Abstract

System calibration, which usually involves complicated and time-consuming procedures, is crucial for any three-dimensional (3D) shape measurement system based on vision. A novel improved method is proposed for accurate calibration of such a measurement system. The system accuracy is improved with considering the nonlinear measurement error created by the difference between the system model and real measurement environment. We use Levenberg-Marquardt optimization algorithm to compensate the error and get a good result. The improved method has a 50% improvement of re-projection accuracy compared with our previous method. The measurement accuracy is maintained well within 1.5% of the overall measurement depth range.

© 2010 Chinese Optics Letters

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  1. F. Chen, G. M. Brown, and M. Song, Opt. Eng. 39, 10 (2000).
  2. J. J. Aguilar, F. Torres, and M. A. Lope, Measurement 18, 193 (1996).
  3. M. Xu and J. Hu, Chinese J. Lasers (in Chinese) 35, 782 (2008).
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  5. G. He, X. Wang, A. Zeng, and F. Tang, Chin. Opt. Lett. 5, 164 (2007).
  6. R. Legarda-Saenz, T. Bothe, and W. P. Juptner, Opt. Eng. 43, 464 (2004).
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  8. J. Heikkila, IEEE Trans. Pattern Anal. Machine Intell. 22, 1066 (2000).
  9. J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Machine Intell. 14, 965 (1992).
  10. Z. Zhang, IEEE Trans. Pattern Anal. Machine Intell. 22, 1330 (2000).
  11. S. Zhang and P. S. Huang, Opt. Eng. 45, 083601 (2006).
  12. L.-C. Chen and C.-C. Liao, Meas. Sci. Technol. 16, 1554 (2005).
  13. Z. Li, C. Wang, Y. Shi, and Y. Wang, Acta Opt. Sin. (in Chinese) 28, 1527 (2008).
  14. H. Cui, N. Dai, T. Yuan, X. Cheng, and W. Liao, in Proceedings of 2008 Congresson Image and Signal Processing 324 (2008).
  15. W. Sun and J. R. Cooperstock, Machine Vision Appl. 17, 51 (2006).
  16. J. J. Moré, Lecture Notes in Mathematics 630, 105 (1978).

2008 (2)

Z. Li, C. Wang, Y. Shi, and Y. Wang, Acta Opt. Sin. (in Chinese) 28, 1527 (2008).

M. Xu and J. Hu, Chinese J. Lasers (in Chinese) 35, 782 (2008).

2007 (1)

2006 (2)

W. Sun and J. R. Cooperstock, Machine Vision Appl. 17, 51 (2006).

S. Zhang and P. S. Huang, Opt. Eng. 45, 083601 (2006).

2005 (1)

L.-C. Chen and C.-C. Liao, Meas. Sci. Technol. 16, 1554 (2005).

2004 (1)

R. Legarda-Saenz, T. Bothe, and W. P. Juptner, Opt. Eng. 43, 464 (2004).

2000 (3)

J. Heikkila, IEEE Trans. Pattern Anal. Machine Intell. 22, 1066 (2000).

Z. Zhang, IEEE Trans. Pattern Anal. Machine Intell. 22, 1330 (2000).

F. Chen, G. M. Brown, and M. Song, Opt. Eng. 39, 10 (2000).

1998 (1)

R. J. Valkenburg and A. M. McIvor, Image Vision Computing 16, 99 (1998).

1996 (1)

J. J. Aguilar, F. Torres, and M. A. Lope, Measurement 18, 193 (1996).

1992 (1)

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Machine Intell. 14, 965 (1992).

1987 (1)

R. Y. Tsai, IEEE J. Robotics Automat. 3, 323 (1987).

1978 (1)

J. J. Moré, Lecture Notes in Mathematics 630, 105 (1978).

Aguilar, J. J.

J. J. Aguilar, F. Torres, and M. A. Lope, Measurement 18, 193 (1996).

Bothe, T.

R. Legarda-Saenz, T. Bothe, and W. P. Juptner, Opt. Eng. 43, 464 (2004).

Brown, G. M.

F. Chen, G. M. Brown, and M. Song, Opt. Eng. 39, 10 (2000).

Chen, F.

F. Chen, G. M. Brown, and M. Song, Opt. Eng. 39, 10 (2000).

Chen, L.-C.

L.-C. Chen and C.-C. Liao, Meas. Sci. Technol. 16, 1554 (2005).

Cohen, P.

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Machine Intell. 14, 965 (1992).

Cooperstock, J. R.

W. Sun and J. R. Cooperstock, Machine Vision Appl. 17, 51 (2006).

He, G.

Heikkila, J.

J. Heikkila, IEEE Trans. Pattern Anal. Machine Intell. 22, 1066 (2000).

Herniou, M.

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Machine Intell. 14, 965 (1992).

