Abstract

Two automatic measurement methods of bidirectional reflection distribution function (BRDF) are presented based on absolute and relative definition. Measurement principle and scheme of the methods are analyzed. A real-time measurement device is developed, the measurement spectral range of which is from ultraviolet to near infrared with 2.4-nm wavelength resolution, and the angular range is [EQUATION] in azimuth angle and [EQUATION] in zenith angle with [EQUATION] angle resolution. Absolute measurements of BRDF on tinfoil and ceramic tile are performed and the test materials present apparent specular reflection characteristics. The theoretical error in the experiment is about 6.05%. The BRDF measurement results are closely related to the precision of measurement platform, the sensitivity of measurement instrument, and the stability of illuminating light source.

© 2009 Chinese Optics Letters

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2008 (1)

H. Wang, W. Zhang, and Z. Wang, Acta Opt. Sin. (in Chinese) 28, 593 (2008).

2007 (2)

2006 (1)

R. Yang, M. Wan, and D. Lu, Chinese J. Lasers (in Chinese) 33, (Suppl.) 260 (2006).

2003 (1)

1999 (1)

Y. Boucher, H. Cosnefroy, A. D. Petit, G. Serrot, and X. Briottet, Proc. SPIE 3699, 16 (1999).

1992 (1)

G. J. Ward, Comput. Graph. 26, 265 (1992).

1990 (1)

P. Poulin and A. Fournier, Comput. Graph. 24, 273 (1990).

Boucher, Y.

Y. Boucher, H. Cosnefroy, A. D. Petit, G. Serrot, and X. Briottet, Proc. SPIE 3699, 16 (1999).

Briottet, X.

Y. Boucher, H. Cosnefroy, A. D. Petit, G. Serrot, and X. Briottet, Proc. SPIE 3699, 16 (1999).

Cosnefroy, H.

Y. Boucher, H. Cosnefroy, A. D. Petit, G. Serrot, and X. Briottet, Proc. SPIE 3699, 16 (1999).

Dai, J.

Fournier, A.

P. Poulin and A. Fournier, Comput. Graph. 24, 273 (1990).

Han, J.

Li, W.

Liu, D.

R. Yang, M. Wan, and D. Lu, Chinese J. Lasers (in Chinese) 33, (Suppl.) 260 (2006).

Petit, A. D.

Y. Boucher, H. Cosnefroy, A. D. Petit, G. Serrot, and X. Briottet, Proc. SPIE 3699, 16 (1999).

Poulin, P.

P. Poulin and A. Fournier, Comput. Graph. 24, 273 (1990).

Qi, C.

Serrot, G.

Y. Boucher, H. Cosnefroy, A. D. Petit, G. Serrot, and X. Briottet, Proc. SPIE 3699, 16 (1999).

Wan, M.

R. Yang, M. Wan, and D. Lu, Chinese J. Lasers (in Chinese) 33, (Suppl.) 260 (2006).

Wang, H.

H. Wang, W. Zhang, and Z. Wang, Acta Opt. Sin. (in Chinese) 28, 593 (2008).

Wang, Z.

H. Wang, W. Zhang, and Z. Wang, Acta Opt. Sin. (in Chinese) 28, 593 (2008).

Ward, G. J.

G. J. Ward, Comput. Graph. 26, 265 (1992).

Yang, C.

Yang, L.

Yang, R.

R. Yang, M. Wan, and D. Lu, Chinese J. Lasers (in Chinese) 33, (Suppl.) 260 (2006).

Zhang, W.

H. Wang, W. Zhang, and Z. Wang, Acta Opt. Sin. (in Chinese) 28, 593 (2008).

Zhao, Z.

Acta Opt. Sin. (in Chinese) (1)

H. Wang, W. Zhang, and Z. Wang, Acta Opt. Sin. (in Chinese) 28, 593 (2008).

Chin. Opt. Lett. (3)

Chinese J. Lasers (in Chinese) (1)

R. Yang, M. Wan, and D. Lu, Chinese J. Lasers (in Chinese) 33, (Suppl.) 260 (2006).

Comput. Graph. (2)

P. Poulin and A. Fournier, Comput. Graph. 24, 273 (1990).

G. J. Ward, Comput. Graph. 26, 265 (1992).

Proc. SPIE (1)

Y. Boucher, H. Cosnefroy, A. D. Petit, G. Serrot, and X. Briottet, Proc. SPIE 3699, 16 (1999).

Other (3)

A. Ryer, The Light Measurement Handbook (International Light, Newburyport, 1998) p.1.

S. C. Foo, "A gonioreflectometer for measuring the bidirectional reflectance of material for use in illumination computation" (Master's Thesis, Cornell University, 1997) p.1.

L. Ke, "A method of light reflectance measurement" (Master's Thesis, University of British Columbia, 1999) p.1.

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