Abstract

We present the investigation on LaF<sub>3</sub>/porous silicon (PS) system that has properties of both the materials to be applied in photonics. Epilayers of LaF<sub>3</sub> are grown on PS under different anodization conditions using electron-beam evaporation (EBE). The characteristics of the LaF<sub>3</sub>/PS system are analyzed by X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive X-ray spectroscopy (EDX), and photoluminescence (PL). XRD confirms the polycrystalline nature of the LaF<sub>3</sub> film. Nearly stoichiometric growth of LaF<sub>3</sub> on PS is established by EDX. Such a thin LaF<sub>3</sub> layer grown on PS leads to a good enhancement of PL yield of PS. But with the increasing thickness of LaF<sub>3</sub> layer, PL intensity of PS is found to decrease along with a small blue-shift.

© 2010 Chinese Optics Letters

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2008 (1)

H. Bandarenka, M. Balucani, R. Crescenzi, and A. Ferrari, Super. Microstruct. 44, 583 (2008).

2005 (1)

H. Park, K. Prabakar, Y. Yoo, S. Hwang, and C. Lee, Mater. Sci. Forum 486{487, 21 (2005).

2004 (2)

D. Kim, J. Shim, and N. Cho, Appl. Surf. Sci. 234, 256 (2004).

L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay, J. Vac. Sci. Technol. B 22, 583 (2004).

2003 (1)

B. Gelloz, H. Sano, R. Boukherroub, D. D. M. Wayner, D. J. Lockwood, and N. Kashida, Appl. Phys. Lett. 83, 2342 (2003).

2002 (3)

S. Ghosh, H. Kim, K. Hong, and C. Lee, Mater. Sci. Eng. B 95, 171 (2002).

R. Thielsch, A. Gatto, J. Heber, and N. Kaiser, Thin Solid Films 410, 86 (2002).

H. Li, B. Huang, D. Yi, H. Cui, Y. He, and J. Peng, Chin. Phys. Lett. 19, 1013 (2002).

2001 (1)

M. Ohmukai, M. Taniguchi, and Y. Tsutsumi, Mater. Sci. Eng. B 86, 26 (2001).

2000 (5)

T. Nguyen, P. Joubert, P. Destruel, Ph. Rendu, and M. Lakehal, Phys. Stat. Sol. (a) 182, 169 (2000).

A. Gokarna, S. Bhoraskar, N. Pavaskar, and S. Sathaye, Phys. Stat. Sol. (a) 182, 175 (2000).

A. Missaoui, M. Saadoun, H. Ezzaouia, B. Bessais, T. Boufaden, A. Rebey, and B. Jani, Phys. Stat. Sol. (a) 182, 189 (2000).

C. C. Chang and C. H. Lee, Thin Solid Films 379, 287 (2000).

R. Boukherroub, S. Morin, D. D. M. Wayner, and D. J. Lockwood, Phys. Stat. Sol. (a) 182, 117 (2000).

1997 (3)

A. G. Cullis, L. T. Canham, and P. D. J. Calcott, J. Appl. Phys. 82, 909 (1997).

E. D. Thoma, H. Shields, Y. Zhang, B. C. McCollum, and R. T. Williams, J. Lumin. 71, 93 (1997).

A. Tikhonravov, M. Trubetskov, B. Sullivan, and J. Dobrowolski, Appl. Opt. 36, 7188 (1997).

1996 (1)

T. W. Kang, J. Y. Leem, and T. W. Kim, Microelectron. J. 27, 423 (1996).

1982 (1)

Balucani, M.

H. Bandarenka, M. Balucani, R. Crescenzi, and A. Ferrari, Super. Microstruct. 44, 583 (2008).

Bandarenka, H.

H. Bandarenka, M. Balucani, R. Crescenzi, and A. Ferrari, Super. Microstruct. 44, 583 (2008).

Bessais, B.

A. Missaoui, M. Saadoun, H. Ezzaouia, B. Bessais, T. Boufaden, A. Rebey, and B. Jani, Phys. Stat. Sol. (a) 182, 189 (2000).

Bhoraskar, S.

A. Gokarna, S. Bhoraskar, N. Pavaskar, and S. Sathaye, Phys. Stat. Sol. (a) 182, 175 (2000).

Borgogno, J.

Boufaden, T.

A. Missaoui, M. Saadoun, H. Ezzaouia, B. Bessais, T. Boufaden, A. Rebey, and B. Jani, Phys. Stat. Sol. (a) 182, 189 (2000).

Boukherroub, R.

B. Gelloz, H. Sano, R. Boukherroub, D. D. M. Wayner, D. J. Lockwood, and N. Kashida, Appl. Phys. Lett. 83, 2342 (2003).

R. Boukherroub, S. Morin, D. D. M. Wayner, and D. J. Lockwood, Phys. Stat. Sol. (a) 182, 117 (2000).

Calcott, P. D. J.

