Abstract

By using mercaptopropyltrimethoxysilane (MPTS) self-assembled monolayers (SAMs), electroless silver plating is developed for the metallization of near-field optical fiber probes. This method has the advantages of controllability, no pinholes, convenience, low cost, and smooth tip surface. The metallized probes are characterized by optical microscopy, scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDXS).

© 2007 Chinese Optics Letters

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  1. Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).
  2. G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).
  3. X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).
  4. K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).
  5. X. Liu, J. Wang, and D. Li, Chin. J. Lasers (in Chinese) 26, 793 (1999).
  6. T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).
  7. W. X. Sun and Z. X. Shen, J. Raman Spectrosc. 34, 668 (2003).
  8. L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).
  9. S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).
  10. P. Lambelet, A. Sayah, M. Pfeffer, G. Philipona, and F. Marquis-Weible, Appl. Opt. 37, 7289 (1998).
  11. R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).
  12. P. Hoffmann, B. Dutoit, and R.-P. Salathe, Ultramicroscopy 61, 165 (1995).
  13. H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).
  14. L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).
  15. L. Huang, L. Xu, H. Zhang, and N. Gu, Chem. Commun. 72 (2002).
  16. Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).
  17. L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).
  18. N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).
  19. C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

2006 (1)

S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).

2004 (3)

T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

2003 (4)

W. X. Sun and Z. X. Shen, J. Raman Spectrosc. 34, 668 (2003).

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

2002 (2)

L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).

L. Huang, L. Xu, H. Zhang, and N. Gu, Chem. Commun. 72 (2002).

2001 (2)

H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

2000 (1)

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

1999 (3)

X. Liu, J. Wang, and D. Li, Chin. J. Lasers (in Chinese) 26, 793 (1999).

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

1998 (2)

G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).

P. Lambelet, A. Sayah, M. Pfeffer, G. Philipona, and F. Marquis-Weible, Appl. Opt. 37, 7289 (1998).

1995 (1)

P. Hoffmann, B. Dutoit, and R.-P. Salathe, Ultramicroscopy 61, 165 (1995).

Aigouy, L.

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

Aiyer, H. N.

H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).

Allegrini, M.

S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).

Andreani, F. X.

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

Arena, A.

S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).

Bai, M.

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

Boccara, A. C.

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

Carminati, R.

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

Cefali, E.

S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).

Chen, X.

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).

Deckert, V.

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

Dutoit, B.

P. Hoffmann, B. Dutoit, and R.-P. Salathe, Ultramicroscopy 61, 165 (1995).

Echigo, Y.

H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).

Fokas, C.

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

Ge, C.

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

Greffet, J.-J.

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

Gu, N.

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

L. Huang, L. Xu, H. Zhang, and N. Gu, Chem. Commun. 72 (2002).

L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).

Gucciardi, P. G.

S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).

Guo, Z.

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

He, N.-Y.

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

He, Q.-G.

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

Hecht, B.

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

Hoffmann, P.

P. Hoffmann, B. Dutoit, and R.-P. Salathe, Ultramicroscopy 61, 165 (1995).

Huang, L.

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

L. Huang, L. Xu, H. Zhang, and N. Gu, Chem. Commun. 72 (2002).

L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).

Kawazoe, T.

H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).

Kiguchi, M.

T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).

Lambelet, P.

Li, C.

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

Li, C.-A.

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

Li, D.

X. Liu, J. Wang, and D. Li, Chin. J. Lasers (in Chinese) 26, 793 (1999).

Liang, B.

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

Liao, J.

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

Lim, J.

H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).

Liu, J.

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

Liu, K.

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

Liu, X.

X. Liu, J. Wang, and D. Li, Chin. J. Lasers (in Chinese) 26, 793 (1999).

Liu, Z.

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

Liu, Z.-C.

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

Liu, Z.-H.

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

Lu, Y.

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

Lu, Z.-H.

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

Marquis-Weible, F.

Matsumoto, T.

T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).

Megy, R.

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

Ming, H.

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).

Ohtsu, M.

H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).

Ou, D.

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

Patane, S.

S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).

Pfeffer, M.

Philipona, G.

Porto, J. A.

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

Rivoal, J. C.

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

Saga, H.

T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).

Salathe, R.-P.

P. Hoffmann, B. Dutoit, and R.-P. Salathe, Ultramicroscopy 61, 165 (1995).

Sayah, A.

Shen, H. Y.

L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).

Shen, Z. X.

W. X. Sun and Z. X. Shen, J. Raman Spectrosc. 34, 668 (2003).

Shimano, T.

T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).

Sick, B.

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

Stockle, R.

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

Sukeda, H.

T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).

Sun, L.

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

Sun, W. X.

W. X. Sun and Z. X. Shen, J. Raman Spectrosc. 34, 668 (2003).

Sun, Y.

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

Sun, Y.-K.

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

Tan, J.-X.

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

Tan, L.

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

Wang, C.

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

Wang, J.

X. Liu, J. Wang, and D. Li, Chin. J. Lasers (in Chinese) 26, 793 (1999).

Wang, P.

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

Wild, U. P.

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

Wu, Y.

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).

Xiao, P.-F.

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

Xie, J.

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).

Xu, L.

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

L. Huang, L. Xu, H. Zhang, and N. Gu, Chem. Commun. 72 (2002).

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

Xu, L. N.

L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).

Xu, L.-N.

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

Zenobi, R.

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

Zhang, G.

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).

Zhang, H.

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

L. Huang, L. Xu, H. Zhang, and N. Gu, Chem. Commun. 72 (2002).

Zhang, H. Q.

L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).

Zhang, J.

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

Zhang, Q.

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

Zhu, B.

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

Acta Opt. Sin. (in Chinese) (3)

G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

Appl. Opt. (1)

Appl. Phys. Lett. (2)

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

Chem. Commun. (1)

L. Huang, L. Xu, H. Zhang, and N. Gu, Chem. Commun. 72 (2002).

Chin. Chem. Lett. (1)

L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).

Chin. J. Lasers (in Chinese) (3)

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

X. Liu, J. Wang, and D. Li, Chin. J. Lasers (in Chinese) 26, 793 (1999).

J. Appl. Phys. (1)

T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).

J. Raman Spectrosc. (1)

W. X. Sun and Z. X. Shen, J. Raman Spectrosc. 34, 668 (2003).

J. Vac. Sci. Technol. B (1)

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

Mater. Chem. Phys. (1)

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

Nanotechnology (1)

H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).

Thin Solid Films (1)

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

Ultramicroscopy (2)

P. Hoffmann, B. Dutoit, and R.-P. Salathe, Ultramicroscopy 61, 165 (1995).

S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).

Cited By

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