Abstract

A new calibration method of detectors can be realized by using correlated photons generated in spontaneous parametric down-conversion (SPDC) effect of nonlinear crystal. An absolute calibration system of detector quantum efficiency is performed. And its principle and experimental setup are introduced. A continuous-wave (CW) ultraviolet (351 nm), diode-pumped, frequency-doubled, and solid-state laser is used to pump BBO crystal. The quantum efficiencies of the photomultiplier at 633, 702, and 789 nm are measured respectively. The coincidence peaks are observed using coincidence circuit. Some measurement factors including the filter bandwidth of trigger channel, the detector position alignment and polarization of the pump light are analyzed. The uncertainties of this calibration method are also analyzed, and the relative uncertainties of total calibration are less than 5.8%. The accuracy of this method could be improved in the future.

© 2008 Chinese Optics Letters

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2007 (3)

Z. Lin, X. Zheng, L. Zhang, and J. Wang, Laser Optoelectron. Prog. (in Chinese) 44, (4) 62 (2007).

Y. Feng, X. Zheng, W. Zhang, J. Li, and Y. Qiao, Acta Opt. Sin. (in Chinese) 27, 457 (2007).

S. V. Polyakov and A. Migdall, Proc. SPIE 6583, 65830A (2007).

2006 (4)

L. Zhou and X. Zheng, Opto-Electron. Eng. (in Chinese) 33, 32 (2006).

Y. Feng, X. Zheng, Y. Qiao, and J. Li, Chinese J. Lasers (in Chinese) 33, (Suppl.) 200 (2006).

J. Xing, S. Wang, and F. Li, Chinese J. Lasers (in Chinese) 33, 509 (2006).

Y. Feng, X. Zheng, J. Li, and W. Zhang, Chin. Opt. Lett. 4, 315 (2006).

2002 (1)

2001 (1)

X. Zheng, H. Wu, J. Zhang, W. Zhou, Y. Liu, L. Wang, and Y. Qiao, Acta Opt. Sin. (in Chinese) 21, 749 (2001).

1970 (1)

D. C. Burnham and D. L. Weinberg, Phys. Rev. Lett. 25, 84 (1970).

1967 (1)

S. E. Harris, M. K. Oshman, and R. L. Byer, Phys. Rev. Lett. 18, 732 (1967).

Burnham, D. C.

D. C. Burnham and D. L. Weinberg, Phys. Rev. Lett. 25, 84 (1970).

Byer, R. L.

S. E. Harris, M. K. Oshman, and R. L. Byer, Phys. Rev. Lett. 18, 732 (1967).

Castelletto, S.

Degiovanni, I. P.

Feng, Y.

Y. Feng, X. Zheng, W. Zhang, J. Li, and Y. Qiao, Acta Opt. Sin. (in Chinese) 27, 457 (2007).

Y. Feng, X. Zheng, J. Li, and W. Zhang, Chin. Opt. Lett. 4, 315 (2006).

Y. Feng, X. Zheng, Y. Qiao, and J. Li, Chinese J. Lasers (in Chinese) 33, (Suppl.) 200 (2006).

Harris, S. E.

S. E. Harris, M. K. Oshman, and R. L. Byer, Phys. Rev. Lett. 18, 732 (1967).

Li, F.

J. Xing, S. Wang, and F. Li, Chinese J. Lasers (in Chinese) 33, 509 (2006).

Li, J.

Y. Feng, X. Zheng, W. Zhang, J. Li, and Y. Qiao, Acta Opt. Sin. (in Chinese) 27, 457 (2007).

Y. Feng, X. Zheng, J. Li, and W. Zhang, Chin. Opt. Lett. 4, 315 (2006).

Y. Feng, X. Zheng, Y. Qiao, and J. Li, Chinese J. Lasers (in Chinese) 33, (Suppl.) 200 (2006).

Lin, Z.

Z. Lin, X. Zheng, L. Zhang, and J. Wang, Laser Optoelectron. Prog. (in Chinese) 44, (4) 62 (2007).

Liu, Y.

X. Zheng, H. Wu, J. Zhang, W. Zhou, Y. Liu, L. Wang, and Y. Qiao, Acta Opt. Sin. (in Chinese) 21, 749 (2001).

Migdall, A.

S. V. Polyakov and A. Migdall, Proc. SPIE 6583, 65830A (2007).

A. Migdall, S. Castelletto, I. P. Degiovanni, and M. L. Rastello, Appl. Opt. 41, 2914 (2002).

Oshman, M. K.

S. E. Harris, M. K. Oshman, and R. L. Byer, Phys. Rev. Lett. 18, 732 (1967).

Polyakov, S. V.

S. V. Polyakov and A. Migdall, Proc. SPIE 6583, 65830A (2007).

Qiao, Y.