Hu, J.

M. Xu and J. Hu, Chinese J. Lasers (in Chinese) 35, 782 (2008).

Huang, P. S.

S. Zhang and P. S. Huang, Opt. Eng. 45, 083601 (2006).

Juptner, W. P.

R. Legarda-Saenz, T. Bothe, and W. P. Juptner, Opt. Eng. 43, 464 (2004).

Legarda-Saenz, R.

R. Legarda-Saenz, T. Bothe, and W. P. Juptner, Opt. Eng. 43, 464 (2004).

Li, Z.

Z. Li, C. Wang, Y. Shi, and Y. Wang, Acta Opt. Sin. (in Chinese) 28, 1527 (2008).

Liao, C.-C.

L.-C. Chen and C.-C. Liao, Meas. Sci. Technol. 16, 1554 (2005).

Lope, M. A.

J. J. Aguilar, F. Torres, and M. A. Lope, Measurement 18, 193 (1996).

McIvor, A. M.

R. J. Valkenburg and A. M. McIvor, Image Vision Computing 16, 99 (1998).

Moré, J. J.

J. J. Moré, Lecture Notes in Mathematics 630, 105 (1978).

Shi, Y.

Z. Li, C. Wang, Y. Shi, and Y. Wang, Acta Opt. Sin. (in Chinese) 28, 1527 (2008).

Song, M.

F. Chen, G. M. Brown, and M. Song, Opt. Eng. 39, 10 (2000).

Sun, W.

W. Sun and J. R. Cooperstock, Machine Vision Appl. 17, 51 (2006).

Tang, F.

Torres, F.

J. J. Aguilar, F. Torres, and M. A. Lope, Measurement 18, 193 (1996).

Tsai, R. Y.

R. Y. Tsai, IEEE J. Robotics Automat. 3, 323 (1987).

Valkenburg, R. J.

R. J. Valkenburg and A. M. McIvor, Image Vision Computing 16, 99 (1998).

Wang, C.

Z. Li, C. Wang, Y. Shi, and Y. Wang, Acta Opt. Sin. (in Chinese) 28, 1527 (2008).

Wang, X.

Wang, Y.

Z. Li, C. Wang, Y. Shi, and Y. Wang, Acta Opt. Sin. (in Chinese) 28, 1527 (2008).

Weng, J.

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Machine Intell. 14, 965 (1992).

Xu, M.

M. Xu and J. Hu, Chinese J. Lasers (in Chinese) 35, 782 (2008).

Zeng, A.

Zhang, S.

S. Zhang and P. S. Huang, Opt. Eng. 45, 083601 (2006).

Zhang, Z.

Z. Zhang, IEEE Trans. Pattern Anal. Machine Intell. 22, 1330 (2000).

Acta Opt. Sin. (in Chinese) (1)

Z. Li, C. Wang, Y. Shi, and Y. Wang, Acta Opt. Sin. (in Chinese) 28, 1527 (2008).

Chin. Opt. Lett. (1)

Chinese J. Lasers (in Chinese) (1)

M. Xu and J. Hu, Chinese J. Lasers (in Chinese) 35, 782 (2008).

IEEE J. Robotics Automat. (1)

R. Y. Tsai, IEEE J. Robotics Automat. 3, 323 (1987).

IEEE Trans. Pattern Anal. Machine Intell. (3)

J. Heikkila, IEEE Trans. Pattern Anal. Machine Intell. 22, 1066 (2000).

J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Machine Intell. 14, 965 (1992).

Z. Zhang, IEEE Trans. Pattern Anal. Machine Intell. 22, 1330 (2000).

Image Vision Computing (1)

R. J. Valkenburg and A. M. McIvor, Image Vision Computing 16, 99 (1998).

Lecture Notes in Mathematics (1)

J. J. Moré, Lecture Notes in Mathematics 630, 105 (1978).

Machine Vision Appl. (1)

W. Sun and J. R. Cooperstock, Machine Vision Appl. 17, 51 (2006).

Meas. Sci. Technol. (1)

L.-C. Chen and C.-C. Liao, Meas. Sci. Technol. 16, 1554 (2005).

Measurement (1)

J. J. Aguilar, F. Torres, and M. A. Lope, Measurement 18, 193 (1996).

Opt. Eng. (3)

F. Chen, G. M. Brown, and M. Song, Opt. Eng. 39, 10 (2000).

R. Legarda-Saenz, T. Bothe, and W. P. Juptner, Opt. Eng. 43, 464 (2004).

S. Zhang and P. S. Huang, Opt. Eng. 45, 083601 (2006).

Other (1)

H. Cui, N. Dai, T. Yuan, X. Cheng, and W. Liao, in Proceedings of 2008 Congresson Image and Signal Processing 324 (2008).

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