Abstract

The influence of organic contamination in vacuum on the laser-induced damage threshold (LIDT) of coatings is studied. TiO2/SiO2 dielectric mirrors with high reflection at 1064 nm are deposited by the electronbeam evaporation method and their LIDTs are measured in vacuum and atmosphere, respectively. It is found that the contamination in vacuum is easily attracted to optical surfaces because of the low pressure and becomes the source of damage, O2 molecules in vacuum with contamination can accelerate the laser-induced damage by observing LIDT and damage morphologies. LIDTs of mirrors have a little change in vacuum compared with in atmosphere when the organic contamination is wiped off. The results indicate that organic contamination is a significant reason to decrease the LIDT in vacuum.

© 2007 Chinese Optics Letters

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References

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  1. H. A. Abdeldayem, E. Dowdye, J. Canham, and T. Taeger, Proc. SPIE 5897, 589705 (2005).
  2. P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).
  3. W. Riede and P. Allenspacher, in Proceeding of the 5th ICSO 2004 839 (2004).
  4. C. Scurlock, Proc. SPIE 5647, 86 (2005).
  5. ISO 11254-1, Determination of Laser Induced Damage Threshold of Optical Surfaces-Part 1: 1-on-1 Test (2000).
  6. Laser-Induced Damage Threshold and Certification Procedures for Optical Materials (NASA RP-1395, 1997).

2005

H. A. Abdeldayem, E. Dowdye, J. Canham, and T. Taeger, Proc. SPIE 5897, 589705 (2005).

P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

C. Scurlock, Proc. SPIE 5647, 86 (2005).

Proc. SPIE

H. A. Abdeldayem, E. Dowdye, J. Canham, and T. Taeger, Proc. SPIE 5897, 589705 (2005).

P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

C. Scurlock, Proc. SPIE 5647, 86 (2005).

Other

ISO 11254-1, Determination of Laser Induced Damage Threshold of Optical Surfaces-Part 1: 1-on-1 Test (2000).

Laser-Induced Damage Threshold and Certification Procedures for Optical Materials (NASA RP-1395, 1997).

W. Riede and P. Allenspacher, in Proceeding of the 5th ICSO 2004 839 (2004).

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