Abstract

Field enhancement effect of metal probe in evanescent field, induced by using a multi-layers structure for exciting surface plasmon resonance (SPR), is analyzed numerically by utilizing two-dimensional (2D) TM-wave finite difference time-domain (FDTD) method. In this letter, we used a fundamental mode Gaussian beam to induce evanescent field, and calculated the electric intensity. The results show that compared with the nonmetal probe, the metal probe has a larger field enhancement effect, and its scattering wave induced by field enhancement has a bigger decay coefficient. The field enhancement effect should conclude that the metal probe has an important application in nanolithography.

© 2009 Chinese Optics Letters

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  1. H. Raether, Surface Plasmon on Smooth and Rough Surface and on Gratings (Springer-Verlag, Berlin, 1988) p.13, p.16.
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  8. S. I. Bozhvolnyi, I. I. Smolyaninov, and A. V. Zayats, Phys. Rev. B 51, 17916 (1995).
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2007

2005

G. Jian, F. Bai, S. Pan, and S. Wu, Acta Opt. Sin. (in Chinese) 25, 470 (2005).

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

J. Grand, M. Lamy de la Chapelle, J. L. Bijeon, P. M. Adam, A. Vial, and P. Royer, Phys. Rev. B 72, 033407 (2005).

2004

A. Hartschuh, M. R. Beversluis, A. Bouhelier, and L. Novotny, Phil. Trans. R. Soc. Lond. A 362, 807 (2004).

Pascal Royer, Dominique Barchiesi, Gilles Lerondel, and Renaud Bachelot, Phil. Trans. R. Soc. Lond. A 362, 821 (2004).

D. Haefliger and A. Stemmer, Ultramicroscopy 100, 457 (2004).

1997

I. I. Smolyaninov and David L. Mazzoni, Phys. Rev. B 56, 1601 (1997).

1995

S. I. Bozhvolnyi, I. I. Smolyaninov, and A. V. Zayats, Phys. Rev. B 51, 17916 (1995).

1992

M. Specht, J. D. Pedarnig, W. M. Heckl, and T. W. Hansch, Phys. Rev. Lett. 68, 476 (1992).

1989

U. Ch. Fischer and D. W. Pohl, Phys. Rev. Lett. 62, 458 (1989).

Adam, P. M.

J. Grand, M. Lamy de la Chapelle, J. L. Bijeon, P. M. Adam, A. Vial, and P. Royer, Phys. Rev. B 72, 033407 (2005).

Bachelot, Renaud

Pascal Royer, Dominique Barchiesi, Gilles Lerondel, and Renaud Bachelot, Phil. Trans. R. Soc. Lond. A 362, 821 (2004).

Bai, F.

G. Jian, F. Bai, S. Pan, and S. Wu, Acta Opt. Sin. (in Chinese) 25, 470 (2005).

Barchiesi, Dominique

Pascal Royer, Dominique Barchiesi, Gilles Lerondel, and Renaud Bachelot, Phil. Trans. R. Soc. Lond. A 362, 821 (2004).

Beversluis, M. R.

A. Hartschuh, M. R. Beversluis, A. Bouhelier, and L. Novotny, Phil. Trans. R. Soc. Lond. A 362, 807 (2004).

Bijeon, J. L.

J. Grand, M. Lamy de la Chapelle, J. L. Bijeon, P. M. Adam, A. Vial, and P. Royer, Phys. Rev. B 72, 033407 (2005).

Bouhelier, A.

A. Hartschuh, M. R. Beversluis, A. Bouhelier, and L. Novotny, Phil. Trans. R. Soc. Lond. A 362, 807 (2004).

Bozhvolnyi, S. I.

S. I. Bozhvolnyi, I. I. Smolyaninov, and A. V. Zayats, Phys. Rev. B 51, 17916 (1995).

Chapelle, M. Lamy de la

J. Grand, M. Lamy de la Chapelle, J. L. Bijeon, P. M. Adam, A. Vial, and P. Royer, Phys. Rev. B 72, 033407 (2005).

Chen, W.

Fang, Z.

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

Fischer, U. Ch.

U. Ch. Fischer and D. W. Pohl, Phys. Rev. Lett. 62, 458 (1989).

Grand, J.

J. Grand, M. Lamy de la Chapelle, J. L. Bijeon, P. M. Adam, A. Vial, and P. Royer, Phys. Rev. B 72, 033407 (2005).

Haefliger, D.

D. Haefliger and A. Stemmer, Ultramicroscopy 100, 457 (2004).

Hansch, T. W.

M. Specht, J. D. Pedarnig, W. M. Heckl, and T. W. Hansch, Phys. Rev. Lett. 68, 476 (1992).

Hartschuh, A.

A. Hartschuh, M. R. Beversluis, A. Bouhelier, and L. Novotny, Phil. Trans. R. Soc. Lond. A 362, 807 (2004).

Heckl, W. M.

M. Specht, J. D. Pedarnig, W. M. Heckl, and T. W. Hansch, Phys. Rev. Lett. 68, 476 (1992).

Jian, G.

