Abstract

A series of thin Ag films with different thicknesses grown under identical conditions are analyzed by means of spectrophotometer. From these measurements the values of refractive index and extinction coefficient are calculated. The films are deposited onto BK7 glass substrates by direct current (DC) magnetron sputtering. It is found that the optical properties of the Ag films can be affected by films thickness. Below critical thickness of 17 nm, which is the thickness at which Ag films form continuous films, the optical properties and constants vary significantly with thickness increasing and then tend to a stable value up to about 40 nm. At the same time, X-ray diffraction measurement is carried out to examine the microstructure evolution of Ag films as a function of films thickness. The relation between optical properties and microstructure is discussed.

© 2006 Chinese Optics Letters

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2005 (2)

Z. Wang, Q. Chen, and X. Cai, Appl. Surf. Sci. 239, 262 (2005).

P. Fan, J.-D. Shao, K. Yi, H.-J. Qi, and Z.-X. Fan, Chin. J. Lasers (in Chinese) 32, 977 (2005).

2004 (1)

S. M. A. Durrani, E. E. Khawaja, A. M. Al-Shukri, and M. F. Al-Kuhaili, Energy and Buildings 36, 891 (2004).

2003 (2)

E. Bertran, C. Corbella, M. Vives, A. Pinyol, C. Person, and I. Porgueras, Solid State Ionics 165, 139 (2003).

C. Charton and M. Fahland, Surf. Coat. Technol. 174-175, 181 (2003).

2001 (2)

A. Rizzo, M. A. Tagliente, M. Alvisi, and S. Scaglione, Thin Solid Films 396, 29 (2001).

C. Charton and M. Fahland, Surf. Coat. Technol. 142-144, 175 (2001).

2000 (1)

G. Leftheriotis, S. Papaefthimiou, and P. Yianoulis, Solid State Ionics 136-137, 655 (2000).

1997 (1)

Y. Zeng, Y. L. Zou, and T. L. Alford, J. Appl. Phys. 81, 7773 (1997).

1995 (1)

1992 (1)

M. H. Lee, P. J. Dobson, and B. Cantor, Thin Solid Films 219, 199 (1992).

1990 (1)

1989 (1)

1985 (1)

1980 (1)

D. E. Aspnes, E. Kinsbron, and D. D. Bacon, Phys. Rev. B 21, 3290 (1980).

1972 (1)

P. B. Johnson and R. W. Christy, Phys. Rev. B 6, 4370 (1972).

Alford, T. L.

Y. Zeng, Y. L. Zou, and T. L. Alford, J. Appl. Phys. 81, 7773 (1997).

Al-Kuhaili, M. F.

S. M. A. Durrani, E. E. Khawaja, A. M. Al-Shukri, and M. F. Al-Kuhaili, Energy and Buildings 36, 891 (2004).

Al-Shukri, A. M.

S. M. A. Durrani, E. E. Khawaja, A. M. Al-Shukri, and M. F. Al-Kuhaili, Energy and Buildings 36, 891 (2004).

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A. Rizzo, M. A. Tagliente, M. Alvisi, and S. Scaglione, Thin Solid Films 396, 29 (2001).

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D. E. Aspnes, E. Kinsbron, and D. D. Bacon, Phys. Rev. B 21, 3290 (1980).

Aussenegg, F. R.

Bacon, D. D.

D. E. Aspnes, E. Kinsbron, and D. D. Bacon, Phys. Rev. B 21, 3290 (1980).

Bennett, J. M.

Bertran, E.

E. Bertran, C. Corbella, M. Vives, A. Pinyol, C. Person, and I. Porgueras, Solid State Ionics 165, 139 (2003).

Cai, X.

Z. Wang, Q. Chen, and X. Cai, Appl. Surf. Sci. 239, 262 (2005).

Cantor, B.

M. H. Lee, P. J. Dobson, and B. Cantor, Thin Solid Films 219, 199 (1992).

Charton, C.

C. Charton and M. Fahland, Surf. Coat. Technol. 174-175, 181 (2003).

C. Charton and M. Fahland, Surf. Coat. Technol. 142-144, 175 (2001).

Chen, Q.

Z. Wang, Q. Chen, and X. Cai, Appl. Surf. Sci. 239, 262 (2005).

Christy, R. W.

P. B. Johnson and R. W. Christy, Phys. Rev. B 6, 4370 (1972).

Corbella, C.

E. Bertran, C. Corbella, M. Vives, A. Pinyol, C. Person, and I. Porgueras, Solid State Ionics 165, 139 (2003).

Dobson, P. J.

M. H. Lee, P. J. Dobson, and B. Cantor, Thin Solid Films 219, 199 (1992).

Durrani, S. M. A.

S. M. A. Durrani, E. E. Khawaja, A. M. Al-Shukri, and M. F. Al-Kuhaili, Energy and Buildings 36, 891 (2004).

Fahland, M.

C. Charton and M. Fahland, Surf. Coat. Technol. 174-175, 181 (2003).

C. Charton and M. Fahland, Surf. Coat. Technol. 142-144, 175 (2001).

Fan, P.

P. Fan, J.-D. Shao, K. Yi, H.-J. Qi, and Z.-X. Fan, Chin. J. Lasers (in Chinese) 32, 977 (2005).

Fan, Z.-X.

P. Fan, J.-D. Shao, K. Yi, H.-J. Qi, and Z.-X. Fan, Chin. J. Lasers (in Chinese) 32, 977 (2005).

Hurt, H. H.

