Abstract

The performances of HfO2/SiO2 single- and multi-layer coatings in vacuum influenced by contamination are studied. The surface morphology, the transmittance spectrum, and the laser-induced damage threshold are investigated. The results show that the contamination in vacuum mainly comes from the vacuum system and the contamination process is different for the HfO2 and SiO2 films. The laser-induced damage experiments at 1064 nm in vacuum show that the damage resistance of the coatings will decrease largely due to the organic contamination.

© 2009 Chinese Optics Letters

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2007 (4)

Y. Cui, S.-J. Liu, H.-B. He, Y.-A. Zhao, J.-D. Shao, and Z.-X. Fan, Chin. Phys. Lett. 24, 2873 (2007).

B. Ling, S. Liu, L. Yuan, H. He, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 34, 988 (2007).

B. Ling, H. He, and J. Shao, Chin. Opt. Lett. 5, 487 (2007).

Y. Cui, H. Yu, Y. Zhao, Y. Jin, H. He, and J. Shao, Chin. Opt. Lett. 5, 680 (2007).

2005 (4)

W. Riede, P. Allenspacher, H. Schroder, D. Wernham, and Y. Lien, Proc. SPIE 5991, 59910H (2005).

J. S. Canham, Proc. SPIE 5991, 59910E (2005).

C. Scurlock, Proc. SPIE 5647, 86 (2005).

P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

2004 (1)

2002 (1)

B. Pinot, H. Leplan, F. Houbre, E. Lavastre, J. C. Poncetta, and G. Chabassier, Proc. SPIE 4679, 234 (2002).

2001 (1)

J. Taniguchi, N. E. LeBarron, J. Howe, D. J. Smith, C. Stolz, C. Weinzapfel, and J. Kimmons, Proc. SPIE 4347, 109 (2001).

2000 (1)

Allenspacher, P.

P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

W. Riede, P. Allenspacher, H. Schroder, D. Wernham, and Y. Lien, Proc. SPIE 5991, 59910H (2005).

Black, P.

Canham, J. S.

J. S. Canham, Proc. SPIE 5991, 59910E (2005).

Capanni, A.

P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

Chabassier, G.

B. Pinot, H. Leplan, F. Houbre, E. Lavastre, J. C. Poncetta, and G. Chabassier, Proc. SPIE 4679, 234 (2002).

Cui, Y.

Y. Cui, H. Yu, Y. Zhao, Y. Jin, H. He, and J. Shao, Chin. Opt. Lett. 5, 680 (2007).

Y. Cui, S.-J. Liu, H.-B. He, Y.-A. Zhao, J.-D. Shao, and Z.-X. Fan, Chin. Phys. Lett. 24, 2873 (2007).

Era, F.

P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

Fan, S.

Fan, Z.

B. Ling, S. Liu, L. Yuan, H. He, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 34, 988 (2007).

D. Zhang, S. Fan, W. Gao, H. He, Y. Wang, J. Shao, Z. Fan, and H. Sun, Chin. Opt. Lett. 2, 305 (2004).

Fan, Z.-X.

Y. Cui, S.-J. Liu, H.-B. He, Y.-A. Zhao, J.-D. Shao, and Z.-X. Fan, Chin. Phys. Lett. 24, 2873 (2007).

Gao, W.

He, H.

He, H.-B.

Y. Cui, S.-J. Liu, H.-B. He, Y.-A. Zhao, J.-D. Shao, and Z.-X. Fan, Chin. Phys. Lett. 24, 2873 (2007).

Houbre, F.

B. Pinot, H. Leplan, F. Houbre, E. Lavastre, J. C. Poncetta, and G. Chabassier, Proc. SPIE 4679, 234 (2002).

Howe, J.

J. Taniguchi, N. E. LeBarron, J. Howe, D. J. Smith, C. Stolz, C. Weinzapfel, and J. Kimmons, Proc. SPIE 4347, 109 (2001).

Jin, Y.

Jungling, K.

Kimmons, J.

J. Taniguchi, N. E. LeBarron, J. Howe, D. J. Smith, C. Stolz, C. Weinzapfel, and J. Kimmons, Proc. SPIE 4347, 109 (2001).

Lavastre, E.

B. Pinot, H. Leplan, F. Houbre, E. Lavastre, J. C. Poncetta, and G. Chabassier, Proc. SPIE 4679, 234 (2002).

LeBarron, N. E.

J. Taniguchi, N. E. LeBarron, J. Howe, D. J. Smith, C. Stolz, C. Weinzapfel, and J. Kimmons, Proc. SPIE 4347, 109 (2001).

Leplan, H.

