Abstract

A hybrid algorithm based on seeded region growing and k-means clustering was proposed to improve image object segmentation result. A user friendly segmentation tool was provided for the definition of objects, then k-means algorithm was utilized to cluster the selected points into k seeds-clusters, finally the seeded region growing algorithm was used for object segmentation. Experimental results show that the proposed method is suitable for segmentation of multi-colored object, while conventional seeded region growing methods can only segment uniform-colored object.

© 2007 Chinese Optics Letters

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  1. R. Adams and L. Bischof, IEEE Trans. Pattern Anal. Machine Intell. 16, 641 (1994).
  2. S.-Y. Wan and E. H. William, IEEE Trans. Image processing 12, 1007 (2003).
  3. J. Xu and P. Shi, Chin. Opt. Lett. 1, 645 (2003).
  4. S. Sun, D. R. Haynor, and Y. Kim, IEEE Trans. Circuits Syst. for Video Technol. 13, 75 (2003).
  5. B. A. Maxwell, Lecture Notes in Computer Science 1614, 517 (1999).
  6. S. Cagnoni, A. B. Dobrzeniecki, J. C. Yanch, and R. Poli, in Proceedings of IEEE International Conference on Image Processing 3, 498 (1994).
  7. D Comaniciu and V. Ramesh, IEEE Trans. Pattern Anal. Machine Intell. 25, 564 (2003).
  8. D. A. Clausi, Pattern Recognition 35, 1959 (2002).
  9. T. Kanungo, D. M. Mount, N. S. Netanyahu, C. D. Piatko, R. Silverman, and A. Y. Wu, IEEE Trans. Pattern Anal. Machine Intell. 24, 881 (2002).
  10. C. Revol and M. Jourlin, Pattern Recognition Lett. 18, 249 (1997).
  11. Y. Feng, H. Fang, and J. Jiang, Lecture Notes in Computer Science 3687, 542 (2005).
  12. L. Zhi and Y. Jie, Electron. Lett. 40, 302 (2004).
  13. C.-H. Chung and W.-N. Lie, IEEE Trans. Image Proc. 13, 1379 (2004).
  14. F. B. Tek, A. G. Dempster, and I. Kale, Electron. Lett. 40, 1332 (2004).
  15. T. Huseyin and C. A. Huseyin, Lecture Notes in Computer Science 3216, 127 (2004).

2005 (1)

Y. Feng, H. Fang, and J. Jiang, Lecture Notes in Computer Science 3687, 542 (2005).

2004 (4)

L. Zhi and Y. Jie, Electron. Lett. 40, 302 (2004).

C.-H. Chung and W.-N. Lie, IEEE Trans. Image Proc. 13, 1379 (2004).

F. B. Tek, A. G. Dempster, and I. Kale, Electron. Lett. 40, 1332 (2004).

T. Huseyin and C. A. Huseyin, Lecture Notes in Computer Science 3216, 127 (2004).

2003 (4)

S.-Y. Wan and E. H. William, IEEE Trans. Image processing 12, 1007 (2003).

J. Xu and P. Shi, Chin. Opt. Lett. 1, 645 (2003).

S. Sun, D. R. Haynor, and Y. Kim, IEEE Trans. Circuits Syst. for Video Technol. 13, 75 (2003).

D Comaniciu and V. Ramesh, IEEE Trans. Pattern Anal. Machine Intell. 25, 564 (2003).

2002 (2)

D. A. Clausi, Pattern Recognition 35, 1959 (2002).

T. Kanungo, D. M. Mount, N. S. Netanyahu, C. D. Piatko, R. Silverman, and A. Y. Wu, IEEE Trans. Pattern Anal. Machine Intell. 24, 881 (2002).

1999 (1)

B. A. Maxwell, Lecture Notes in Computer Science 1614, 517 (1999).

1997 (1)

C. Revol and M. Jourlin, Pattern Recognition Lett. 18, 249 (1997).

1994 (1)

R. Adams and L. Bischof, IEEE Trans. Pattern Anal. Machine Intell. 16, 641 (1994).

Adams, R.

R. Adams and L. Bischof, IEEE Trans. Pattern Anal. Machine Intell. 16, 641 (1994).

Bischof, L.

R. Adams and L. Bischof, IEEE Trans. Pattern Anal. Machine Intell. 16, 641 (1994).

Chung, C.-H.

C.-H. Chung and W.-N. Lie, IEEE Trans. Image Proc. 13, 1379 (2004).

Clausi, D. A.

D. A. Clausi, Pattern Recognition 35, 1959 (2002).

Comaniciu, D

D Comaniciu and V. Ramesh, IEEE Trans. Pattern Anal. Machine Intell. 25, 564 (2003).

Dempster, A. G.

F. B. Tek, A. G. Dempster, and I. Kale, Electron. Lett. 40, 1332 (2004).

Fang, H.

Y. Feng, H. Fang, and J. Jiang, Lecture Notes in Computer Science 3687, 542 (2005).

Feng, Y.

Y. Feng, H. Fang, and J. Jiang, Lecture Notes in Computer Science 3687, 542 (2005).

Haynor, D. R.

S. Sun, D. R. Haynor, and Y. Kim, IEEE Trans. Circuits Syst. for Video Technol. 13, 75 (2003).

Huseyin, C. A.

T. Huseyin and C. A. Huseyin, Lecture Notes in Computer Science 3216, 127 (2004).

Huseyin, T.

