Abstract

A compact extended cavity diode laser (ECDL) system operating at 852 nm for small optically pumped cesium (Cs) beam frequency standards was reported. ECDL and a saturated absorption spectroscopy setup were all built in an aluminum box with dimension of 10*10*7 (cm). ECDL was based on a Littman-Metcaff configuration, whose free-running linewidth was less than 600 kHz. A digital automatic frequency lock unit (AFLU) was developed to lock the laser frequency to specify Cs absorption lines automatically and re-lock it in case of lock broken. With AFLU, the laser frequency was continuously locked for several weeks.

© 2006 Chinese Optics Letters

PDF Article

References

  • View by:
  • |
  • |
  • |

  1. D.-H. Yang and Y.-Q. Wang, Jpn. J. Appl. Phys. 33, 1674 (1994).
  2. B. Boussert, G. L. Lucas-Leclin, F. Hamouda, P. Cerez, and G. Theobald, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 46, 366 (1999).
  3. J. Chen, F. Wang, Y. Wang, and D. Yang, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 47, 457 (2000).
  4. S. Guerandel, V. Hermann, R. Barillet, P. Cerez, G. Therobald, C. Audoin, L. Chassagne, C. Sallot, and J. Delporte, in Proceedings of 2002 IEEE International Frequency Control Symposium and PDA Exhibition 480 (2002).
  5. C. Sallot, M. Baldy, D. Gin, and R. Petit, in Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum 100 (2003).
  6. V. Hermann, S. Guerandel, C. Audoin, R. Barillet, P. Cerez, and G. Theobald, in Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum 37 (2003).
  7. D. H. Yang, F. Z. Wang, and Y. Q. Wang, in Proceedings of 1996 IEEE International Frequency Control Symposium 1051 (1996).
  8. N. Dimarcq, V. Giordano, P. Cerez, and G. Theobald, IEEE Trans. Instrum. and Measure. 42, 115 (1993).
  9. K. B. MacAdam, A. Stenbach, and C. Wieman, Am. J. Phys. 60, 1098 (1992).
  10. L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).
  11. S. Lecomte, E. Fretel, G. Mileti, and P. Thomann, Appl. Opt. 39, 1426 (2000).
  12. C. J. Hawthorn, K. P. Weber, and R. E. Scholten, Rev. Sci. Instrum. 72, 4477 (2001).
  13. S. E. Park, T. Y. Kwon, E. J. Shin, and H. S. Lee, IEEE Trans. Instrum. and Measure. 52, 280 (2003).
  14. J. Lazar, O. Cip, and B. Ruzicka, Measur. Sci. Technol. 15, N6 (2004).
  15. C. Affolderbach and G. Mileti, Rev. Sci. Instrum. 76, 073108 (2005).
  16. D. Lu, K. Huang, F. Wang, and D. Yang, Chin. Opt. Lett. 1, 656 (2003).
  17. F. Allard, I. Maksimovic, M. Abgrall, and Ph. Laurent, Rev. Sci. Instrum. 75, 54 (2004).

2005 (1)

C. Affolderbach and G. Mileti, Rev. Sci. Instrum. 76, 073108 (2005).

2004 (2)

J. Lazar, O. Cip, and B. Ruzicka, Measur. Sci. Technol. 15, N6 (2004).

F. Allard, I. Maksimovic, M. Abgrall, and Ph. Laurent, Rev. Sci. Instrum. 75, 54 (2004).

2003 (2)

D. Lu, K. Huang, F. Wang, and D. Yang, Chin. Opt. Lett. 1, 656 (2003).

S. E. Park, T. Y. Kwon, E. J. Shin, and H. S. Lee, IEEE Trans. Instrum. and Measure. 52, 280 (2003).

2001 (1)

C. J. Hawthorn, K. P. Weber, and R. E. Scholten, Rev. Sci. Instrum. 72, 4477 (2001).

2000 (2)

S. Lecomte, E. Fretel, G. Mileti, and P. Thomann, Appl. Opt. 39, 1426 (2000).

J. Chen, F. Wang, Y. Wang, and D. Yang, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 47, 457 (2000).

1999 (1)

B. Boussert, G. L. Lucas-Leclin, F. Hamouda, P. Cerez, and G. Theobald, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 46, 366 (1999).

1995 (1)

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

1994 (1)

D.-H. Yang and Y.-Q. Wang, Jpn. J. Appl. Phys. 33, 1674 (1994).

