Abstract

A new performance metric, the two-dimensional (2D) contrast threshold surface, is proposed to characterize the systematic performance of a multi-spectral imaging sensor. Specifically, how to measure this performance metric is presented based on the discriminations of a set of sine-wave test patterns with different radiance magnitudes and spectral properties. The theoretical model for predicting the 2D contrast threshold surface is derived based on an analytical description of the effective contrast between the test pattern and its background, in which the impacts of fusion algorithms on the 2D contrast threshold surface are also discussed using the minimum threshold match criteria. Preliminary simulation results show that this model can be used to quantitatively characterize the real influence of the spectral dierences and spatial frequencies on the contrast thresholds required for the observer to just resolve the images of the test patterns through a multi-spectral imaging sensor.

© 2010 Chinese Optics Letters

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  1. R. G. Driggers, V. Hodgkin, R. H. Vollmerhausen, and O. S. Patrick, Proc. SPIE 5076, 179 (2003).
  2. W. Wittenstein, Opt. Eng. 38, 773 (1999).
  3. P. Bijl and J. M. Valeton, Proc. SPIE 3377, 182 (1998).
  4. X. Wang, J. Zhang, Z. Feng, and H. Chang, Acta Opt. Sin. (in Chinese) 25, 1036 (2005).
  5. J. Wang, W. Jin, L. Wang, Y. He, and X. Wang, Acta Opt. Sin. (in Chinese) 28, 2125 (2008).
  6. R. H. Vollmerhausen, E. Jacobs, and R. G. Driggers, Opt. Eng. 43, 2806 (2004).
  7. B. Piet and A. H. Maarten, Proc. SPIE 5076, 208 (2003).
  8. P. K. John, W. M. David, L. Pau, and E. S. Rulon, Proc. SPIE 6230, 62330W (2006).
  9. P. K. John, P. C. Adam, and E. S. Rulon, Proc. SPIE 5806, 469 (2005).
  10. E. S. Rulon, D. E. Timothy, and J. S. David, Proc. SPIE 5806, 457 (2005).
  11. X. Wang, W. Xie, H. Chang, and J. Zhang, Int. J. Infrared Millimeter Waves 26, 1031 (2005).
  12. P. Barten, SID 92 Digest 867 (1992).
  13. J. Eddie, R. G. Driggers, and R. H. Vollmerhausen, Proc. SPIE 5612, 284 (2004).

2008 (1)

J. Wang, W. Jin, L. Wang, Y. He, and X. Wang, Acta Opt. Sin. (in Chinese) 28, 2125 (2008).

2006 (1)

P. K. John, W. M. David, L. Pau, and E. S. Rulon, Proc. SPIE 6230, 62330W (2006).

2005 (4)

P. K. John, P. C. Adam, and E. S. Rulon, Proc. SPIE 5806, 469 (2005).

E. S. Rulon, D. E. Timothy, and J. S. David, Proc. SPIE 5806, 457 (2005).

X. Wang, W. Xie, H. Chang, and J. Zhang, Int. J. Infrared Millimeter Waves 26, 1031 (2005).

X. Wang, J. Zhang, Z. Feng, and H. Chang, Acta Opt. Sin. (in Chinese) 25, 1036 (2005).

2004 (2)

J. Eddie, R. G. Driggers, and R. H. Vollmerhausen, Proc. SPIE 5612, 284 (2004).

R. H. Vollmerhausen, E. Jacobs, and R. G. Driggers, Opt. Eng. 43, 2806 (2004).

2003 (2)

B. Piet and A. H. Maarten, Proc. SPIE 5076, 208 (2003).

R. G. Driggers, V. Hodgkin, R. H. Vollmerhausen, and O. S. Patrick, Proc. SPIE 5076, 179 (2003).

1999 (1)

W. Wittenstein, Opt. Eng. 38, 773 (1999).

1998 (1)

P. Bijl and J. M. Valeton, Proc. SPIE 3377, 182 (1998).

Adam, P. C.

P. K. John, P. C. Adam, and E. S. Rulon, Proc. SPIE 5806, 469 (2005).

Bijl, P.

P. Bijl and J. M. Valeton, Proc. SPIE 3377, 182 (1998).

Chang, H.

X. Wang, J. Zhang, Z. Feng, and H. Chang, Acta Opt. Sin. (in Chinese) 25, 1036 (2005).

X. Wang, W. Xie, H. Chang, and J. Zhang, Int. J. Infrared Millimeter Waves 26, 1031 (2005).

David, J. S.

E. S. Rulon, D. E. Timothy, and J. S. David, Proc. SPIE 5806, 457 (2005).

David, W. M.

P. K. John, W. M. David, L. Pau, and E. S. Rulon, Proc. SPIE 6230, 62330W (2006).

Driggers, R. G.

R. H. Vollmerhausen, E. Jacobs, and R. G. Driggers, Opt. Eng. 43, 2806 (2004).

J. Eddie, R. G. Driggers, and R. H. Vollmerhausen, Proc. SPIE 5612, 284 (2004).

R. G. Driggers, V. Hodgkin, R. H. Vollmerhausen, and O. S. Patrick, Proc. SPIE 5076, 179 (2003).

Eddie, J.

J. Eddie, R. G. Driggers, and R. H. Vollmerhausen, Proc. SPIE 5612, 284 (2004).

Feng, Z.

X. Wang, J. Zhang, Z. Feng, and H. Chang, Acta Opt. Sin. (in Chinese) 25, 1036 (2005).

He, Y.

