Abstract

Conventional Gabor representation and its extracted features often yield a fairly poor performance in extracting the invariance features of objects. To address this issue, a global Gabor representation method for raised characters pressed on label is proposed in this paper, where the representation only requires few summations on the conventional Gabor filter responses. Features are then extracted from these new representations to construct the invariant features. Experimental results clearly show that the obtained global Gabor features provide good performance in rotation, translation, and scale invariance. Also, they are insensitive to illumination conditions and noise changes. It is proved that Gabor filters can be reliably used in low-level feature extraction in image processing and the global Gabor features can be used to construct robust invariant recognition system.

© 2008 Chinese Optics Letters

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2007 (4)

J. Han and K.-K. Ma, Image Vis. Comput. 25, 1474 (2007).

S. Feng, Y. Bao, S. Nie, and L. Wang, Chin. J. Lasers (in Chinese) 34, 952 (2007).

B. Liu and J. Peng, Acta Opt. Sin. (in Chinese) 27, 1419 (2007).

L. Li, B. Guo, and K. Shao, Chin. Opt. Lett. 5, 332 (2007).

2005 (3)

X. Wang, X. Ding, and C. Liu, Pattern Recogn. 38, 369 (2005).

B. Shen, W. Wu, Y. Zhang, G. Shen, and L. Yang, Chin. J. Mech. Eng. 18, 467 (2005).

L.-L. Huang, A. Shimizu, and H. Kobatake, Pattern Recogn. Lett. 26, 1641 (2005).

2004 (2)

W. Quan, N. Zheng, and J. Xue, Mini-Micro Systems (in Chinese) 25, 271 (2004).

J. Cao and C. Lu, J. Optoelectron Laser (in Chinese) 15, 477 (2004).

2003 (3)

N. Chen and J. Zhong, Chin. Opt. Lett. 1, 648 (2003).

V. Kyrki, J.-K. Kamarainen, and H. Kalviainen, Pattern Recogn. Lett. 25, 311 (2003).

Y.-M. Su and J.-F. Wang, Pattern Recogn. 36, 635 (2003).

2002 (1)

A. Bodnarova, M. Bennamoun, and S. Latham, Pattern Recogn. 35, 2973 (2002).

2001 (1)

H. J. Park and H. S. Yang, Pattern Recogn. Lett. 22, 869 (2001).

1998 (1)

Y. Hamamoto, S. Uchimura, M. Watanabe, T. Yasuda, Y. Mitani, and S. Tomita, Pattern Recogn. 31, 395 (1998).

1995 (1)

Y. K. Ham, M. S. Kang, H. K. Chung, R.-H. Park, and G. T. Park, Opt. Eng. 34, 102 (1995).

1985 (1)

Acta Opt. Sin. (in Chinese) (1)

B. Liu and J. Peng, Acta Opt. Sin. (in Chinese) 27, 1419 (2007).

Chin. J. Lasers (in Chinese) (1)

S. Feng, Y. Bao, S. Nie, and L. Wang, Chin. J. Lasers (in Chinese) 34, 952 (2007).

Chin. J. Mech. Eng. (1)

B. Shen, W. Wu, Y. Zhang, G. Shen, and L. Yang, Chin. J. Mech. Eng. 18, 467 (2005).

Chin. Opt. Lett. (2)

Image Vis. Comput. (1)

J. Han and K.-K. Ma, Image Vis. Comput. 25, 1474 (2007).

J. Opt. Soc. Am. A (1)

J. Optoelectron Laser (in Chinese) (1)

J. Cao and C. Lu, J. Optoelectron Laser (in Chinese) 15, 477 (2004).

Mini-Micro Systems (in Chinese) (1)

W. Quan, N. Zheng, and J. Xue, Mini-Micro Systems (in Chinese) 25, 271 (2004).

Opt. Eng. (1)

Y. K. Ham, M. S. Kang, H. K. Chung, R.-H. Park, and G. T. Park, Opt. Eng. 34, 102 (1995).

Pattern Recogn. (4)

A. Bodnarova, M. Bennamoun, and S. Latham, Pattern Recogn. 35, 2973 (2002).

Y. Hamamoto, S. Uchimura, M. Watanabe, T. Yasuda, Y. Mitani, and S. Tomita, Pattern Recogn. 31, 395 (1998).

X. Wang, X. Ding, and C. Liu, Pattern Recogn. 38, 369 (2005).

Y.-M. Su and J.-F. Wang, Pattern Recogn. 36, 635 (2003).

Pattern Recogn. Lett. (3)

V. Kyrki, J.-K. Kamarainen, and H. Kalviainen, Pattern Recogn. Lett. 25, 311 (2003).

H. J. Park and H. S. Yang, Pattern Recogn. Lett. 22, 869 (2001).

L.-L. Huang, A. Shimizu, and H. Kobatake, Pattern Recogn. Lett. 26, 1641 (2005).

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