A. G. Cullis, L. T. Canham, and P. D. J. Calcott, J. Appl. Phys. 82, 909 (1997).

Canham, L. T.

A. G. Cullis, L. T. Canham, and P. D. J. Calcott, J. Appl. Phys. 82, 909 (1997).

Chang, C. C.

C. C. Chang and C. H. Lee, Thin Solid Films 379, 287 (2000).

Cho, N.

D. Kim, J. Shim, and N. Cho, Appl. Surf. Sci. 234, 256 (2004).

Crescenzi, R.

H. Bandarenka, M. Balucani, R. Crescenzi, and A. Ferrari, Super. Microstruct. 44, 583 (2008).

Cui, H.

H. Li, B. Huang, D. Yi, H. Cui, Y. He, and J. Peng, Chin. Phys. Lett. 19, 1013 (2002).

Cullis, A. G.

A. G. Cullis, L. T. Canham, and P. D. J. Calcott, J. Appl. Phys. 82, 909 (1997).

Destruel, P.

T. Nguyen, P. Joubert, P. Destruel, Ph. Rendu, and M. Lakehal, Phys. Stat. Sol. (a) 182, 169 (2000).

Dobrowolski, J.

Ee, Y. K.

L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay, J. Vac. Sci. Technol. B 22, 583 (2004).

Ezzaouia, H.

A. Missaoui, M. Saadoun, H. Ezzaouia, B. Bessais, T. Boufaden, A. Rebey, and B. Jani, Phys. Stat. Sol. (a) 182, 189 (2000).

Ferrari, A.

H. Bandarenka, M. Balucani, R. Crescenzi, and A. Ferrari, Super. Microstruct. 44, 583 (2008).

Gatto, A.

R. Thielsch, A. Gatto, J. Heber, and N. Kaiser, Thin Solid Films 410, 86 (2002).

Gelloz, B.

B. Gelloz, H. Sano, R. Boukherroub, D. D. M. Wayner, D. J. Lockwood, and N. Kashida, Appl. Phys. Lett. 83, 2342 (2003).

Ghosh, S.

S. Ghosh, H. Kim, K. Hong, and C. Lee, Mater. Sci. Eng. B 95, 171 (2002).

Gokarna, A.

A. Gokarna, S. Bhoraskar, N. Pavaskar, and S. Sathaye, Phys. Stat. Sol. (a) 182, 175 (2000).

He, Y.

H. Li, B. Huang, D. Yi, H. Cui, Y. He, and J. Peng, Chin. Phys. Lett. 19, 1013 (2002).

Heber, J.

R. Thielsch, A. Gatto, J. Heber, and N. Kaiser, Thin Solid Films 410, 86 (2002).

Hong, K.

S. Ghosh, H. Kim, K. Hong, and C. Lee, Mater. Sci. Eng. B 95, 171 (2002).

Huang, B.

H. Li, B. Huang, D. Yi, H. Cui, Y. He, and J. Peng, Chin. Phys. Lett. 19, 1013 (2002).

Hwang, S.

H. Park, K. Prabakar, Y. Yoo, S. Hwang, and C. Lee, Mater. Sci. Forum 486{487, 21 (2005).

Jani, B.

A. Missaoui, M. Saadoun, H. Ezzaouia, B. Bessais, T. Boufaden, A. Rebey, and B. Jani, Phys. Stat. Sol. (a) 182, 189 (2000).

Joubert, P.

T. Nguyen, P. Joubert, P. Destruel, Ph. Rendu, and M. Lakehal, Phys. Stat. Sol. (a) 182, 169 (2000).

Kaiser, N.

R. Thielsch, A. Gatto, J. Heber, and N. Kaiser, Thin Solid Films 410, 86 (2002).

Kang, T. W.

T. W. Kang, J. Y. Leem, and T. W. Kim, Microelectron. J. 27, 423 (1996).

Kashida, N.

B. Gelloz, H. Sano, R. Boukherroub, D. D. M. Wayner, D. J. Lockwood, and N. Kashida, Appl. Phys. Lett. 83, 2342 (2003).

Kim, D.

D. Kim, J. Shim, and N. Cho, Appl. Surf. Sci. 234, 256 (2004).

Kim, H.

S. Ghosh, H. Kim, K. Hong, and C. Lee, Mater. Sci. Eng. B 95, 171 (2002).

Kim, T. W.

T. W. Kang, J. Y. Leem, and T. W. Kim, Microelectron. J. 27, 423 (1996).

Lakehal, M.

T. Nguyen, P. Joubert, P. Destruel, Ph. Rendu, and M. Lakehal, Phys. Stat. Sol. (a) 182, 169 (2000).

Lazarides, B.

