Abstract

The B4C/Mo/Si high reflectivity multilayer mirror was designed for He-II radiation (30.4 nm) using the layer-by-layer method. The theoretical peak reflectivity was up to 38.2% at the incident angle of 5 degrees. The B4C/Mo/Si multilayer was fabricated by direct current magnetron sputtering and measured at the National Synchrotron Radiation Laboratory (NSRL) of China. The experimental reflectivity of the B4C/Mo/Si multilayer at 30.4 nm was about 32.5%. The promising performances of the B4C/Mo/Si multilayer mirror could be used for the construction of solar physics instrumentation.

© 2006 Chinese Optics Letters

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  1. M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).
  2. J. Gautier, F. Delmotte, M. Roulliay, F. Bridou, M.-F. Ravet, and A. Jeome, Appl. Opt. 44, 384 (2005).
  3. D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).
  4. M. Grigonis and E. J. Knystautas, Appl. Opt. 36, 2839 (1997).
  5. P. Boher, L. Hennet, and Ph. Houdy, Proc. SPIE 1345, 198 (1990).
  6. J. I. Larruquert, J. Opt. Soc. Am. A 18, 1406 (2001).
  7. J. I. Larruquert, J. Opt. Soc. Am. A 19, 385 (2002).
  8. J. I. Larruquert, J. Opt. Soc. Am. A 19, 391 (2002).
  9. http://www.cxro.lbl.gov/.
  10. Z. Zhang, Z. Wang, F. Wang, W. Wu, H. Wang, S. Qin, and L. Chen, Chin. Opt. Lett. 3, 422 (2005).
  11. F. Wang, Z. Wang, S. Qin, W. Wu, Z. Zhang, H. Wang, and L. Chen, Chin. Opt. Lett. 3, 425 (2005).
  12. H. Wang, Z. Wang, S. Qin, F. Li, L. Chen, J. Zhu, and M. Cui, Acta Opt. Sin. (in Chinese) 23, 1362 (2003).

2005 (3)

2004 (2)

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

2003 (1)

H. Wang, Z. Wang, S. Qin, F. Li, L. Chen, J. Zhu, and M. Cui, Acta Opt. Sin. (in Chinese) 23, 1362 (2003).

2002 (2)

2001 (1)

1997 (1)

1990 (1)

P. Boher, L. Hennet, and Ph. Houdy, Proc. SPIE 1345, 198 (1990).

Boher, P.

P. Boher, L. Hennet, and Ph. Houdy, Proc. SPIE 1345, 198 (1990).

Bougnet, M.

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

Bouyries, P.

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

Bridou, F.

J. Gautier, F. Delmotte, M. Roulliay, F. Bridou, M.-F. Ravet, and A. Jeome, Appl. Opt. 44, 384 (2005).

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

Chen, L.

Cui, M.

H. Wang, Z. Wang, S. Qin, F. Li, L. Chen, J. Zhu, and M. Cui, Acta Opt. Sin. (in Chinese) 23, 1362 (2003).

Delaboudiniere, J. P.

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

Delmotte, F.

J. Gautier, F. Delmotte, M. Roulliay, F. Bridou, M.-F. Ravet, and A. Jeome, Appl. Opt. 44, 384 (2005).

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

DeLuca, E.

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

Donguy, S.

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

Gautier, J.

Golub, L.

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

Grigonis, M.

Gullikson, E. M.

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

Hennet, L.

P. Boher, L. Hennet, and Ph. Houdy, Proc. SPIE 1345, 198 (1990).

Houdy, Ph.

P. Boher, L. Hennet, and Ph. Houdy, Proc. SPIE 1345, 198 (1990).

Jeome, A.

Jerome, A.

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

Kjornrattanawanich, B.

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

Knystautas, E. J.

Larruquert, J. I.

Li, F.

H. Wang, Z. Wang, S. Qin, F. Li, L. Chen, J. Zhu, and M. Cui, Acta Opt. Sin. (in Chinese) 23, 1362 (2003).

Mercier, R.

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

Qin, S.

Ravet, M. F.

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

Ravet, M.-F.

Roulliay, M.

Seely, J.

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

Walton, C. C.

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

Wang, F.

Wang, H.

Wang, Z.

Windt, D. L.

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

Wu, W.

Zhang, Z.

Zhang-Song, X.

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

Zhu, J.

H. Wang, Z. Wang, S. Qin, F. Li, L. Chen, J. Zhu, and M. Cui, Acta Opt. Sin. (in Chinese) 23, 1362 (2003).

Acta Opt. Sin. (in Chinese) (1)

H. Wang, Z. Wang, S. Qin, F. Li, L. Chen, J. Zhu, and M. Cui, Acta Opt. Sin. (in Chinese) 23, 1362 (2003).

Appl. Opt. (2)

Chin. Opt. Lett. (2)

J. Opt. Soc. Am. A (3)

Proc. SPIE (3)

P. Boher, L. Hennet, and Ph. Houdy, Proc. SPIE 1345, 198 (1990).

D. L. Windt, S. Donguy, J. Seely, B. Kjornrattanawanich, E. M. Gullikson, C. C. Walton, L. Golub, and E. DeLuca, Proc. SPIE 5168, 1 (2004).

M. F. Ravet, F. Bridou, X. Zhang-Song, A. Jerome, F. Delmotte, R. Mercier, M. Bougnet, P. Bouyries, and J. P. Delaboudiniere, Proc. SPIE 5250, 99 (2004).

Other (1)

http://www.cxro.lbl.gov/.

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