Abstract

Traditional speckle fringe patterns by electronic speckle pattern interferometry (ESPI) are inherently noisy and of limited visibility, so denoising is the key problem in ESPI. We present the variational denoising method for ESPI. This method transforms the image denosing to minimizing an appropriate penalized energy function and solving a partial differential equation. We test the proposed method on computer-simulated and experimental speckle correlation fringes, respectively. The results show that this technique is capable of significantly improving the quality of fringe patterns. It works well as a pre-processing for the fringe patterns by ESPI.

© 2008 Chinese Optics Letters

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2006 (3)

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, Journal of Image and Graphics (in Chinese) 11, 818 (2006).

C. Tang, F. Zhang, H. Yan, and Z. Chen, Opt. Commun. 260, 91 (2006).

R. Ambu, F. Aymerich, F. Ginesu, and P. Priolo, Compos. Sci. Technol. 66, 199 (2006).

2005 (2)

C. Quan, C. J. Tay, F. Yang, and X. He, Appl. Opt. 44, 4814 (2005).

P. Sun, L. Zhang, and C. Tao, Acta Photon. Sin. (in Chinese) 34, 1074 (2005).

2004 (1)

M. J. Huang, Z.-N. He, and F.-Z. Lee, Measurement 36, 93 (2004).

2003 (1)

S. L. Keeling, Appl. Math. Comput. 139, 101 (2003).

2001 (1)

Y. Chen, C. A. Z. Barcelos, and B. A. Mair, Comput. Vis. Image Understand. 82, 85 (2001).

1997 (1)

1992 (2)

L. I. Rudin, S. Osher, and E. Fatemi, Phys. D 60, 259 (1992).

F. Catté, P.-L. Lions, J.-M. Morel, and T. Coll, SIAM J. Numer. Anal. 29, 182 (1992).

1990 (1)

P. Perona and J. Malik, IEEE Trans. Pattern Analysis and Machine Intelligence 12, 629 (1990).

1984 (1)

K. H. Womack, Opt. Eng. 23, 391 (1984).

Acta Photon. Sin. (in Chinese) (1)

P. Sun, L. Zhang, and C. Tao, Acta Photon. Sin. (in Chinese) 34, 1074 (2005).

Appl. Math. Comput. (1)

S. L. Keeling, Appl. Math. Comput. 139, 101 (2003).

Appl. Opt. (2)

Compos. Sci. Technol. (1)

R. Ambu, F. Aymerich, F. Ginesu, and P. Priolo, Compos. Sci. Technol. 66, 199 (2006).

Comput. Vis. Image Understand. (1)

Y. Chen, C. A. Z. Barcelos, and B. A. Mair, Comput. Vis. Image Understand. 82, 85 (2001).

IEEE Trans. Pattern Analysis and Machine Intelligence (1)

P. Perona and J. Malik, IEEE Trans. Pattern Analysis and Machine Intelligence 12, 629 (1990).

Journal of Image and Graphics (in Chinese) (1)

W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, Journal of Image and Graphics (in Chinese) 11, 818 (2006).

Measurement (1)

M. J. Huang, Z.-N. He, and F.-Z. Lee, Measurement 36, 93 (2004).

Opt. Commun. (1)

C. Tang, F. Zhang, H. Yan, and Z. Chen, Opt. Commun. 260, 91 (2006).

Opt. Eng. (1)

K. H. Womack, Opt. Eng. 23, 391 (1984).

Phys. D (1)

L. I. Rudin, S. Osher, and E. Fatemi, Phys. D 60, 259 (1992).

SIAM J. Numer. Anal. (1)

F. Catté, P.-L. Lions, J.-M. Morel, and T. Coll, SIAM J. Numer. Anal. 29, 182 (1992).

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