Abstract

A new technique is developed to measure the electrical resistivity of conductor with a nonuniform temperature profile. The calculation method is derived from the temperature dependence of the electrical resistivity. The apparatus consists mainly of a high temperature environmental chamber, a power circuit of heating, a twenty-wavelength pyrometer, and a scanning pyrometer. After getting the resistance from the voltage drop of the specimen, the electrical resistivity in a wide temperature range of the specimen can be obtained by our calculation model. Preliminary results of the electrical resistivity of SRM 8424 over a wide temperature range (1000-3000 K) are presented. The perfect consistency between the measurement results and the nominal values justifies the validity of this technique.

© 2009 Chinese Optics Letters

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