1993 (1)

N. Dimarcq, V. Giordano, P. Cerez, and G. Theobald, IEEE Trans. Instrum. and Measure. 42, 115 (1993).

1992 (1)

K. B. MacAdam, A. Stenbach, and C. Wieman, Am. J. Phys. 60, 1098 (1992).

Abgrall, M.

F. Allard, I. Maksimovic, M. Abgrall, and Ph. Laurent, Rev. Sci. Instrum. 75, 54 (2004).

Affolderbach, C.

C. Affolderbach and G. Mileti, Rev. Sci. Instrum. 76, 073108 (2005).

Allard, F.

F. Allard, I. Maksimovic, M. Abgrall, and Ph. Laurent, Rev. Sci. Instrum. 75, 54 (2004).

Boussert, B.

B. Boussert, G. L. Lucas-Leclin, F. Hamouda, P. Cerez, and G. Theobald, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 46, 366 (1999).

Cerez, P.

B. Boussert, G. L. Lucas-Leclin, F. Hamouda, P. Cerez, and G. Theobald, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 46, 366 (1999).

N. Dimarcq, V. Giordano, P. Cerez, and G. Theobald, IEEE Trans. Instrum. and Measure. 42, 115 (1993).

Chen, J.

J. Chen, F. Wang, Y. Wang, and D. Yang, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 47, 457 (2000).

Cip, O.

J. Lazar, O. Cip, and B. Ruzicka, Measur. Sci. Technol. 15, N6 (2004).

Dimarcq, N.

N. Dimarcq, V. Giordano, P. Cerez, and G. Theobald, IEEE Trans. Instrum. and Measure. 42, 115 (1993).

Esslinger, T.

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

Fretel, E.

Giordano, V.

N. Dimarcq, V. Giordano, P. Cerez, and G. Theobald, IEEE Trans. Instrum. and Measure. 42, 115 (1993).

Hamouda, F.

B. Boussert, G. L. Lucas-Leclin, F. Hamouda, P. Cerez, and G. Theobald, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 46, 366 (1999).

Hansch, T. W.

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

Hawthorn, C. J.

C. J. Hawthorn, K. P. Weber, and R. E. Scholten, Rev. Sci. Instrum. 72, 4477 (2001).

Hemmerich, A.

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

Huang, K.

Konig, W.

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

Kwon, T. Y.

S. E. Park, T. Y. Kwon, E. J. Shin, and H. S. Lee, IEEE Trans. Instrum. and Measure. 52, 280 (2003).

Laurent, Ph.

F. Allard, I. Maksimovic, M. Abgrall, and Ph. Laurent, Rev. Sci. Instrum. 75, 54 (2004).

Lazar, J.

J. Lazar, O. Cip, and B. Ruzicka, Measur. Sci. Technol. 15, N6 (2004).

Lecomte, S.

Lee, H. S.

S. E. Park, T. Y. Kwon, E. J. Shin, and H. S. Lee, IEEE Trans. Instrum. and Measure. 52, 280 (2003).

Lu, D.

Lucas-Leclin, G. L.

B. Boussert, G. L. Lucas-Leclin, F. Hamouda, P. Cerez, and G. Theobald, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 46, 366 (1999).

MacAdam, K. B.

K. B. MacAdam, A. Stenbach, and C. Wieman, Am. J. Phys. 60, 1098 (1992).

Maksimovic, I.

F. Allard, I. Maksimovic, M. Abgrall, and Ph. Laurent, Rev. Sci. Instrum. 75, 54 (2004).

Mileti, G.

C. Affolderbach and G. Mileti, Rev. Sci. Instrum. 76, 073108 (2005).

S. Lecomte, E. Fretel, G. Mileti, and P. Thomann, Appl. Opt. 39, 1426 (2000).

Park, S. E.

S. E. Park, T. Y. Kwon, E. J. Shin, and H. S. Lee, IEEE Trans. Instrum. and Measure. 52, 280 (2003).

Ricci, L.

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

Ruzicka, B.

J. Lazar, O. Cip, and B. Ruzicka, Measur. Sci. Technol. 15, N6 (2004).

Scholten, R. E.

C. J. Hawthorn, K. P. Weber, and R. E. Scholten, Rev. Sci. Instrum. 72, 4477 (2001).

Shin, E. J.

