Abstract

We propose an improved algorithm based on fractal dimension and third-order characterization to detect dim target with cluttered background in an infrared (IR) image. We also illustrate the performance and efficiency comparisons between the presented algorithm and the traditional fractal detection method on real IR images. The experimental results show that the proposed algorithm is robust and efficient for IR dim target detection.

© 2009 Chinese Optics Letters

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  1. Z. Guan, Q. Chen, G. Gu, and W. Qian, Acta Opt. Sin. (in Chinese) 28, 1496 (2008).
  2. G. Xia and B. Zhao, Chin. Opt. Lett. 5, 51 (2007).
  3. Q. Ping and G. Xia, Chinese J. Lasers 35, 106 (2008).
  4. G. Du, Electron. Lett. 40, 906 (2004).
  5. Y. Sun, J. Tian, and J. Liu, Opt. Eng. 46, 116402 (2007).
  6. B. B. Mandelbrot, The Fractal Geometry of Nature (W. H. Freeman, San Francisco, 1982).
  7. A. P. Pentland, IEEE Trans. Pattern Anal. Mach. Intell. 6, 661 (1984).
  8. J. M. Mendel, Proc. IEEE. 79, 278 (1991).
  9. F. Principato and G. Ferrante, Microelectronics Reliability 40, 1969 (2000).
  10. P. Ravier and P.-O. Amblard, Signal Processing 81, 1909 (2001).
  11. J. J. G. de la Rosa and A. M. Mu~noz, Mech. Syst. Signal Processing 22, 279 (2008).

2008 (3)

Q. Ping and G. Xia, Chinese J. Lasers 35, 106 (2008).

J. J. G. de la Rosa and A. M. Mu~noz, Mech. Syst. Signal Processing 22, 279 (2008).

Z. Guan, Q. Chen, G. Gu, and W. Qian, Acta Opt. Sin. (in Chinese) 28, 1496 (2008).

2007 (2)

G. Xia and B. Zhao, Chin. Opt. Lett. 5, 51 (2007).

Y. Sun, J. Tian, and J. Liu, Opt. Eng. 46, 116402 (2007).

2004 (1)

G. Du, Electron. Lett. 40, 906 (2004).

2001 (1)

P. Ravier and P.-O. Amblard, Signal Processing 81, 1909 (2001).

2000 (1)

F. Principato and G. Ferrante, Microelectronics Reliability 40, 1969 (2000).

1991 (1)

J. M. Mendel, Proc. IEEE. 79, 278 (1991).

1984 (1)

A. P. Pentland, IEEE Trans. Pattern Anal. Mach. Intell. 6, 661 (1984).

Amblard, P.-O.

P. Ravier and P.-O. Amblard, Signal Processing 81, 1909 (2001).

Chen, Q.

Z. Guan, Q. Chen, G. Gu, and W. Qian, Acta Opt. Sin. (in Chinese) 28, 1496 (2008).

Du, G.

G. Du, Electron. Lett. 40, 906 (2004).

Ferrante, G.

F. Principato and G. Ferrante, Microelectronics Reliability 40, 1969 (2000).

Gu, G.

Z. Guan, Q. Chen, G. Gu, and W. Qian, Acta Opt. Sin. (in Chinese) 28, 1496 (2008).

Guan, Z.

Z. Guan, Q. Chen, G. Gu, and W. Qian, Acta Opt. Sin. (in Chinese) 28, 1496 (2008).

Liu, J.

Y. Sun, J. Tian, and J. Liu, Opt. Eng. 46, 116402 (2007).

Mendel, J. M.

J. M. Mendel, Proc. IEEE. 79, 278 (1991).

Mu~noz, A. M.

J. J. G. de la Rosa and A. M. Mu~noz, Mech. Syst. Signal Processing 22, 279 (2008).

Pentland, A. P.

A. P. Pentland, IEEE Trans. Pattern Anal. Mach. Intell. 6, 661 (1984).

Ping, Q.

Q. Ping and G. Xia, Chinese J. Lasers 35, 106 (2008).

Principato, F.

F. Principato and G. Ferrante, Microelectronics Reliability 40, 1969 (2000).

Qian, W.

Z. Guan, Q. Chen, G. Gu, and W. Qian, Acta Opt. Sin. (in Chinese) 28, 1496 (2008).

Ravier, P.

P. Ravier and P.-O. Amblard, Signal Processing 81, 1909 (2001).

Rosa, J. J. G. de la

J. J. G. de la Rosa and A. M. Mu~noz, Mech. Syst. Signal Processing 22, 279 (2008).

Sun, Y.

Y. Sun, J. Tian, and J. Liu, Opt. Eng. 46, 116402 (2007).

Tian, J.

Y. Sun, J. Tian, and J. Liu, Opt. Eng. 46, 116402 (2007).

Xia, G.

Q. Ping and G. Xia, Chinese J. Lasers 35, 106 (2008).

G. Xia and B. Zhao, Chin. Opt. Lett. 5, 51 (2007).

Zhao, B.

Acta Opt. Sin. (in Chinese) (1)

Z. Guan, Q. Chen, G. Gu, and W. Qian, Acta Opt. Sin. (in Chinese) 28, 1496 (2008).

Chin. Opt. Lett. (1)

Chinese J. Lasers (1)

Q. Ping and G. Xia, Chinese J. Lasers 35, 106 (2008).

Electron. Lett. (1)

G. Du, Electron. Lett. 40, 906 (2004).

IEEE Trans. Pattern Anal. Mach. Intell. (1)

A. P. Pentland, IEEE Trans. Pattern Anal. Mach. Intell. 6, 661 (1984).

Mech. Syst. Signal Processing (1)

J. J. G. de la Rosa and A. M. Mu~noz, Mech. Syst. Signal Processing 22, 279 (2008).

Microelectronics Reliability (1)

F. Principato and G. Ferrante, Microelectronics Reliability 40, 1969 (2000).

Opt. Eng. (1)

Y. Sun, J. Tian, and J. Liu, Opt. Eng. 46, 116402 (2007).

Proc. IEEE. (1)

J. M. Mendel, Proc. IEEE. 79, 278 (1991).

Signal Processing (1)

P. Ravier and P.-O. Amblard, Signal Processing 81, 1909 (2001).

Other (1)

B. B. Mandelbrot, The Fractal Geometry of Nature (W. H. Freeman, San Francisco, 1982).

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