Abstract

A photon sieve can be composed of a large number of circular pinholes. Each circular pinhole has a contribution to the focusing. For the case of point-to-point imaging, the focusing contribution of an individual circular pinhole can be analytically given. We investigate the dependence of the focusing contribution on the order m of local ring of underlying traditional Fresnel zone plate. In particular, we find that the focusing contribution is simply inversely proportional to the order m. We also present an intuitive explanation. These results are helpful for better understanding of the focusing property of photon sieves.

© 2010 Chinese Optics Letters

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J. Jia and C.-Q. Xie, Chin. Phys. B 18, 183 (2009).

C. Zhou, X. Dong, L. Shi, C. Wang, and C. Du, Appl. Opt. 48, 1619 (2009).

2008 (3)

H.-H. Chung, N. M. Bradman, M. R. Davidson, and P. H. Holloway, Opt. Eng. 47, 118001 (2008).

Z. Gao, X. Luo, J. Ma, Y. Fu, and C. Du, Opt. Laser Technol. 40, 614 (2008).

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2007 (3)

F. Gimenez, W. D. Furlan, and J. A. Monsoriu, Opt. Commun. 277, 1 (2007).

G. Cheng, T. Xing, Y. Yang, and J. Ma, Proc. SPIE 6724, 67240D (2007).

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2006 (1)

2005 (2)

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2002 (1)

2001 (1)

L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and T. Seemann, Nature 414, 184 (2001).

2000 (1)

E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

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R. Chmelik, J. Mod. Opt. 43, 1463 (1996).

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E. H. Anderson, V. Boegli, and L. P. Muray, J. Vac. Sci. Technol. B 13, 2529 (1995).

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1968 (1)

Adelung, R.

L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and T. Seemann, Nature 414, 184 (2001).

Andersen, G.

Anderson, E. H.

E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

E. H. Anderson, V. Boegli, and L. P. Muray, J. Vac. Sci. Technol. B 13, 2529 (1995).

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Artzner, G. E.

G. E. Artzner, J. P. Delaboudini�ere, and X. Y. Song, Proc. SPIE 4853, 158 (2003).

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E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

Barbastathis, G.

Berndt, R.

L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and T. Seemann, Nature 414, 184 (2001).

Boegli, V.

E. H. Anderson, V. Boegli, and L. P. Muray, J. Vac. Sci. Technol. B 13, 2529 (1995).

Bradman, N. M.

H.-H. Chung, N. M. Bradman, M. R. Davidson, and P. H. Holloway, Opt. Eng. 47, 118001 (2008).

Cai, A.

Cao, Q.

Chao, W.

E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

Cheng, G.

G. Cheng, T. Xing, Y. Yang, and J. Ma, Proc. SPIE 6724, 67240D (2007).

Chmelik, R.

R. Chmelik, J. Mod. Opt. 43, 1463 (1996).

Chung, H.-H.

H.-H. Chung, N. M. Bradman, M. R. Davidson, and P. H. Holloway, Opt. Eng. 47, 118001 (2008).

Davidson, M. R.

H.-H. Chung, N. M. Bradman, M. R. Davidson, and P. H. Holloway, Opt. Eng. 47, 118001 (2008).

Delaboudini?ere, J. P.

G. E. Artzner, J. P. Delaboudini�ere, and X. Y. Song, Proc. SPIE 4853, 158 (2003).

Denbeaux, G.

E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

Dong, X.

Du, C.

C. Zhou, X. Dong, L. Shi, C. Wang, and C. Du, Appl. Opt. 48, 1619 (2009).

Z. Gao, X. Luo, J. Ma, Y. Fu, and C. Du, Opt. Laser Technol. 40, 614 (2008).

Fu, Y.

Z. Gao, X. Luo, J. Ma, Y. Fu, and C. Du, Opt. Laser Technol. 40, 614 (2008).

Furlan, W. D.

F. Gimenez, W. D. Furlan, and J. A. Monsoriu, Opt. Commun. 277, 1 (2007).

F. Gimenez, J. A. Monsoriu, W. D. Furlan, and A. Pons, Opt. Express 14, 11958 (2006).

Gao, Z.

Z. Gao, X. Luo, J. Ma, Y. Fu, and C. Du, Opt. Laser Technol. 40, 614 (2008).

Gil, D.

Gimenez, F.

F. Gimenez, W. D. Furlan, and J. A. Monsoriu, Opt. Commun. 277, 1 (2007).

F. Gimenez, J. A. Monsoriu, W. D. Furlan, and A. Pons, Opt. Express 14, 11958 (2006).

Harm, S.

L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and T. Seemann, Nature 414, 184 (2001).

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E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

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H.-H. Chung, N. M. Bradman, M. R. Davidson, and P. H. Holloway, Opt. Eng. 47, 118001 (2008).

