Abstract

Objective image quality measure, which is a fundamental and challenging job in image processing, evaluates the image quality consistently with human perception automatically. On the assumption that any image distortion could be modeled as the difference between the directional projection-based maps of reference and distortion images, we propose a new objective quality assessment method based on directional projection for full reference model. Experimental results show that the proposed metrics are well consistent with the subjective quality score.

© 2008 Chinese Optics Letters

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  1. Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).
  2. A. M. Eskicioglu and P. S. Fisher, IEEE Trans. Commun. 43, 2959 (1995).
  3. H. Di and X. Liu, Acta Photon. Sin. (in Chinese) 35, 766 (2006).
  4. A. Shnayderman, A. Gusev, and A. M. Eskicioglu, IEEE Trans. Image Process. 15, 422 (2006).
  5. Z. An, S. Zhao, X. Wang, and L. Zhou, Acta Photon. Sin. (in Chinese) 36, 1176 (2007).
  6. S. Xiao and Y. Wu, Chin. Opt. Lett. 5, 513 (2007).
  7. L. Wang, Q. Chang, K. Zhang, and Y. Li, Infrared Laser Eng. (in Chinese) 32, 163 (2003).
  8. Z. Deng and Y. Xiong, Opto-Electron. Eng. (in Chinese) 34, (10) 98 (2007).
  9. H. R. Sheikh, Z. Wang, L. Cormack, and A. C. Bovik, "Live image quality assessment database release 2" http: //live.ece.utexas.edu/research/quality (Sep. 20, 2006).
  10. H. R. Sheikh, M. F. Sabir, and A. C. Bovik, IEEE Trans. Image Process. 15, 3441 (2006).
  11. VQEG, "Final report from the video quality experts group on the validation of objective models of video quality assessment" http://www.vqeg.org/ (Sep. 21, 2006).

2007 (3)

Z. An, S. Zhao, X. Wang, and L. Zhou, Acta Photon. Sin. (in Chinese) 36, 1176 (2007).

Z. Deng and Y. Xiong, Opto-Electron. Eng. (in Chinese) 34, (10) 98 (2007).

S. Xiao and Y. Wu, Chin. Opt. Lett. 5, 513 (2007).

2006 (3)

H. R. Sheikh, M. F. Sabir, and A. C. Bovik, IEEE Trans. Image Process. 15, 3441 (2006).

H. Di and X. Liu, Acta Photon. Sin. (in Chinese) 35, 766 (2006).

A. Shnayderman, A. Gusev, and A. M. Eskicioglu, IEEE Trans. Image Process. 15, 422 (2006).

2004 (1)

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).

2003 (1)

L. Wang, Q. Chang, K. Zhang, and Y. Li, Infrared Laser Eng. (in Chinese) 32, 163 (2003).

1995 (1)

A. M. Eskicioglu and P. S. Fisher, IEEE Trans. Commun. 43, 2959 (1995).

An, Z.

Z. An, S. Zhao, X. Wang, and L. Zhou, Acta Photon. Sin. (in Chinese) 36, 1176 (2007).

Bovik, A. C.

H. R. Sheikh, M. F. Sabir, and A. C. Bovik, IEEE Trans. Image Process. 15, 3441 (2006).

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).

Chang, Q.

L. Wang, Q. Chang, K. Zhang, and Y. Li, Infrared Laser Eng. (in Chinese) 32, 163 (2003).

Deng, Z.

Z. Deng and Y. Xiong, Opto-Electron. Eng. (in Chinese) 34, (10) 98 (2007).

Di, H.

H. Di and X. Liu, Acta Photon. Sin. (in Chinese) 35, 766 (2006).

Eskicioglu, A. M.

A. Shnayderman, A. Gusev, and A. M. Eskicioglu, IEEE Trans. Image Process. 15, 422 (2006).

A. M. Eskicioglu and P. S. Fisher, IEEE Trans. Commun. 43, 2959 (1995).

Fisher, P. S.

A. M. Eskicioglu and P. S. Fisher, IEEE Trans. Commun. 43, 2959 (1995).

Gusev, A.

A. Shnayderman, A. Gusev, and A. M. Eskicioglu, IEEE Trans. Image Process. 15, 422 (2006).

Li, Y.

L. Wang, Q. Chang, K. Zhang, and Y. Li, Infrared Laser Eng. (in Chinese) 32, 163 (2003).

Liu, X.

H. Di and X. Liu, Acta Photon. Sin. (in Chinese) 35, 766 (2006).

Sabir, M. F.

H. R. Sheikh, M. F. Sabir, and A. C. Bovik, IEEE Trans. Image Process. 15, 3441 (2006).

Sheikh, H. R.

H. R. Sheikh, M. F. Sabir, and A. C. Bovik, IEEE Trans. Image Process. 15, 3441 (2006).

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).

Shnayderman, A.

A. Shnayderman, A. Gusev, and A. M. Eskicioglu, IEEE Trans. Image Process. 15, 422 (2006).

Simoncelli, E. P.

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).

Wang, L.

L. Wang, Q. Chang, K. Zhang, and Y. Li, Infrared Laser Eng. (in Chinese) 32, 163 (2003).

Wang, X.

Z. An, S. Zhao, X. Wang, and L. Zhou, Acta Photon. Sin. (in Chinese) 36, 1176 (2007).

Wang, Z.

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).

Wu, Y.

Xiao, S.

Xiong, Y.

Z. Deng and Y. Xiong, Opto-Electron. Eng. (in Chinese) 34, (10) 98 (2007).

Zhang, K.

L. Wang, Q. Chang, K. Zhang, and Y. Li, Infrared Laser Eng. (in Chinese) 32, 163 (2003).

Zhao, S.

Z. An, S. Zhao, X. Wang, and L. Zhou, Acta Photon. Sin. (in Chinese) 36, 1176 (2007).

Zhou, L.

Z. An, S. Zhao, X. Wang, and L. Zhou, Acta Photon. Sin. (in Chinese) 36, 1176 (2007).

Acta Photon. Sin. (in Chinese) (2)

H. Di and X. Liu, Acta Photon. Sin. (in Chinese) 35, 766 (2006).

Z. An, S. Zhao, X. Wang, and L. Zhou, Acta Photon. Sin. (in Chinese) 36, 1176 (2007).

Chin. Opt. Lett. (1)

IEEE Trans. Commun. (1)

A. M. Eskicioglu and P. S. Fisher, IEEE Trans. Commun. 43, 2959 (1995).

IEEE Trans. Image Process. (3)

Z. Wang, A. C. Bovik, H. R. Sheikh, and E. P. Simoncelli, IEEE Trans. Image Process. 13, 600 (2004).

A. Shnayderman, A. Gusev, and A. M. Eskicioglu, IEEE Trans. Image Process. 15, 422 (2006).

H. R. Sheikh, M. F. Sabir, and A. C. Bovik, IEEE Trans. Image Process. 15, 3441 (2006).

Infrared Laser Eng. (in Chinese) (1)

L. Wang, Q. Chang, K. Zhang, and Y. Li, Infrared Laser Eng. (in Chinese) 32, 163 (2003).

Opto-Electron. Eng. (in Chinese) (1)

Z. Deng and Y. Xiong, Opto-Electron. Eng. (in Chinese) 34, (10) 98 (2007).

Other (2)

H. R. Sheikh, Z. Wang, L. Cormack, and A. C. Bovik, "Live image quality assessment database release 2" http: //live.ece.utexas.edu/research/quality (Sep. 20, 2006).

VQEG, "Final report from the video quality experts group on the validation of objective models of video quality assessment" http://www.vqeg.org/ (Sep. 21, 2006).

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