Johnson, P. B.

P. B. Johnson and R. W. Christy, Phys. Rev. B 6, 4370 (1972).

Khawaja, E. E.

S. M. A. Durrani, E. E. Khawaja, A. M. Al-Shukri, and M. F. Al-Kuhaili, Energy and Buildings 36, 891 (2004).

Kinsbron, E.

D. E. Aspnes, E. Kinsbron, and D. D. Bacon, Phys. Rev. B 21, 3290 (1980).

Lee, M. H.

M. H. Lee, P. J. Dobson, and B. Cantor, Thin Solid Films 219, 199 (1992).

Leftheriotis, G.

G. Leftheriotis, S. Papaefthimiou, and P. Yianoulis, Solid State Ionics 136-137, 655 (2000).

Leitner, A.

Mayani, N.

Papaefthimiou, S.

G. Leftheriotis, S. Papaefthimiou, and P. Yianoulis, Solid State Ionics 136-137, 655 (2000).

Person, C.

E. Bertran, C. Corbella, M. Vives, A. Pinyol, C. Person, and I. Porgueras, Solid State Ionics 165, 139 (2003).

Pinyol, A.

E. Bertran, C. Corbella, M. Vives, A. Pinyol, C. Person, and I. Porgueras, Solid State Ionics 165, 139 (2003).

Porgueras, I.

E. Bertran, C. Corbella, M. Vives, A. Pinyol, C. Person, and I. Porgueras, Solid State Ionics 165, 139 (2003).

Qi, H.-J.

P. Fan, J.-D. Shao, K. Yi, H.-J. Qi, and Z.-X. Fan, Chin. J. Lasers (in Chinese) 32, 977 (2005).

Rasigni, G.

Rizzo, A.

A. Rizzo, M. A. Tagliente, M. Alvisi, and S. Scaglione, Thin Solid Films 396, 29 (2001).

Scaglione, S.

A. Rizzo, M. A. Tagliente, M. Alvisi, and S. Scaglione, Thin Solid Films 396, 29 (2001).

Shao, J.-D.

P. Fan, J.-D. Shao, K. Yi, H.-J. Qi, and Z.-X. Fan, Chin. J. Lasers (in Chinese) 32, 977 (2005).

Singer, R. R.

Tagliente, M. A.

A. Rizzo, M. A. Tagliente, M. Alvisi, and S. Scaglione, Thin Solid Films 396, 29 (2001).

Tang, J.-F.

Varnier, F.

Vives, M.

E. Bertran, C. Corbella, M. Vives, A. Pinyol, C. Person, and I. Porgueras, Solid State Ionics 165, 139 (2003).

Wang, Z.

Z. Wang, Q. Chen, and X. Cai, Appl. Surf. Sci. 239, 262 (2005).

Xu, J.-J.

Yi, K.

P. Fan, J.-D. Shao, K. Yi, H.-J. Qi, and Z.-X. Fan, Chin. J. Lasers (in Chinese) 32, 977 (2005).

Yianoulis, P.

G. Leftheriotis, S. Papaefthimiou, and P. Yianoulis, Solid State Ionics 136-137, 655 (2000).

Zeng, Y.

Y. Zeng, Y. L. Zou, and T. L. Alford, J. Appl. Phys. 81, 7773 (1997).

Zou, Y. L.

Y. Zeng, Y. L. Zou, and T. L. Alford, J. Appl. Phys. 81, 7773 (1997).

Appl. Opt. (2)

Appl. Surf. Sci. (1)

Z. Wang, Q. Chen, and X. Cai, Appl. Surf. Sci. 239, 262 (2005).

Chin. J. Lasers (in Chinese) (1)

P. Fan, J.-D. Shao, K. Yi, H.-J. Qi, and Z.-X. Fan, Chin. J. Lasers (in Chinese) 32, 977 (2005).

Energy and Buildings (1)

S. M. A. Durrani, E. E. Khawaja, A. M. Al-Shukri, and M. F. Al-Kuhaili, Energy and Buildings 36, 891 (2004).

J. Appl. Phys. (1)

Y. Zeng, Y. L. Zou, and T. L. Alford, J. Appl. Phys. 81, 7773 (1997).

J. Opt. Soc. Am. A (1)

J. Opt. Soc. Am. B (1)

Phys. Rev. B (2)

D. E. Aspnes, E. Kinsbron, and D. D. Bacon, Phys. Rev. B 21, 3290 (1980).

P. B. Johnson and R. W. Christy, Phys. Rev. B 6, 4370 (1972).

Solid State Ionics (2)

G. Leftheriotis, S. Papaefthimiou, and P. Yianoulis, Solid State Ionics 136-137, 655 (2000).

E. Bertran, C. Corbella, M. Vives, A. Pinyol, C. Person, and I. Porgueras, Solid State Ionics 165, 139 (2003).

Surf. Coat. Technol. (2)

C. Charton and M. Fahland, Surf. Coat. Technol. 142-144, 175 (2001).

C. Charton and M. Fahland, Surf. Coat. Technol. 174-175, 181 (2003).

Thin Solid Films (2)

A. Rizzo, M. A. Tagliente, M. Alvisi, and S. Scaglione, Thin Solid Films 396, 29 (2001).

M. H. Lee, P. J. Dobson, and B. Cantor, Thin Solid Films 219, 199 (1992).

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