Abstract

A scanning Hartmann test method is proposed and its measurement principle is described. The scanning Hartmann test setup is formed by modifying the Hartmann screen of the conventional Hartmann test setup. With the rotation of the scanning Hartmann screen and the improved hole arrangement, the whole information of the lens to be tested in the full aperture can be obtained. The measurement accuracy of the aberration is improved and the local error of the lens can be got. In the method, no change of the Hartmann screen is needed for measuring the lenses of different aperture sizes. Experimental results of aberration measurements of two lenses are given to verify the usefulness of the setup.

© 2006 Chinese Optics Letters

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  1. L. Seifert, J. Liesener, and H. J. Tiziani, Opt. Commun. 216, 313 (2003).
  2. M. Rocktaschel and H. J. Tiziani, Opt. and Laser Technol. 34, 631 (2002).
  3. J.-M. Asfour and A. G. Poleshchuk, J. Opt. Soc. Am. A 23, 172 (2006).
  4. Z. Yang, Optical Measurement (in Chinese) (Beijing Institute of Technology Press, Beijing, 1995) p.187.
  5. D. Xu, Instruments Today (in Chinese) 22, (8) 30 (2000).
  6. D. Malacara, (ed.) Optical Shop Testing (John Wiley and Sons, New York, 1992) p.367.
  7. Y. Peng, X. Hu, W. Zhou, H. Yi, X. Tian, and W. Zhang, Chin. J. Lasers (in Chinese) 33, (Suppl.) 342 (2006).
  8. Y. Hu and L. An, Applied Optics (in Chinese) (University of Science and Technology of China Press, Hefei, 1996) p.147.
  9. Z. Wang and Z. Bao, Optical Measurement (in Chinese) (Zhejiang University Press, Hangzhou, 1989) p.102.

2006

J.-M. Asfour and A. G. Poleshchuk, J. Opt. Soc. Am. A 23, 172 (2006).

Y. Peng, X. Hu, W. Zhou, H. Yi, X. Tian, and W. Zhang, Chin. J. Lasers (in Chinese) 33, (Suppl.) 342 (2006).

2003

L. Seifert, J. Liesener, and H. J. Tiziani, Opt. Commun. 216, 313 (2003).

2002

M. Rocktaschel and H. J. Tiziani, Opt. and Laser Technol. 34, 631 (2002).

2000

D. Xu, Instruments Today (in Chinese) 22, (8) 30 (2000).

Asfour, J.-M.

Hu, X.

Y. Peng, X. Hu, W. Zhou, H. Yi, X. Tian, and W. Zhang, Chin. J. Lasers (in Chinese) 33, (Suppl.) 342 (2006).

Liesener, J.

L. Seifert, J. Liesener, and H. J. Tiziani, Opt. Commun. 216, 313 (2003).

Peng, Y.

Y. Peng, X. Hu, W. Zhou, H. Yi, X. Tian, and W. Zhang, Chin. J. Lasers (in Chinese) 33, (Suppl.) 342 (2006).

Poleshchuk, A. G.

Rocktaschel, M.

M. Rocktaschel and H. J. Tiziani, Opt. and Laser Technol. 34, 631 (2002).

Seifert, L.

L. Seifert, J. Liesener, and H. J. Tiziani, Opt. Commun. 216, 313 (2003).

Tian, X.

Y. Peng, X. Hu, W. Zhou, H. Yi, X. Tian, and W. Zhang, Chin. J. Lasers (in Chinese) 33, (Suppl.) 342 (2006).

Tiziani, H. J.

L. Seifert, J. Liesener, and H. J. Tiziani, Opt. Commun. 216, 313 (2003).

M. Rocktaschel and H. J. Tiziani, Opt. and Laser Technol. 34, 631 (2002).

Xu, D.

D. Xu, Instruments Today (in Chinese) 22, (8) 30 (2000).

Yi, H.

Y. Peng, X. Hu, W. Zhou, H. Yi, X. Tian, and W. Zhang, Chin. J. Lasers (in Chinese) 33, (Suppl.) 342 (2006).

Zhang, W.

Y. Peng, X. Hu, W. Zhou, H. Yi, X. Tian, and W. Zhang, Chin. J. Lasers (in Chinese) 33, (Suppl.) 342 (2006).

Zhou, W.

Y. Peng, X. Hu, W. Zhou, H. Yi, X. Tian, and W. Zhang, Chin. J. Lasers (in Chinese) 33, (Suppl.) 342 (2006).

Chin. J. Lasers (in Chinese)

Y. Peng, X. Hu, W. Zhou, H. Yi, X. Tian, and W. Zhang, Chin. J. Lasers (in Chinese) 33, (Suppl.) 342 (2006).

Instruments Today (in Chinese)

D. Xu, Instruments Today (in Chinese) 22, (8) 30 (2000).

J. Opt. Soc. Am. A

Opt. and Laser Technol.

M. Rocktaschel and H. J. Tiziani, Opt. and Laser Technol. 34, 631 (2002).

Opt. Commun.

L. Seifert, J. Liesener, and H. J. Tiziani, Opt. Commun. 216, 313 (2003).

Other

Z. Yang, Optical Measurement (in Chinese) (Beijing Institute of Technology Press, Beijing, 1995) p.187.

D. Malacara, (ed.) Optical Shop Testing (John Wiley and Sons, New York, 1992) p.367.

Y. Hu and L. An, Applied Optics (in Chinese) (University of Science and Technology of China Press, Hefei, 1996) p.147.

Z. Wang and Z. Bao, Optical Measurement (in Chinese) (Zhejiang University Press, Hangzhou, 1989) p.102.

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