Abstract

We apply the effective medium theory combined with the conventional periodic method of moments (MoM) to analyze frequency selective surfaces (FSSs) on periodic and anisotropic substrates. Based on the effective medium theory, even periodic and anisotropic substrates can be considered homogeneous; thus, the Green's function can be obtained. The resulting integral equation can then be solved by the MoM using rooftop basis functions and Galerkin testing functions. We analyze an example using this technique, and the numerical results agree with Fallahi's full-vector semi-analytical method, showing an increasing difference between the results as the frequencies increase. These results show that the proposed method is effective for analyzing FSSs on periodic and anisotropic substrates.

© 2010 Chinese Optics Letters

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  1. T. K. Wu, Frequency Selective Surface and Grid Array (Wiley-Interscience, New York, 1995).
  2. B. A. Munk, Frequency Selective Surface: Theory and Design ( Wiley-Interscience, New York, 2000).
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2009 (2)

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Metematerials 3, 63 (2009).

M. Zhou, Y. Zhao, D. Li, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 36, 3050 (2009).

2008 (1)

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

2007 (1)

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Proc. SPIE 6717, 67170N (2007)

2005 (1)

J. Lu, J. Zhang, and L. Sun, Optics and Precision Engineering (in Chinese) 13, 219 (2005).

1995 (1)

1994 (1)

1991 (1)

1988 (1)

R. Mittra, C. H. Chan, and T. Cwik, Proc. IEEE 76, 1593 (1988).

Chan, C. H.

R. Mittra, C. H. Chan, and T. Cwik, Proc. IEEE 76, 1593 (1988).

Chen, H.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Cwik, T.

R. Mittra, C. H. Chan, and T. Cwik, Proc. IEEE 76, 1593 (1988).

Fallahi, A.

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Metematerials 3, 63 (2009).

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Proc. SPIE 6717, 67170N (2007)

Fan, Z.

M. Zhou, Y. Zhao, D. Li, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 36, 3050 (2009).

Gao, J.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Grann, E. B.

Hafner, C.

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Metematerials 3, 63 (2009).

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Proc. SPIE 6717, 67170N (2007)

Li, D.

M. Zhou, Y. Zhao, D. Li, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 36, 3050 (2009).

Li, X.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Liu, X.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Lu, J.

J. Lu, J. Zhang, and L. Sun, Optics and Precision Engineering (in Chinese) 13, 219 (2005).

Mishrikey, M.

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Metematerials 3, 63 (2009).

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Proc. SPIE 6717, 67170N (2007)

Mittra, R.

R. Mittra, C. H. Chan, and T. Cwik, Proc. IEEE 76, 1593 (1988).

Moharam, M. G.

Pomment, D. A.

Shao, J.

M. Zhou, Y. Zhao, D. Li, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 36, 3050 (2009).

Shen, Z.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Southwell, W. H.

Sun, L.

J. Lu, J. Zhang, and L. Sun, Optics and Precision Engineering (in Chinese) 13, 219 (2005).

Vahldieck, R.

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Metematerials 3, 63 (2009).

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Proc. SPIE 6717, 67170N (2007)

Wang, S.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Wang, T.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Wang, X.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Yin, S.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Zhang, J.

J. Lu, J. Zhang, and L. Sun, Optics and Precision Engineering (in Chinese) 13, 219 (2005).

Zhao, Y.

M. Zhou, Y. Zhao, D. Li, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 36, 3050 (2009).

Zheng, X.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Zhou, M.

M. Zhou, Y. Zhao, D. Li, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 36, 3050 (2009).

Zhu, H.

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Acta Opt. Sin. (in Chinese) (1)

H. Zhu, J. Gao, X. Wang, T. Wang, H. Chen, X. Zheng, Z. Shen, X. Li, S. Yin, X. Liu, and S. Wang, Acta Opt. Sin. (in Chinese) 28, 2436 (2008).

Chinese J. Lasers (in Chinese) (1)

M. Zhou, Y. Zhao, D. Li, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 36, 3050 (2009).

J. Opt. Soc. Am. A (3)

Metematerials (1)

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Metematerials 3, 63 (2009).

Optics and Precision Engineering (in Chinese) (1)

J. Lu, J. Zhang, and L. Sun, Optics and Precision Engineering (in Chinese) 13, 219 (2005).

Proc. IEEE (1)

R. Mittra, C. H. Chan, and T. Cwik, Proc. IEEE 76, 1593 (1988).

Proc. SPIE (1)

A. Fallahi, M. Mishrikey, C. Hafner, and R. Vahldieck, Proc. SPIE 6717, 67170N (2007)

Other (2)

T. K. Wu, Frequency Selective Surface and Grid Array (Wiley-Interscience, New York, 1995).

B. A. Munk, Frequency Selective Surface: Theory and Design ( Wiley-Interscience, New York, 2000).

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