Abstract

The depolarization behavior of backscattered linearly polarized light from ZnO thin film was investigated experimentally. The results show that the characteristics are related to both the polarization orientation and wavelength of linearly polarized incident light. When the incident light is s-polarized, the depolarization behaviors are different for different wavelengths. When the incident light is p-polarized, the depolarization behaviors, on the contrary, are similar for different wavelengths. In addition, there is an optimal incident angle for depolarization of linearly polarized light with different wavelengths, which is equal to their effective Brewster angles, respectively.

© 2007 Chinese Optics Letters

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2007

Y. Zhao and Y. Jiang, J. Appl. Opt. (in Chinese) 28, 358 (2007).

2005

Z. He, K. Xu, and Y. Su, Acta Photon. Sin. (in Chinese) 34, 547 (2005).

2004

2003

T. A. Germer and M. J. Fasolka, Proc. SPIE 5188, 264 (2003).

2001

I. A. Vitkin and R. C. N. Studinski, Opt. Commun. 190, 37 (2001).

2000

D. Wiersma, Nature 406, 132 (2000).

1999

H. Cao, Y. G. Zhao, S. T. Ho, E. W. Seelig, Q. H. Wang, and R. P. H. Chang, Phys. Rev. Lett. 82, 2278 (1999).

1998

T. L. Yang, D. H. Zhang, J. Ma, H. L. Ma, and Y. Chen, Thin Solid Films 326, 60 (1998).

1996

M. Dogariu and T. Asakura, Opt. Commun. 131, 1 (1996).

1992

D. Bicout and C. Brosseau, J. Phys. I France 2, 2047 (1992).

1990

L. B. Wolff, IEEE Trans. Pattern Analysis and Machine Intelligence 12, 1059 (1990).

1988

M. B. van der Mark, M. P. van Albada, and A. Lagendijk, Phys. Rev. B 37, 3575 (1988).

1986

M. J. Stephen and G. Cwilich, Phys. Rev. B 34, 7564 (1986).

Acta Photon. Sin. (in Chinese)

Z. He, K. Xu, and Y. Su, Acta Photon. Sin. (in Chinese) 34, 547 (2005).

IEEE Trans. Pattern Analysis and Machine Intelligence

L. B. Wolff, IEEE Trans. Pattern Analysis and Machine Intelligence 12, 1059 (1990).

J. Appl. Opt. (in Chinese)

Y. Zhao and Y. Jiang, J. Appl. Opt. (in Chinese) 28, 358 (2007).

J. Opt. Soc. Am. A

J. Phys. I France

D. Bicout and C. Brosseau, J. Phys. I France 2, 2047 (1992).

Nature

D. Wiersma, Nature 406, 132 (2000).

Opt. Commun.

M. Dogariu and T. Asakura, Opt. Commun. 131, 1 (1996).

I. A. Vitkin and R. C. N. Studinski, Opt. Commun. 190, 37 (2001).

Phys. Rev. B

M. B. van der Mark, M. P. van Albada, and A. Lagendijk, Phys. Rev. B 37, 3575 (1988).

M. J. Stephen and G. Cwilich, Phys. Rev. B 34, 7564 (1986).

Phys. Rev. Lett.

H. Cao, Y. G. Zhao, S. T. Ho, E. W. Seelig, Q. H. Wang, and R. P. H. Chang, Phys. Rev. Lett. 82, 2278 (1999).

Proc. SPIE

T. A. Germer and M. J. Fasolka, Proc. SPIE 5188, 264 (2003).

Thin Solid Films

T. L. Yang, D. H. Zhang, J. Ma, H. L. Ma, and Y. Chen, Thin Solid Films 326, 60 (1998).

Other

P. Beckmann, A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Artech House, Norwood, 1987).

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