).

2002

D. J. Jobson, Z. Rahman, and G. A. Woodell, Proc. SPIE 4736, 25 (2002).

2000

J. M. Kinser and C. Nguyen, Pattern Recogn. Lett. 21, 221 (2000).

Abidi, B. R.

Z. Chen, B. R. Abidi, D. L. Page, and M. A. Abidi, IEEE Trans. Image Processing 15, 2290 (2006).

Abidi, M. A.

Z. Chen, B. R. Abidi, D. L. Page, and M. A. Abidi, IEEE Trans. Image Processing 15, 2290 (2006).

Bi, D.

Chen, H.

J. Yu, H. Chen, W. Wang, and J. Li, Acta Electron. Sin. (in Chinese) 36, 81 (2008).

Chen, Z.

Z. Chen, B. R. Abidi, D. L. Page, and M. A. Abidi, IEEE Trans. Image Processing 15, 2290 (2006).

Cheng, F.

Z. Wang, Y. Ma, F. Cheng, and L. Yang, Image and Vision Computing 28, 5 (2010).

Ekblad, U.

U. Ekblad and J. M. Kinser, Signal Processing 84, 1131(2004).

Gao, S.

Gong, W.

W. Gong, K. Si, X. Ye, and W. Gu, Chin. J. Sensors and Actuators (in Chinese) 20, 2024 (2007).

Gu, W.

W. Gong, K. Si, X. Ye, and W. Gu, Chin. J. Sensors and Actuators (in Chinese) 20, 2024 (2007).

Huang, L.

L. Zhang and L. Huang, J. Optoelectron. Laser (in Chinese) 15, 877 (2004).

Huang, X.

Jobson, D. J.

D. J. Jobson, Z. Rahman, and G. A. Woodell, Proc. SPIE 4736, 25 (2002).

Kinser, J. M.

U. Ekblad and J. M. Kinser, Signal Processing 84, 1131(2004).

J. M. Kinser and C. Nguyen, Pattern Recogn. Lett. 21, 221 (2000).

Li, C.

Li, J.

J. Yu, H. Chen, W. Wang, and J. Li, Acta Electron. Sin. (in Chinese) 36, 81 (2008).

Liu, Z.

Lu, T.

J. Zhang and T. Lu, Computer Engineering and Application (in Chinese) 39, (19) 93 (2003).

Ma, Y.

Z. Wang, Y. Ma, F. Cheng, and L. Yang, Image and Vision Computing 28, 5 (2010).

Nguyen, C.

J. M. Kinser and C. Nguyen, Pattern Recogn. Lett. 21, 221 (2000).

Page, D. L.

Z. Chen, B. R. Abidi, D. L. Page, and M. A. Abidi, IEEE Trans. Image Processing 15, 2290 (2006).

Pang, J.

Rahman, Z.

D. J. Jobson, Z. Rahman, and G. A. Woodell, Proc. SPIE 4736, 25 (2002).

Si, K.

W. Gong, K. Si, X. Ye, and W. Gu, Chin. J. Sensors and Actuators (in Chinese) 20, 2024 (2007).

Wang, W.

J. Yu, H. Chen, W. Wang, and J. Li, Acta Electron. Sin. (in Chinese) 36, 81 (2008).

Wang, Z.

Z. Wang, Y. Ma, F. Cheng, and L. Yang, Image and Vision Computing 28, 5 (2010).

Woodell, G. A.

D. J. Jobson, Z. Rahman, and G. A. Woodell, Proc. SPIE 4736, 25 (2002).

Yang, L.

Z. Wang, Y. Ma, F. Cheng, and L. Yang, Image and Vision Computing 28, 5 (2010).

Ye, X.

W. Gong, K. Si, X. Ye, and W. Gu, Chin. J. Sensors and Actuators (in Chinese) 20, 2024 (2007).

Yu, J.

J. Yu, H. Chen, W. Wang, and J. Li, Acta Electron. Sin. (in Chinese) 36, 81 (2008).

Zhang, H.

Zhang, J.

J. Zhang and T. Lu, Computer Engineering and Application (in Chinese) 39, (19) 93 (2003).

Zhang, L.

L. Zhang and L. Huang, J. Optoelectron. Laser (in Chinese) 15, 877 (2004).

Zhang, R.

Acta Electron. Sin. (in Chinese)

J. Yu, H. Chen, W. Wang, and J. Li, Acta Electron. Sin. (in Chinese) 36, 81 (2008).

Chin. J. Sensors and Actuators (in Chinese)

W. Gong, K. Si, X. Ye, and W. Gu, Chin. J. Sensors and Actuators (in Chinese) 20, 2024 (2007).

Chin. Opt. Lett.

Computer Engineering and Application (in Chinese)

J. Zhang and T. Lu, Computer Engineering and Application (in Chinese) 39, (19) 93 (2003).

IEEE Trans. Image Processing

Z. Chen, B. R. Abidi, D. L. Page, and M. A. Abidi, IEEE Trans. Image Processing 15, 2290 (2006).

Image and Vision Computing

Z. Wang, Y. Ma, F. Cheng, and L. Yang, Image and Vision Computing 28, 5 (2010).

J. Optoelectron. Laser (in Chinese)

L. Zhang and L. Huang, J. Optoelectron. Laser (in Chinese) 15, 877 (2004).

Pattern Recogn. Lett.

J. M. Kinser and C. Nguyen, Pattern Recogn. Lett. 21, 221 (2000).

Proc. SPIE

D. J. Jobson, Z. Rahman, and G. A. Woodell, Proc. SPIE 4736, 25 (2002).

Signal Processing

U. Ekblad and J. M. Kinser, Signal Processing 84, 1131(2004).

Other

T. Lindblad and J. M. Kinser, Image Processing Using Pulse-Coupled Neural Networks (2nd edn.) (Springer, Berlin, 2005).

J. M. Kinser, "Image signatures: ontology and Classification" in Proceedings of the 4th IASTED Int. Conf. on Computer Graphics and Imaging (2001).

D. Wang, Y. Hou, and J. Peng, PDE for Image Processing (in Chinese) (Science Press, Beijing, 2008).

Y. Ma, L. Li, K. Zhan, and Z. Wang, Pulse-Coupled Neural Network and Digital Image Processing (in Chinese)(Science Press, Beijing, 2008).

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