T. Huseyin and C. A. Huseyin, Lecture Notes in Computer Science 3216, 127 (2004).

Jiang, J.

Y. Feng, H. Fang, and J. Jiang, Lecture Notes in Computer Science 3687, 542 (2005).

Jie, Y.

L. Zhi and Y. Jie, Electron. Lett. 40, 302 (2004).

Jourlin, M.

C. Revol and M. Jourlin, Pattern Recognition Lett. 18, 249 (1997).

Kale, I.

F. B. Tek, A. G. Dempster, and I. Kale, Electron. Lett. 40, 1332 (2004).

Kanungo, T.

T. Kanungo, D. M. Mount, N. S. Netanyahu, C. D. Piatko, R. Silverman, and A. Y. Wu, IEEE Trans. Pattern Anal. Machine Intell. 24, 881 (2002).

Kim, Y.

S. Sun, D. R. Haynor, and Y. Kim, IEEE Trans. Circuits Syst. for Video Technol. 13, 75 (2003).

Lie, W.-N.

C.-H. Chung and W.-N. Lie, IEEE Trans. Image Proc. 13, 1379 (2004).

Maxwell, B. A.

B. A. Maxwell, Lecture Notes in Computer Science 1614, 517 (1999).

Mount, D. M.

T. Kanungo, D. M. Mount, N. S. Netanyahu, C. D. Piatko, R. Silverman, and A. Y. Wu, IEEE Trans. Pattern Anal. Machine Intell. 24, 881 (2002).

Netanyahu, N. S.

T. Kanungo, D. M. Mount, N. S. Netanyahu, C. D. Piatko, R. Silverman, and A. Y. Wu, IEEE Trans. Pattern Anal. Machine Intell. 24, 881 (2002).

Piatko, C. D.

T. Kanungo, D. M. Mount, N. S. Netanyahu, C. D. Piatko, R. Silverman, and A. Y. Wu, IEEE Trans. Pattern Anal. Machine Intell. 24, 881 (2002).

Ramesh, V.

D Comaniciu and V. Ramesh, IEEE Trans. Pattern Anal. Machine Intell. 25, 564 (2003).

Revol, C.

C. Revol and M. Jourlin, Pattern Recognition Lett. 18, 249 (1997).

Shi, P.

Silverman, R.

T. Kanungo, D. M. Mount, N. S. Netanyahu, C. D. Piatko, R. Silverman, and A. Y. Wu, IEEE Trans. Pattern Anal. Machine Intell. 24, 881 (2002).

Sun, S.

S. Sun, D. R. Haynor, and Y. Kim, IEEE Trans. Circuits Syst. for Video Technol. 13, 75 (2003).

Tek, F. B.

F. B. Tek, A. G. Dempster, and I. Kale, Electron. Lett. 40, 1332 (2004).

Wan, S.-Y.

S.-Y. Wan and E. H. William, IEEE Trans. Image processing 12, 1007 (2003).

William, E. H.

S.-Y. Wan and E. H. William, IEEE Trans. Image processing 12, 1007 (2003).

Wu, A. Y.

T. Kanungo, D. M. Mount, N. S. Netanyahu, C. D. Piatko, R. Silverman, and A. Y. Wu, IEEE Trans. Pattern Anal. Machine Intell. 24, 881 (2002).

Xu, J.

Zhi, L.

L. Zhi and Y. Jie, Electron. Lett. 40, 302 (2004).

Chin. Opt. Lett. (1)

Electron. Lett. (2)

L. Zhi and Y. Jie, Electron. Lett. 40, 302 (2004).

F. B. Tek, A. G. Dempster, and I. Kale, Electron. Lett. 40, 1332 (2004).

IEEE Trans. Circuits Syst. for Video Technol. (1)

S. Sun, D. R. Haynor, and Y. Kim, IEEE Trans. Circuits Syst. for Video Technol. 13, 75 (2003).

IEEE Trans. Image Proc. (1)

C.-H. Chung and W.-N. Lie, IEEE Trans. Image Proc. 13, 1379 (2004).

IEEE Trans. Image processing (1)

S.-Y. Wan and E. H. William, IEEE Trans. Image processing 12, 1007 (2003).

IEEE Trans. Pattern Anal. Machine Intell. (3)

R. Adams and L. Bischof, IEEE Trans. Pattern Anal. Machine Intell. 16, 641 (1994).

D Comaniciu and V. Ramesh, IEEE Trans. Pattern Anal. Machine Intell. 25, 564 (2003).

T. Kanungo, D. M. Mount, N. S. Netanyahu, C. D. Piatko, R. Silverman, and A. Y. Wu, IEEE Trans. Pattern Anal. Machine Intell. 24, 881 (2002).

Lecture Notes in Computer Science (3)

T. Huseyin and C. A. Huseyin, Lecture Notes in Computer Science 3216, 127 (2004).

Y. Feng, H. Fang, and J. Jiang, Lecture Notes in Computer Science 3687, 542 (2005).

B. A. Maxwell, Lecture Notes in Computer Science 1614, 517 (1999).

Pattern Recognition (1)

D. A. Clausi, Pattern Recognition 35, 1959 (2002).

Pattern Recognition Lett. (1)

C. Revol and M. Jourlin, Pattern Recognition Lett. 18, 249 (1997).

Other (1)

S. Cagnoni, A. B. Dobrzeniecki, J. C. Yanch, and R. Poli, in Proceedings of IEEE International Conference on Image Processing 3, 498 (1994).

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