B. Pinot, H. Leplan, F. Houbre, E. Lavastre, J. C. Poncetta, and G. Chabassier, Proc. SPIE 4679, 234 (2002).

Lien, Y.

W. Riede, P. Allenspacher, H. Schroder, D. Wernham, and Y. Lien, Proc. SPIE 5991, 59910H (2005).

Ling, B.

B. Ling, S. Liu, L. Yuan, H. He, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 34, 988 (2007).

B. Ling, H. He, and J. Shao, Chin. Opt. Lett. 5, 487 (2007).

Liu, S.

B. Ling, S. Liu, L. Yuan, H. He, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 34, 988 (2007).

Liu, S.-J.

Y. Cui, S.-J. Liu, H.-B. He, Y.-A. Zhao, J.-D. Shao, and Z.-X. Fan, Chin. Phys. Lett. 24, 2873 (2007).

Pinot, B.

B. Pinot, H. Leplan, F. Houbre, E. Lavastre, J. C. Poncetta, and G. Chabassier, Proc. SPIE 4679, 234 (2002).

Poncetta, J. C.

B. Pinot, H. Leplan, F. Houbre, E. Lavastre, J. C. Poncetta, and G. Chabassier, Proc. SPIE 4679, 234 (2002).

Reicher, D.

Riede, W.

P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

W. Riede, P. Allenspacher, H. Schroder, D. Wernham, and Y. Lien, Proc. SPIE 5991, 59910H (2005).

Schroder, H.

W. Riede, P. Allenspacher, H. Schroder, D. Wernham, and Y. Lien, Proc. SPIE 5991, 59910H (2005).

Scurlock, C.

C. Scurlock, Proc. SPIE 5647, 86 (2005).

Shao, J.

Shao, J.-D.

Y. Cui, S.-J. Liu, H.-B. He, Y.-A. Zhao, J.-D. Shao, and Z.-X. Fan, Chin. Phys. Lett. 24, 2873 (2007).

Smith, D. J.

J. Taniguchi, N. E. LeBarron, J. Howe, D. J. Smith, C. Stolz, C. Weinzapfel, and J. Kimmons, Proc. SPIE 4347, 109 (2001).

Stolz, C.

J. Taniguchi, N. E. LeBarron, J. Howe, D. J. Smith, C. Stolz, C. Weinzapfel, and J. Kimmons, Proc. SPIE 4347, 109 (2001).

Sun, H.

Taniguchi, J.

J. Taniguchi, N. E. LeBarron, J. Howe, D. J. Smith, C. Stolz, C. Weinzapfel, and J. Kimmons, Proc. SPIE 4347, 109 (2001).

Wang, Y.

Weinzapfel, C.

J. Taniguchi, N. E. LeBarron, J. Howe, D. J. Smith, C. Stolz, C. Weinzapfel, and J. Kimmons, Proc. SPIE 4347, 109 (2001).

Wernham, D.

P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

W. Riede, P. Allenspacher, H. Schroder, D. Wernham, and Y. Lien, Proc. SPIE 5991, 59910H (2005).

Yu, H.

Yuan, L.

B. Ling, S. Liu, L. Yuan, H. He, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 34, 988 (2007).

Zhang, D.

Zhao, Y.

Zhao, Y.-A.

Y. Cui, S.-J. Liu, H.-B. He, Y.-A. Zhao, J.-D. Shao, and Z.-X. Fan, Chin. Phys. Lett. 24, 2873 (2007).

Appl. Opt. (1)

Chin. Opt. Lett. (3)

Chin. Phys. Lett. (1)

Y. Cui, S.-J. Liu, H.-B. He, Y.-A. Zhao, J.-D. Shao, and Z.-X. Fan, Chin. Phys. Lett. 24, 2873 (2007).

Chinese J. Lasers (in Chinese) (1)

B. Ling, S. Liu, L. Yuan, H. He, Z. Fan, and J. Shao, Chinese J. Lasers (in Chinese) 34, 988 (2007).

Proc. SPIE (6)

J. Taniguchi, N. E. LeBarron, J. Howe, D. J. Smith, C. Stolz, C. Weinzapfel, and J. Kimmons, Proc. SPIE 4347, 109 (2001).

B. Pinot, H. Leplan, F. Houbre, E. Lavastre, J. C. Poncetta, and G. Chabassier, Proc. SPIE 4679, 234 (2002).

W. Riede, P. Allenspacher, H. Schroder, D. Wernham, and Y. Lien, Proc. SPIE 5991, 59910H (2005).

J. S. Canham, Proc. SPIE 5991, 59910E (2005).

C. Scurlock, Proc. SPIE 5647, 86 (2005).

P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

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