J. Wang, W. Jin, L. Wang, Y. He, and X. Wang, Acta Opt. Sin. (in Chinese) 28, 2125 (2008).

Hodgkin, V.

R. G. Driggers, V. Hodgkin, R. H. Vollmerhausen, and O. S. Patrick, Proc. SPIE 5076, 179 (2003).

Jacobs, E.

R. H. Vollmerhausen, E. Jacobs, and R. G. Driggers, Opt. Eng. 43, 2806 (2004).

Jin, W.

J. Wang, W. Jin, L. Wang, Y. He, and X. Wang, Acta Opt. Sin. (in Chinese) 28, 2125 (2008).

John, P. K.

P. K. John, W. M. David, L. Pau, and E. S. Rulon, Proc. SPIE 6230, 62330W (2006).

P. K. John, P. C. Adam, and E. S. Rulon, Proc. SPIE 5806, 469 (2005).

Maarten, A. H.

B. Piet and A. H. Maarten, Proc. SPIE 5076, 208 (2003).

Patrick, O. S.

R. G. Driggers, V. Hodgkin, R. H. Vollmerhausen, and O. S. Patrick, Proc. SPIE 5076, 179 (2003).

Pau, L.

P. K. John, W. M. David, L. Pau, and E. S. Rulon, Proc. SPIE 6230, 62330W (2006).

Piet, B.

B. Piet and A. H. Maarten, Proc. SPIE 5076, 208 (2003).

Rulon, E. S.

P. K. John, W. M. David, L. Pau, and E. S. Rulon, Proc. SPIE 6230, 62330W (2006).

P. K. John, P. C. Adam, and E. S. Rulon, Proc. SPIE 5806, 469 (2005).

E. S. Rulon, D. E. Timothy, and J. S. David, Proc. SPIE 5806, 457 (2005).

Timothy, D. E.

E. S. Rulon, D. E. Timothy, and J. S. David, Proc. SPIE 5806, 457 (2005).

Valeton, J. M.

P. Bijl and J. M. Valeton, Proc. SPIE 3377, 182 (1998).

Vollmerhausen, R. H.

R. H. Vollmerhausen, E. Jacobs, and R. G. Driggers, Opt. Eng. 43, 2806 (2004).

J. Eddie, R. G. Driggers, and R. H. Vollmerhausen, Proc. SPIE 5612, 284 (2004).

R. G. Driggers, V. Hodgkin, R. H. Vollmerhausen, and O. S. Patrick, Proc. SPIE 5076, 179 (2003).

Wang, J.

J. Wang, W. Jin, L. Wang, Y. He, and X. Wang, Acta Opt. Sin. (in Chinese) 28, 2125 (2008).

Wang, L.

J. Wang, W. Jin, L. Wang, Y. He, and X. Wang, Acta Opt. Sin. (in Chinese) 28, 2125 (2008).

Wang, X.

J. Wang, W. Jin, L. Wang, Y. He, and X. Wang, Acta Opt. Sin. (in Chinese) 28, 2125 (2008).

X. Wang, J. Zhang, Z. Feng, and H. Chang, Acta Opt. Sin. (in Chinese) 25, 1036 (2005).

X. Wang, W. Xie, H. Chang, and J. Zhang, Int. J. Infrared Millimeter Waves 26, 1031 (2005).

Wittenstein, W.

W. Wittenstein, Opt. Eng. 38, 773 (1999).

Xie, W.

X. Wang, W. Xie, H. Chang, and J. Zhang, Int. J. Infrared Millimeter Waves 26, 1031 (2005).

Zhang, J.

X. Wang, W. Xie, H. Chang, and J. Zhang, Int. J. Infrared Millimeter Waves 26, 1031 (2005).

X. Wang, J. Zhang, Z. Feng, and H. Chang, Acta Opt. Sin. (in Chinese) 25, 1036 (2005).

Acta Opt. Sin. (in Chinese) (2)

X. Wang, J. Zhang, Z. Feng, and H. Chang, Acta Opt. Sin. (in Chinese) 25, 1036 (2005).

J. Wang, W. Jin, L. Wang, Y. He, and X. Wang, Acta Opt. Sin. (in Chinese) 28, 2125 (2008).

Int. J. Infrared Millimeter Waves (1)

X. Wang, W. Xie, H. Chang, and J. Zhang, Int. J. Infrared Millimeter Waves 26, 1031 (2005).

Opt. Eng. (2)

W. Wittenstein, Opt. Eng. 38, 773 (1999).

R. H. Vollmerhausen, E. Jacobs, and R. G. Driggers, Opt. Eng. 43, 2806 (2004).

Proc. SPIE (7)

B. Piet and A. H. Maarten, Proc. SPIE 5076, 208 (2003).

P. K. John, W. M. David, L. Pau, and E. S. Rulon, Proc. SPIE 6230, 62330W (2006).

P. K. John, P. C. Adam, and E. S. Rulon, Proc. SPIE 5806, 469 (2005).

E. S. Rulon, D. E. Timothy, and J. S. David, Proc. SPIE 5806, 457 (2005).

P. Bijl and J. M. Valeton, Proc. SPIE 3377, 182 (1998).

R. G. Driggers, V. Hodgkin, R. H. Vollmerhausen, and O. S. Patrick, Proc. SPIE 5076, 179 (2003).

J. Eddie, R. G. Driggers, and R. H. Vollmerhausen, Proc. SPIE 5612, 284 (2004).

Other (1)

P. Barten, SID 92 Digest 867 (1992).

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