Y. Feng, X. Zheng, W. Zhang, J. Li, and Y. Qiao, Acta Opt. Sin. (in Chinese) 27, 457 (2007).

Y. Feng, X. Zheng, Y. Qiao, and J. Li, Chinese J. Lasers (in Chinese) 33, (Suppl.) 200 (2006).

X. Zheng, H. Wu, J. Zhang, W. Zhou, Y. Liu, L. Wang, and Y. Qiao, Acta Opt. Sin. (in Chinese) 21, 749 (2001).

Rastello, M. L.

Wang, J.

Z. Lin, X. Zheng, L. Zhang, and J. Wang, Laser Optoelectron. Prog. (in Chinese) 44, (4) 62 (2007).

Wang, L.

X. Zheng, H. Wu, J. Zhang, W. Zhou, Y. Liu, L. Wang, and Y. Qiao, Acta Opt. Sin. (in Chinese) 21, 749 (2001).

Wang, S.

J. Xing, S. Wang, and F. Li, Chinese J. Lasers (in Chinese) 33, 509 (2006).

Weinberg, D. L.

D. C. Burnham and D. L. Weinberg, Phys. Rev. Lett. 25, 84 (1970).

Wu, H.

X. Zheng, H. Wu, J. Zhang, W. Zhou, Y. Liu, L. Wang, and Y. Qiao, Acta Opt. Sin. (in Chinese) 21, 749 (2001).

Xing, J.

J. Xing, S. Wang, and F. Li, Chinese J. Lasers (in Chinese) 33, 509 (2006).

Zhang, J.

X. Zheng, H. Wu, J. Zhang, W. Zhou, Y. Liu, L. Wang, and Y. Qiao, Acta Opt. Sin. (in Chinese) 21, 749 (2001).

Zhang, L.

Z. Lin, X. Zheng, L. Zhang, and J. Wang, Laser Optoelectron. Prog. (in Chinese) 44, (4) 62 (2007).

Zhang, W.

Y. Feng, X. Zheng, W. Zhang, J. Li, and Y. Qiao, Acta Opt. Sin. (in Chinese) 27, 457 (2007).

Y. Feng, X. Zheng, J. Li, and W. Zhang, Chin. Opt. Lett. 4, 315 (2006).

Zheng, X.

Y. Feng, X. Zheng, W. Zhang, J. Li, and Y. Qiao, Acta Opt. Sin. (in Chinese) 27, 457 (2007).

Z. Lin, X. Zheng, L. Zhang, and J. Wang, Laser Optoelectron. Prog. (in Chinese) 44, (4) 62 (2007).

L. Zhou and X. Zheng, Opto-Electron. Eng. (in Chinese) 33, 32 (2006).

Y. Feng, X. Zheng, Y. Qiao, and J. Li, Chinese J. Lasers (in Chinese) 33, (Suppl.) 200 (2006).

Y. Feng, X. Zheng, J. Li, and W. Zhang, Chin. Opt. Lett. 4, 315 (2006).

X. Zheng, H. Wu, J. Zhang, W. Zhou, Y. Liu, L. Wang, and Y. Qiao, Acta Opt. Sin. (in Chinese) 21, 749 (2001).

Zhou, L.

L. Zhou and X. Zheng, Opto-Electron. Eng. (in Chinese) 33, 32 (2006).

Zhou, W.

X. Zheng, H. Wu, J. Zhang, W. Zhou, Y. Liu, L. Wang, and Y. Qiao, Acta Opt. Sin. (in Chinese) 21, 749 (2001).

Acta Opt. Sin. (in Chinese) (2)

Y. Feng, X. Zheng, W. Zhang, J. Li, and Y. Qiao, Acta Opt. Sin. (in Chinese) 27, 457 (2007).

X. Zheng, H. Wu, J. Zhang, W. Zhou, Y. Liu, L. Wang, and Y. Qiao, Acta Opt. Sin. (in Chinese) 21, 749 (2001).

Appl. Opt. (1)

Chin. Opt. Lett. (1)

Chinese J. Lasers (in Chinese) (2)

J. Xing, S. Wang, and F. Li, Chinese J. Lasers (in Chinese) 33, 509 (2006).

Y. Feng, X. Zheng, Y. Qiao, and J. Li, Chinese J. Lasers (in Chinese) 33, (Suppl.) 200 (2006).

Laser Optoelectron. Prog. (in Chinese) (1)

Z. Lin, X. Zheng, L. Zhang, and J. Wang, Laser Optoelectron. Prog. (in Chinese) 44, (4) 62 (2007).

Opto-Electron. Eng. (in Chinese) (1)

L. Zhou and X. Zheng, Opto-Electron. Eng. (in Chinese) 33, 32 (2006).

Phys. Rev. Lett. (2)

D. C. Burnham and D. L. Weinberg, Phys. Rev. Lett. 25, 84 (1970).

S. E. Harris, M. K. Oshman, and R. L. Byer, Phys. Rev. Lett. 18, 732 (1967).

Proc. SPIE (1)

S. V. Polyakov and A. Migdall, Proc. SPIE 6583, 65830A (2007).

Other (1)

B. N. Tayor and C. E. Kuyat, "Guidelines for evaluating and expressing the uncertainty of NIST measurement results" NIST Technical Note 1297 (1994 edn.).

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