Abstract

A multi-spectrum bidirectional reflectance distribution function (BRDF) measurement system was developed with the adoption of single reference standard measurement method. An arm-adjustable corner device was designed for the BRDF system. Changing the distance to the sample by moving the detector arm made the device applicable to different wavelengths. The system could be used for the spectrum range from visible light (0.6328 microns) to mid-far infrared (10.6 microns), the facular size between 0.8-3 cm. The rotating limit of detector arm was +-180 deg., the rotation range of sample holding table was 360 deg., and the angle resolution was 0.036 deg.. A silicon carbide sample was measured using this system with reflectance zenith from -55 to +55 deg.. According to the error analysis, the measurement uncertainty of this device was about 6.42%.

© 2007 Chinese Optics Letters

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2006 (1)

B. Zhang, W. Liu, Q. Wei, M. Gao, C. Lian, J. Hu, and S. Wang, Opt. Technique (in Chinese) 32, 180 (2006).

2004 (1)

J. R. Johnson, W. M. Grundy, and M. K. Shepard, Icarus 171, 546 (2004).

2003 (1)

1999 (1)

S. Tsuchida, I. Sato, and S. Okada, Proc. SPIE 3870, 254 (1999).

1993 (1)

T. F. Schiff, M. W. Knighton, D. J. Wilson, F. M. Cady, J. C. Stover, and J. J. Butler, Proc. SPIE 1995, 121 (1993).

1980 (1)

E. L. Dereniak, T. W. Stuhlinger, and F. O. Bartell, Proc. SPIE 257, 184 (1980).

1970 (1)

Bartell, F. O.

E. L. Dereniak, T. W. Stuhlinger, and F. O. Bartell, Proc. SPIE 257, 184 (1980).

Butler, J. J.

T. F. Schiff, M. W. Knighton, D. J. Wilson, F. M. Cady, J. C. Stover, and J. J. Butler, Proc. SPIE 1995, 121 (1993).

Cady, F. M.

T. F. Schiff, M. W. Knighton, D. J. Wilson, F. M. Cady, J. C. Stover, and J. J. Butler, Proc. SPIE 1995, 121 (1993).

Dai, J.

Dereniak, E. L.

E. L. Dereniak, T. W. Stuhlinger, and F. O. Bartell, Proc. SPIE 257, 184 (1980).

Gao, M.

B. Zhang, W. Liu, Q. Wei, M. Gao, C. Lian, J. Hu, and S. Wang, Opt. Technique (in Chinese) 32, 180 (2006).

Grundy, W. M.

J. R. Johnson, W. M. Grundy, and M. K. Shepard, Icarus 171, 546 (2004).

Hu, J.

B. Zhang, W. Liu, Q. Wei, M. Gao, C. Lian, J. Hu, and S. Wang, Opt. Technique (in Chinese) 32, 180 (2006).

Johnson, J. R.

J. R. Johnson, W. M. Grundy, and M. K. Shepard, Icarus 171, 546 (2004).

Knighton, M. W.

T. F. Schiff, M. W. Knighton, D. J. Wilson, F. M. Cady, J. C. Stover, and J. J. Butler, Proc. SPIE 1995, 121 (1993).

Li, W.

Lian, C.

B. Zhang, W. Liu, Q. Wei, M. Gao, C. Lian, J. Hu, and S. Wang, Opt. Technique (in Chinese) 32, 180 (2006).

Liu, W.

B. Zhang, W. Liu, Q. Wei, M. Gao, C. Lian, J. Hu, and S. Wang, Opt. Technique (in Chinese) 32, 180 (2006).

Nicodemus, F. E.

Okada, S.

S. Tsuchida, I. Sato, and S. Okada, Proc. SPIE 3870, 254 (1999).

Qi, C.

Sato, I.

S. Tsuchida, I. Sato, and S. Okada, Proc. SPIE 3870, 254 (1999).

Schiff, T. F.

T. F. Schiff, M. W. Knighton, D. J. Wilson, F. M. Cady, J. C. Stover, and J. J. Butler, Proc. SPIE 1995, 121 (1993).

Shepard, M. K.

J. R. Johnson, W. M. Grundy, and M. K. Shepard, Icarus 171, 546 (2004).

Stover, J. C.

T. F. Schiff, M. W. Knighton, D. J. Wilson, F. M. Cady, J. C. Stover, and J. J. Butler, Proc. SPIE 1995, 121 (1993).

Stuhlinger, T. W.

E. L. Dereniak, T. W. Stuhlinger, and F. O. Bartell, Proc. SPIE 257, 184 (1980).

Tsuchida, S.

S. Tsuchida, I. Sato, and S. Okada, Proc. SPIE 3870, 254 (1999).

Wang, S.

B. Zhang, W. Liu, Q. Wei, M. Gao, C. Lian, J. Hu, and S. Wang, Opt. Technique (in Chinese) 32, 180 (2006).

Wei, Q.

B. Zhang, W. Liu, Q. Wei, M. Gao, C. Lian, J. Hu, and S. Wang, Opt. Technique (in Chinese) 32, 180 (2006).

Wilson, D. J.

T. F. Schiff, M. W. Knighton, D. J. Wilson, F. M. Cady, J. C. Stover, and J. J. Butler, Proc. SPIE 1995, 121 (1993).

Yang, C.

Zhang, B.

B. Zhang, W. Liu, Q. Wei, M. Gao, C. Lian, J. Hu, and S. Wang, Opt. Technique (in Chinese) 32, 180 (2006).

Appl. Opt. (1)

Chin. Opt. Lett. (1)

Icarus (1)

J. R. Johnson, W. M. Grundy, and M. K. Shepard, Icarus 171, 546 (2004).

Opt. Technique (in Chinese) (1)

B. Zhang, W. Liu, Q. Wei, M. Gao, C. Lian, J. Hu, and S. Wang, Opt. Technique (in Chinese) 32, 180 (2006).

Proc. SPIE (3)

E. L. Dereniak, T. W. Stuhlinger, and F. O. Bartell, Proc. SPIE 257, 184 (1980).

T. F. Schiff, M. W. Knighton, D. J. Wilson, F. M. Cady, J. C. Stover, and J. J. Butler, Proc. SPIE 1995, 121 (1993).

S. Tsuchida, I. Sato, and S. Okada, Proc. SPIE 3870, 254 (1999).

Other (2)

S. R. Marschner, S. H. Westin, E. P. F. Lafortune, K. E. Torrance, and D. P. Greenberg, in Proceedings of 10th Eurographics Workshop on Rendering 139 (1999).

K. J. Dana, in Proceedings of 8th IEEE International Conference on Computer Vision 2, 460 (2001).

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