Lee, C.

H. Park, K. Prabakar, Y. Yoo, S. Hwang, and C. Lee, Mater. Sci. Forum 486{487, 21 (2005).

S. Ghosh, H. Kim, K. Hong, and C. Lee, Mater. Sci. Eng. B 95, 171 (2002).

Lee, C. H.

C. C. Chang and C. H. Lee, Thin Solid Films 379, 287 (2000).

Leem, J. Y.

T. W. Kang, J. Y. Leem, and T. W. Kim, Microelectron. J. 27, 423 (1996).

Li, H.

H. Li, B. Huang, D. Yi, H. Cui, Y. He, and J. Peng, Chin. Phys. Lett. 19, 1013 (2002).

Lockwood, D. J.

B. Gelloz, H. Sano, R. Boukherroub, D. D. M. Wayner, D. J. Lockwood, and N. Kashida, Appl. Phys. Lett. 83, 2342 (2003).

R. Boukherroub, S. Morin, D. D. M. Wayner, and D. J. Lockwood, Phys. Stat. Sol. (a) 182, 117 (2000).

McCollum, B. C.

E. D. Thoma, H. Shields, Y. Zhang, B. C. McCollum, and R. T. Williams, J. Lumin. 71, 93 (1997).

Missaoui, A.

A. Missaoui, M. Saadoun, H. Ezzaouia, B. Bessais, T. Boufaden, A. Rebey, and B. Jani, Phys. Stat. Sol. (a) 182, 189 (2000).

Morin, S.

R. Boukherroub, S. Morin, D. D. M. Wayner, and D. J. Lockwood, Phys. Stat. Sol. (a) 182, 117 (2000).

Nguyen, T.

T. Nguyen, P. Joubert, P. Destruel, Ph. Rendu, and M. Lakehal, Phys. Stat. Sol. (a) 182, 169 (2000).

Ohmukai, M.

M. Ohmukai, M. Taniguchi, and Y. Tsutsumi, Mater. Sci. Eng. B 86, 26 (2001).

Pan, L. K.

L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay, J. Vac. Sci. Technol. B 22, 583 (2004).

Park, H.

H. Park, K. Prabakar, Y. Yoo, S. Hwang, and C. Lee, Mater. Sci. Forum 486{487, 21 (2005).

Pavaskar, N.

A. Gokarna, S. Bhoraskar, N. Pavaskar, and S. Sathaye, Phys. Stat. Sol. (a) 182, 175 (2000).

Pelletier, E.

Peng, J.

H. Li, B. Huang, D. Yi, H. Cui, Y. He, and J. Peng, Chin. Phys. Lett. 19, 1013 (2002).

Prabakar, K.

H. Park, K. Prabakar, Y. Yoo, S. Hwang, and C. Lee, Mater. Sci. Forum 486{487, 21 (2005).

Rebey, A.

A. Missaoui, M. Saadoun, H. Ezzaouia, B. Bessais, T. Boufaden, A. Rebey, and B. Jani, Phys. Stat. Sol. (a) 182, 189 (2000).

Rendu, Ph.

T. Nguyen, P. Joubert, P. Destruel, Ph. Rendu, and M. Lakehal, Phys. Stat. Sol. (a) 182, 169 (2000).

Saadoun, M.

A. Missaoui, M. Saadoun, H. Ezzaouia, B. Bessais, T. Boufaden, A. Rebey, and B. Jani, Phys. Stat. Sol. (a) 182, 189 (2000).

Sano, H.

B. Gelloz, H. Sano, R. Boukherroub, D. D. M. Wayner, D. J. Lockwood, and N. Kashida, Appl. Phys. Lett. 83, 2342 (2003).

Sathaye, S.

A. Gokarna, S. Bhoraskar, N. Pavaskar, and S. Sathaye, Phys. Stat. Sol. (a) 182, 175 (2000).

Shields, H.

E. D. Thoma, H. Shields, Y. Zhang, B. C. McCollum, and R. T. Williams, J. Lumin. 71, 93 (1997).

Shim, J.

D. Kim, J. Shim, and N. Cho, Appl. Surf. Sci. 234, 256 (2004).

Sullivan, B.

Sun, C. Q.

L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay, J. Vac. Sci. Technol. B 22, 583 (2004).

Taniguchi, M.

M. Ohmukai, M. Taniguchi, and Y. Tsutsumi, Mater. Sci. Eng. B 86, 26 (2001).

Tay, B. K.

L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay, J. Vac. Sci. Technol. B 22, 583 (2004).

Thielsch, R.

R. Thielsch, A. Gatto, J. Heber, and N. Kaiser, Thin Solid Films 410, 86 (2002).

Thoma, E. D.