Jahns, J.

Jia, J.

J. Jia and C.-Q. Xie, Chin. Phys. B 18, 183 (2009).

J. Jia, J. Jiang, C. Xie, and M. Liu, Opt. Commun. 281, 4536 (2008).

Jiang, J.

J. Jia, J. Jiang, C. Xie, and M. Liu, Opt. Commun. 281, 4536 (2008).

Johnson, L.

E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

Johnson, R. L.

L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and T. Seemann, Nature 414, 184 (2001).

Kipp, L.

L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and T. Seemann, Nature 414, 184 (2001).

Liu, M.

J. Jia, J. Jiang, C. Xie, and M. Liu, Opt. Commun. 281, 4536 (2008).

Lucero, A.

E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

Luo, X.

Z. Gao, X. Luo, J. Ma, Y. Fu, and C. Du, Opt. Laser Technol. 40, 614 (2008).

Ma, J.

Z. Gao, X. Luo, J. Ma, Y. Fu, and C. Du, Opt. Laser Technol. 40, 614 (2008).

G. Cheng, T. Xing, Y. Yang, and J. Ma, Proc. SPIE 6724, 67240D (2007).

Menon, R.

Monsoriu, J. A.

F. Gimenez, W. D. Furlan, and J. A. Monsoriu, Opt. Commun. 277, 1 (2007).

F. Gimenez, J. A. Monsoriu, W. D. Furlan, and A. Pons, Opt. Express 14, 11958 (2006).

Muray, L. P.

E. H. Anderson, V. Boegli, and L. P. Muray, J. Vac. Sci. Technol. B 13, 2529 (1995).

Olynick, D. L.

E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

Pons, A.

Seemann, T.

L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and T. Seemann, Nature 414, 184 (2001).

Shi, L.

Skibowski, M.

L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and T. Seemann, Nature 414, 184 (2001).

Smith, H. I.

Song, X. Y.

G. E. Artzner, J. P. Delaboudini�ere, and X. Y. Song, Proc. SPIE 4853, 158 (2003).

Sun, J.-A.

Tullson, D.

Veklerov, E.

E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

Wang, C.

Xie, C.

J. Jia, J. Jiang, C. Xie, and M. Liu, Opt. Commun. 281, 4536 (2008).

Xie, C.-Q.

J. Jia and C.-Q. Xie, Chin. Phys. B 18, 183 (2009).

Xing, T.

G. Cheng, T. Xing, Y. Yang, and J. Ma, Proc. SPIE 6724, 67240D (2007).

Yang, Y.

G. Cheng, T. Xing, Y. Yang, and J. Ma, Proc. SPIE 6724, 67240D (2007).

Zhou, C.

Appl. Opt. (2)

Chin. Phys. B (1)

J. Jia and C.-Q. Xie, Chin. Phys. B 18, 183 (2009).

J. Mod. Opt. (1)

R. Chmelik, J. Mod. Opt. 43, 1463 (1996).

J. Opt. Soc. Am. (1)

J. Opt. Soc. Am. A (6)

J. Vac. Sci. Technol. B (2)

E. H. Anderson, V. Boegli, and L. P. Muray, J. Vac. Sci. Technol. B 13, 2529 (1995).

E. H. Anderson, D. L. Olynick, B. Harteneck, E. Veklerov, G. Denbeaux, W. Chao, A. Lucero, L. Johnson, and D. Attwood, J. Vac. Sci. Technol. B 18, 2970 (2000).

Nature (1)

L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and T. Seemann, Nature 414, 184 (2001).

Opt. Commun. (2)

J. Jia, J. Jiang, C. Xie, and M. Liu, Opt. Commun. 281, 4536 (2008).

F. Gimenez, W. D. Furlan, and J. A. Monsoriu, Opt. Commun. 277, 1 (2007).

Opt. Eng. (1)

H.-H. Chung, N. M. Bradman, M. R. Davidson, and P. H. Holloway, Opt. Eng. 47, 118001 (2008).

Opt. Express (1)

Opt. Laser Technol. (1)

Z. Gao, X. Luo, J. Ma, Y. Fu, and C. Du, Opt. Laser Technol. 40, 614 (2008).

Opt. Lett. (1)

Proc. SPIE (2)

G. E. Artzner, J. P. Delaboudini�ere, and X. Y. Song, Proc. SPIE 4853, 158 (2003).

G. Cheng, T. Xing, Y. Yang, and J. Ma, Proc. SPIE 6724, 67240D (2007).

Other (1)

G. Schmahl, D. Rudolph, P. Guttmann, and O. Christ, in X-Ray Microscopy (Vol. 43) G. Schmahl and D. Rudolph, (eds.) (Springer-Verlag, Berlin, 1984) p.63.

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