S. E. Park, T. Y. Kwon, E. J. Shin, and H. S. Lee, IEEE Trans. Instrum. and Measure. 52, 280 (2003).

Stenbach, A.

K. B. MacAdam, A. Stenbach, and C. Wieman, Am. J. Phys. 60, 1098 (1992).

Theobald, G.

B. Boussert, G. L. Lucas-Leclin, F. Hamouda, P. Cerez, and G. Theobald, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 46, 366 (1999).

N. Dimarcq, V. Giordano, P. Cerez, and G. Theobald, IEEE Trans. Instrum. and Measure. 42, 115 (1993).

Thomann, P.

Vuletic, V.

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

Wang, F.

D. Lu, K. Huang, F. Wang, and D. Yang, Chin. Opt. Lett. 1, 656 (2003).

J. Chen, F. Wang, Y. Wang, and D. Yang, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 47, 457 (2000).

Wang, Y.

J. Chen, F. Wang, Y. Wang, and D. Yang, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 47, 457 (2000).

Wang, Y.-Q.

D.-H. Yang and Y.-Q. Wang, Jpn. J. Appl. Phys. 33, 1674 (1994).

Weber, K. P.

C. J. Hawthorn, K. P. Weber, and R. E. Scholten, Rev. Sci. Instrum. 72, 4477 (2001).

Weidemuller, M.

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

Wieman, C.

K. B. MacAdam, A. Stenbach, and C. Wieman, Am. J. Phys. 60, 1098 (1992).

Yang, D.

D. Lu, K. Huang, F. Wang, and D. Yang, Chin. Opt. Lett. 1, 656 (2003).

J. Chen, F. Wang, Y. Wang, and D. Yang, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 47, 457 (2000).

Yang, D.-H.

D.-H. Yang and Y.-Q. Wang, Jpn. J. Appl. Phys. 33, 1674 (1994).

Zimmermann, C.

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

Am. J. Phys. (1)

K. B. MacAdam, A. Stenbach, and C. Wieman, Am. J. Phys. 60, 1098 (1992).

Appl. Opt. (1)

Chin. Opt. Lett. (1)

IEEE Trans. Instrum. and Measure. (2)

S. E. Park, T. Y. Kwon, E. J. Shin, and H. S. Lee, IEEE Trans. Instrum. and Measure. 52, 280 (2003).

N. Dimarcq, V. Giordano, P. Cerez, and G. Theobald, IEEE Trans. Instrum. and Measure. 42, 115 (1993).

IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control (2)

B. Boussert, G. L. Lucas-Leclin, F. Hamouda, P. Cerez, and G. Theobald, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 46, 366 (1999).

J. Chen, F. Wang, Y. Wang, and D. Yang, IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 47, 457 (2000).

Jpn. J. Appl. Phys. (1)

D.-H. Yang and Y.-Q. Wang, Jpn. J. Appl. Phys. 33, 1674 (1994).

Measur. Sci. Technol. (1)

J. Lazar, O. Cip, and B. Ruzicka, Measur. Sci. Technol. 15, N6 (2004).

Opt. Commun. (1)

L. Ricci, M. Weidemuller, T. Esslinger, A. Hemmerich, C. Zimmermann, V. Vuletic, W. Konig, and T. W. Hansch, Opt. Commun. 117, 541 (1995).

Rev. Sci. Instrum. (3)

C. Affolderbach and G. Mileti, Rev. Sci. Instrum. 76, 073108 (2005).

C. J. Hawthorn, K. P. Weber, and R. E. Scholten, Rev. Sci. Instrum. 72, 4477 (2001).

F. Allard, I. Maksimovic, M. Abgrall, and Ph. Laurent, Rev. Sci. Instrum. 75, 54 (2004).

Other (4)

S. Guerandel, V. Hermann, R. Barillet, P. Cerez, G. Therobald, C. Audoin, L. Chassagne, C. Sallot, and J. Delporte, in Proceedings of 2002 IEEE International Frequency Control Symposium and PDA Exhibition 480 (2002).

C. Sallot, M. Baldy, D. Gin, and R. Petit, in Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum 100 (2003).

V. Hermann, S. Guerandel, C. Audoin, R. Barillet, P. Cerez, and G. Theobald, in Proceedings of 2003 IEEE International Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum 37 (2003).

D. H. Yang, F. Z. Wang, and Y. Q. Wang, in Proceedings of 1996 IEEE International Frequency Control Symposium 1051 (1996).

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.