Abstract

By using mercaptopropyltrimethoxysilane (MPTS) self-assembled monolayers (SAMs), electroless silver plating is developed for the metallization of near-field optical fiber probes. This method has the advantages of controllability, no pinholes, convenience, low cost, and smooth tip surface. The metallized probes are characterized by optical microscopy, scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDXS).

© 2007 Chinese Optics Letters

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  1. Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).
  2. G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).
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  4. K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).
  5. X. Liu, J. Wang, and D. Li, Chin. J. Lasers (in Chinese) 26, 793 (1999).
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  16. Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).
  17. L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).
  18. N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).
  19. C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

2006 (1)

S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).

2004 (3)

T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

2003 (4)

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

W. X. Sun and Z. X. Shen, J. Raman Spectrosc. 34, 668 (2003).

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

2002 (2)

L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).

L. Huang, L. Xu, H. Zhang, and N. Gu, Chem. Commun. 72 (2002).

2001 (2)

H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

2000 (1)

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

1999 (3)

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

X. Liu, J. Wang, and D. Li, Chin. J. Lasers (in Chinese) 26, 793 (1999).

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

1998 (2)

P. Lambelet, A. Sayah, M. Pfeffer, G. Philipona, and F. Marquis-Weible, Appl. Opt. 37, 7289 (1998).

G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).

1995 (1)

P. Hoffmann, B. Dutoit, and R.-P. Salathe, Ultramicroscopy 61, 165 (1995).

Acta Opt. Sin. (in Chinese) (3)

G. Zhang, H. Ming, X. Chen, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 18, 886 (1998).

X. Chen, H. Ming, G. Zhang, L. Xu, B. Zhu, M. Bai, Y. Wu, and J. Xie, Acta Opt. Sin. (in Chinese) 19, 826 (1999).

C. Li, Z. Liu, Y. Sun, L. Sun, L. Xu, and N. Gu, Acta Opt. Sin. (in Chinese) 24, 1441 (2004).

Appl. Opt. (1)

Appl. Phys. Lett. (2)

L. Aigouy, F. X. Andreani, A. C. Boccara, J. C. Rivoal, J. A. Porto, R. Carminati, J.-J. Greffet, and R. Megy, Appl. Phys. Lett. 76, 397 (2000).

R. Stockle, C. Fokas, V. Deckert, R. Zenobi, B. Sick, B. Hecht, and U. P. Wild, Appl. Phys. Lett. 75, 160 (1999).

Chem. Commun. (1)

L. Huang, L. Xu, H. Zhang, and N. Gu, Chem. Commun. 72 (2002).

Chin. Chem. Lett. (1)

L. Huang, L. N. Xu, H. Y. Shen, H. Q. Zhang, and N. Gu, Chin. Chem. Lett. 13, 163 (2002).

Chin. J. Lasers (in Chinese) (3)

Y. Lu, P. Wang, J. Zhang, H. Ming, J. Xie, and Q. Zhang, Chin. J. Lasers (in Chinese) 30, 145 (2003).

K. Liu, M. Bai, Y. Lu, L. Tan, C. Wang, and H. Ming, Chin. J. Lasers (in Chinese) 28, 253 (2001).

X. Liu, J. Wang, and D. Li, Chin. J. Lasers (in Chinese) 26, 793 (1999).

J. Appl. Phys. (1)

T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).

J. Raman Spectrosc. (1)

W. X. Sun and Z. X. Shen, J. Raman Spectrosc. 34, 668 (2003).

J. Vac. Sci. Technol. B (1)

N. Gu, C.-A. Li, L. Sun, Z.-H. Liu, Y.-K. Sun, and L.-N. Xu, J. Vac. Sci. Technol. B 22, 2283 (2004).

Mater. Chem. Phys. (1)

Z.-C. Liu, Q.-G. He, P.-F. Xiao, B. Liang, J.-X. Tan, N.-Y. He, and Z.-H. Lu, Mater. Chem. Phys. 82, 301 (2003).

Nanotechnology (1)

H. N. Aiyer, T. Kawazoe, J. Lim, Y. Echigo, and M. Ohtsu, Nanotechnology 12, 368 (2001).

Thin Solid Films (1)

L. Xu, J. Liao, L. Huang, D. Ou, Z. Guo, H. Zhang, C. Ge, N. Gu, and J. Liu, Thin Solid Films 434, 121 (2003).

Ultramicroscopy (2)

P. Hoffmann, B. Dutoit, and R.-P. Salathe, Ultramicroscopy 61, 165 (1995).

S. Patane, E. Cefali, A. Arena, P. G. Gucciardi, and M. Allegrini, Ultramicroscopy 106, 475 (2006).

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