Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Chinese Optics Letters
  • Vol. 6,
  • Issue 3,
  • pp. 179-182
  • (2008)

Quantitative measurement of displacement and strain by the numerical moire method

Not Accessible

Your library or personal account may give you access

Abstract

The numerical moire method with sensitivity as high as 0.03 nm has been presented. A quantitative displacement and strain analysis program has been proposed by using this method. It is applied to an edge dislocation and a stacking fault in aluminum. The measured strain of edge dislocation is compared with theoretical prediction given by Peierls-Nabarro dislocation model. The displacement of stacking fault is also obtained.

© 2008 Chinese Optics Letters

PDF Article
More Like This
In-plane displacement and strain measurement by speckle interferometry and moire derivation

Michael Spajer, Pramod K. Rastogi, and Jacques Monneret
Appl. Opt. 20(19) 3392-3402 (1981)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.