Abstract

Freeform surfaces are increasingly used in the design of compact optical systems. Interferometric null test with computer generated hologram (CGH), which has been successfully used in highly accurate test of aspheric surfaces, is adopted to test the freeform surfaces. The best fitting sphere of the freeform surface under the test is firstly calculated to quickly estimate the possibility of null test. To decrease the maximum spatial frequency of the null CGH, the position of the CGH and the direction of optical axis are optimized. The estimated maximum spatial frequency of the CGH is 7.8% apart from the optimized one, which shows the validity of the best fitting sphere.

© 2009 Chinese Optics Letters

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2008 (3)

Y. Xie, Q. Chen, F. Wu, X. Hou, J. Zhang, and G. Wu, Acta Opt. Sin. (in Chinese) 28, 1313 (2008).

H. Liu, Optik 119, 515 (2008).

Y. Xu, X. Zhang, and P. Zhou, Acta Opt. Sin. (in Chinese) 28, 971 (2008).

2007 (2)

G. Kang, J. Xie, and Y. Liu, J. Beijing Institute of Technology 16, 78 (2007).

Z. Gao, M. Kong, R. Zhu, and L. Chen, Chin. Opt. Lett. 5, 241 (2007).

2006 (1)

J.-M. Asfour and A. G. Poleshchuk, J. Opt. Soc. Am. A23, 172 (2006).

2005 (1)

2004 (2)

S. Reichelt, C. Pruss, and H. J. Tiziani, Proc. SPIE 5252, 252 (2004).

C. Pruss, S. Reichelt, H. J. Tiziani, and W. Osten, Opt. Eng. 43, 2534 (2004).

1997 (1)

J. H. Burge, Proc. SPIE 2871, 362 (1997).

1972 (1)

J. C. Wyant and V. P. Bennett, Appl. Opt. 11, 2833 (1972).

Asfour, J.-M.

J.-M. Asfour and A. G. Poleshchuk, J. Opt. Soc. Am. A23, 172 (2006).

Burge, J. H.

J. H. Burge, Proc. SPIE 2871, 362 (1997).

Chen, L.

Chen, Q.

Y. Xie, Q. Chen, F. Wu, X. Hou, J. Zhang, and G. Wu, Acta Opt. Sin. (in Chinese) 28, 1313 (2008).

Gao, Z.

Hou, X.

Y. Xie, Q. Chen, F. Wu, X. Hou, J. Zhang, and G. Wu, Acta Opt. Sin. (in Chinese) 28, 1313 (2008).

Kang, G.

G. Kang, J. Xie, and Y. Liu, J. Beijing Institute of Technology 16, 78 (2007).

Kong, M.

Liu, H.

H. Liu, Optik 119, 515 (2008).

Liu, Y.

G. Kang, J. Xie, and Y. Liu, J. Beijing Institute of Technology 16, 78 (2007).

Osten, W.

C. Pruss, S. Reichelt, H. J. Tiziani, and W. Osten, Opt. Eng. 43, 2534 (2004).

Poleshchuk, A. G.

J.-M. Asfour and A. G. Poleshchuk, J. Opt. Soc. Am. A23, 172 (2006).

Poleshchuk, V. P.

J. C. Wyant and V. P. Bennett, Appl. Opt. 11, 2833 (1972).

Pruss, C.

S. Reichelt, C. Pruss, and H. J. Tiziani, Proc. SPIE 5252, 252 (2004).

C. Pruss, S. Reichelt, H. J. Tiziani, and W. Osten, Opt. Eng. 43, 2534 (2004).

Raasch, T. W.

Reichelt, S.

C. Pruss, S. Reichelt, H. J. Tiziani, and W. Osten, Opt. Eng. 43, 2534 (2004).

S. Reichelt, C. Pruss, and H. J. Tiziani, Proc. SPIE 5252, 252 (2004).

Tiziani, H. J.

S. Reichelt, C. Pruss, and H. J. Tiziani, Proc. SPIE 5252, 252 (2004).

C. Pruss, S. Reichelt, H. J. Tiziani, and W. Osten, Opt. Eng. 43, 2534 (2004).

Wu, F.

Y. Xie, Q. Chen, F. Wu, X. Hou, J. Zhang, and G. Wu, Acta Opt. Sin. (in Chinese) 28, 1313 (2008).

Wu, G.

Y. Xie, Q. Chen, F. Wu, X. Hou, J. Zhang, and G. Wu, Acta Opt. Sin. (in Chinese) 28, 1313 (2008).

Wyant, J. C.

J. C. Wyant and V. P. Bennett, Appl. Opt. 11, 2833 (1972).

Xie, J.

G. Kang, J. Xie, and Y. Liu, J. Beijing Institute of Technology 16, 78 (2007).

Xie, Y.

Y. Xie, Q. Chen, F. Wu, X. Hou, J. Zhang, and G. Wu, Acta Opt. Sin. (in Chinese) 28, 1313 (2008).

Xu, Y.

Y. Xu, X. Zhang, and P. Zhou, Acta Opt. Sin. (in Chinese) 28, 971 (2008).

Yi, A. Y.

Zhang, J.

Y. Xie, Q. Chen, F. Wu, X. Hou, J. Zhang, and G. Wu, Acta Opt. Sin. (in Chinese) 28, 1313 (2008).

Zhang, X.

Y. Xu, X. Zhang, and P. Zhou, Acta Opt. Sin. (in Chinese) 28, 971 (2008).

Zhou, P.

Y. Xu, X. Zhang, and P. Zhou, Acta Opt. Sin. (in Chinese) 28, 971 (2008).

Zhu, R.

Acta Opt. Sin. (in Chinese) (2)

Y. Xie, Q. Chen, F. Wu, X. Hou, J. Zhang, and G. Wu, Acta Opt. Sin. (in Chinese) 28, 1313 (2008).

Y. Xu, X. Zhang, and P. Zhou, Acta Opt. Sin. (in Chinese) 28, 971 (2008).

Appl. Opt. (1)

Bennett (1)

J. C. Wyant and V. P. Bennett, Appl. Opt. 11, 2833 (1972).

Chin. Opt. Lett. (1)

J. Beijing Institute of Technology (1)

G. Kang, J. Xie, and Y. Liu, J. Beijing Institute of Technology 16, 78 (2007).

J. Opt. Soc. Am. (1)

J.-M. Asfour and A. G. Poleshchuk, J. Opt. Soc. Am. A23, 172 (2006).

Opt. Eng. (1)

C. Pruss, S. Reichelt, H. J. Tiziani, and W. Osten, Opt. Eng. 43, 2534 (2004).

Optik (1)

H. Liu, Optik 119, 515 (2008).

Proc. SPIE (2)

S. Reichelt, C. Pruss, and H. J. Tiziani, Proc. SPIE 5252, 252 (2004).

J. H. Burge, Proc. SPIE 2871, 362 (1997).

Other (2)

J. Pan, Optical aspheric surface's designing, process and detection (in Chinese) (Science Press, Beijing, 1994).

R. Li, X. Du, and Z. Zhang, Design and advanced manufacturing technology for freeform optics (in Chinese) (The Hongkong Polytechnic University, Hongkong, 2005).

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