G. Jian, F. Bai, S. Pan, and S. Wu, Acta Opt. Sin. (in Chinese) 25, 470 (2005).

Kang, H.

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

Lerondel, Gilles

Pascal Royer, Dominique Barchiesi, Gilles Lerondel, and Renaud Bachelot, Phil. Trans. R. Soc. Lond. A 362, 821 (2004).

Lu, Y.

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

Mazzoni, David L.

I. I. Smolyaninov and David L. Mazzoni, Phys. Rev. B 56, 1601 (1997).

Novotny, L.

A. Hartschuh, M. R. Beversluis, A. Bouhelier, and L. Novotny, Phil. Trans. R. Soc. Lond. A 362, 807 (2004).

Pan, S.

G. Jian, F. Bai, S. Pan, and S. Wu, Acta Opt. Sin. (in Chinese) 25, 470 (2005).

Pedarnig, J. D.

M. Specht, J. D. Pedarnig, W. M. Heckl, and T. W. Hansch, Phys. Rev. Lett. 68, 476 (1992).

Pohl, D. W.

U. Ch. Fischer and D. W. Pohl, Phys. Rev. Lett. 62, 458 (1989).

Royer, P.

J. Grand, M. Lamy de la Chapelle, J. L. Bijeon, P. M. Adam, A. Vial, and P. Royer, Phys. Rev. B 72, 033407 (2005).

Royer, Pascal

Pascal Royer, Dominique Barchiesi, Gilles Lerondel, and Renaud Bachelot, Phil. Trans. R. Soc. Lond. A 362, 821 (2004).

Smolyaninov, I. I.

I. I. Smolyaninov and David L. Mazzoni, Phys. Rev. B 56, 1601 (1997).

S. I. Bozhvolnyi, I. I. Smolyaninov, and A. V. Zayats, Phys. Rev. B 51, 17916 (1995).

Specht, M.

M. Specht, J. D. Pedarnig, W. M. Heckl, and T. W. Hansch, Phys. Rev. Lett. 68, 476 (1992).

Stemmer, A.

D. Haefliger and A. Stemmer, Ultramicroscopy 100, 457 (2004).

Vial, A.

J. Grand, M. Lamy de la Chapelle, J. L. Bijeon, P. M. Adam, A. Vial, and P. Royer, Phys. Rev. B 72, 033407 (2005).

Wu, S.

G. Jian, F. Bai, S. Pan, and S. Wu, Acta Opt. Sin. (in Chinese) 25, 470 (2005).

Yang, D.

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

Yang, H.

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

Yang, J.

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

Yi, M.

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

Zayats, A. V.

S. I. Bozhvolnyi, I. I. Smolyaninov, and A. V. Zayats, Phys. Rev. B 51, 17916 (1995).

Zhan, Q.

Zhang, T.

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

Acta Opt. Sin. (in Chinese)

G. Jian, F. Bai, S. Pan, and S. Wu, Acta Opt. Sin. (in Chinese) 25, 470 (2005).

Chin. Opt. Lett.

Phil. Trans. R. Soc. Lond. A

Pascal Royer, Dominique Barchiesi, Gilles Lerondel, and Renaud Bachelot, Phil. Trans. R. Soc. Lond. A 362, 821 (2004).

A. Hartschuh, M. R. Beversluis, A. Bouhelier, and L. Novotny, Phil. Trans. R. Soc. Lond. A 362, 807 (2004).

Phys. Rev. B

J. Grand, M. Lamy de la Chapelle, J. L. Bijeon, P. M. Adam, A. Vial, and P. Royer, Phys. Rev. B 72, 033407 (2005).

S. I. Bozhvolnyi, I. I. Smolyaninov, and A. V. Zayats, Phys. Rev. B 51, 17916 (1995).

I. I. Smolyaninov and David L. Mazzoni, Phys. Rev. B 56, 1601 (1997).

Phys. Rev. Lett.

U. Ch. Fischer and D. W. Pohl, Phys. Rev. Lett. 62, 458 (1989).

M. Specht, J. D. Pedarnig, W. M. Heckl, and T. W. Hansch, Phys. Rev. Lett. 68, 476 (1992).

Physics (in Chinese)

T. Zhang, M. Yi, Z. Fang, H. Yang, J. Yang, Y. Lu, H. Yang, H. Kang, and D. Yang, Physics (in Chinese) 34, 909 (2005).

Ultramicroscopy

D. Haefliger and A. Stemmer, Ultramicroscopy 100, 457 (2004).

Other

J. Tominaga and T. Nakano, Optical Near-Field Recording: Science and Technology (Springer-Verlag, Berlin, 2005) p.49.

H. Raether, Surface Plasmon on Smooth and Rough Surface and on Gratings (Springer-Verlag, Berlin, 1988) p.13, p.16.

Satoshi Kawata (Ed.), Motoichi Ohtsu, Masahiro Irie, Near-Field Optics and Surface Plasmon Polaritons (Spring-Verlag, Berlin, 2001) p.29.

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