E. D. Thoma, H. Shields, Y. Zhang, B. C. McCollum, and R. T. Williams, J. Lumin. 71, 93 (1997).

Tikhonravov, A.

Trubetskov, M.

Tsutsumi, Y.

M. Ohmukai, M. Taniguchi, and Y. Tsutsumi, Mater. Sci. Eng. B 86, 26 (2001).

Wayner, D. D. M.

B. Gelloz, H. Sano, R. Boukherroub, D. D. M. Wayner, D. J. Lockwood, and N. Kashida, Appl. Phys. Lett. 83, 2342 (2003).

R. Boukherroub, S. Morin, D. D. M. Wayner, and D. J. Lockwood, Phys. Stat. Sol. (a) 182, 117 (2000).

Williams, R. T.

E. D. Thoma, H. Shields, Y. Zhang, B. C. McCollum, and R. T. Williams, J. Lumin. 71, 93 (1997).

Yi, D.

H. Li, B. Huang, D. Yi, H. Cui, Y. He, and J. Peng, Chin. Phys. Lett. 19, 1013 (2002).

Yoo, Y.

H. Park, K. Prabakar, Y. Yoo, S. Hwang, and C. Lee, Mater. Sci. Forum 486{487, 21 (2005).

Yu, G. Q.

L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay, J. Vac. Sci. Technol. B 22, 583 (2004).

Zhang, Q. Y.

L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay, J. Vac. Sci. Technol. B 22, 583 (2004).

Zhang, Y.

E. D. Thoma, H. Shields, Y. Zhang, B. C. McCollum, and R. T. Williams, J. Lumin. 71, 93 (1997).

Appl. Opt. (2)

Appl. Phys. Lett. (1)

B. Gelloz, H. Sano, R. Boukherroub, D. D. M. Wayner, D. J. Lockwood, and N. Kashida, Appl. Phys. Lett. 83, 2342 (2003).

Appl. Surf. Sci. (1)

D. Kim, J. Shim, and N. Cho, Appl. Surf. Sci. 234, 256 (2004).

Chin. Phys. Lett. (1)

H. Li, B. Huang, D. Yi, H. Cui, Y. He, and J. Peng, Chin. Phys. Lett. 19, 1013 (2002).

J. Appl. Phys. (1)

A. G. Cullis, L. T. Canham, and P. D. J. Calcott, J. Appl. Phys. 82, 909 (1997).

J. Lumin. (1)

E. D. Thoma, H. Shields, Y. Zhang, B. C. McCollum, and R. T. Williams, J. Lumin. 71, 93 (1997).

J. Vac. Sci. Technol. B (1)

L. K. Pan, Y. K. Ee, C. Q. Sun, G. Q. Yu, Q. Y. Zhang, and B. K. Tay, J. Vac. Sci. Technol. B 22, 583 (2004).

Mater. Sci. Eng. B (2)

M. Ohmukai, M. Taniguchi, and Y. Tsutsumi, Mater. Sci. Eng. B 86, 26 (2001).

S. Ghosh, H. Kim, K. Hong, and C. Lee, Mater. Sci. Eng. B 95, 171 (2002).

Mater. Sci. Forum (1)

H. Park, K. Prabakar, Y. Yoo, S. Hwang, and C. Lee, Mater. Sci. Forum 486{487, 21 (2005).

Microelectron. J. (1)

T. W. Kang, J. Y. Leem, and T. W. Kim, Microelectron. J. 27, 423 (1996).

Phys. Stat. Sol. (a) (4)

R. Boukherroub, S. Morin, D. D. M. Wayner, and D. J. Lockwood, Phys. Stat. Sol. (a) 182, 117 (2000).

A. Missaoui, M. Saadoun, H. Ezzaouia, B. Bessais, T. Boufaden, A. Rebey, and B. Jani, Phys. Stat. Sol. (a) 182, 189 (2000).

A. Gokarna, S. Bhoraskar, N. Pavaskar, and S. Sathaye, Phys. Stat. Sol. (a) 182, 175 (2000).

T. Nguyen, P. Joubert, P. Destruel, Ph. Rendu, and M. Lakehal, Phys. Stat. Sol. (a) 182, 169 (2000).

Super. Microstruct. (1)

H. Bandarenka, M. Balucani, R. Crescenzi, and A. Ferrari, Super. Microstruct. 44, 583 (2008).

Thin Solid Films (2)

R. Thielsch, A. Gatto, J. Heber, and N. Kaiser, Thin Solid Films 410, 86 (2002).

C. C. Chang and C. H. Lee, Thin Solid Films 379, 287 (2000).

Other (1)

D. R. Lide, (ed.) Physical Constants of Organic Compounds, in: CRC Handbook of Chemistry and Physics (87th edn.) (Taylor and Francis, Boca Raton, 2007).

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