Abstract

The Langmuir-Blodgett (LB) films of hemicyanine dyes were prepared by LB technique. The films showed pyroelectric effect. The pyroelectric coefficient measured by the method of integrated charges was 12 'mu'C/(m2K) at room temperature, and the relationship between the orientation of DAEP dye in the films and temperature was studied by polarized Fourier transform infrared spectroscopy (FTIR) spectroscopy and second harmonic generation (SHG). It was indicated that the observed pyroelectricity can be ascribed preliminarily to the structure modification of the polar head groups and the deterioration of the film framework (the first-order phase transition) resulted in the change of spontaneous polarization with temperature.

© 2005 Chinese Optics Letters

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  1. G. Roberts, Langmuir-Blodgett Films (Plenum Press, New York, 1990).
  2. T. Kamata, J. Umemura, T. Takenaka, and N. Koizumi, J. Phys. Chem. 95, 4092 (1991).
  3. G. G. Roberts and B. Holcroft, Thin Solid Films 180, 211 (1989).
  4. R. Capan, T. H. Richardson, and D. Lacey, Thin Solid Films 468, 262 (2004).
  5. S. Ma, M. Yan, S. Li, X. Lu, G. Wang, J. Chu, and W. Wang, Acta Phys. Sin. (in Chinese) 52, 197 (2003).
  6. R. Capan, T. H. Richardson, and D. Lacey, Thin Solid Films 415, 236 (2002).
  7. Q. Zhang and R. W. Whatmore, J. Phys. D: Appl. Phys. 34, 2296 (2001).
  8. I. R. Girling, N. A. Cade, P. V. Kolinsky, J. D. Earls, G. H. Cross, and I. R. Peterson, Thin Solid Films 132, 101 (1985).
  9. S. Ma, X. Lu, J. Zheng, W. Wang, and Z. Zhang, Thin Solid Films 254, 263 (1995).
  10. S. Ma, X. Lu, J. Xu, W. Wang, and Z. Zhang, J. Phys. D: Appl. Phys. 30, 2651 (1997).
  11. A. M. Glass, J. Appl. Phys. 40, 4699 (1969).
  12. S. Ma, M. Yan, X. Lu, W. Wang, Z. Chen, P. Liu, C. Qu, S. Lin, and A. Ding, Appl. Phys. Lett. 74, 2065 (1999).
  13. T. Richardson, S. Holder, and D. Lacey, J. Mater. Chem. 2, 1155 (1992).
  14. R. Colbrook and G. G. Roberts, Thin Solid Films 179, 335 (1989).
  15. M. Vandevyver, A. Barraud, R. Teixier, P. Maillard, and C. Gianotti, J. Colloid and Interface Science 85, 571 (1982).
  16. M. Yoneyama, M. Sugi, M. Saito, K. Lkegami, S. I. Kurada, and S. Iizima, Jpn. J. Appl. Phys. 25, 961 (1986).
  17. W. H. A. Majid, T. H. Richardson, D. Lacey, and A. Topacli, Thin Solid Films 376, 225 (2000).
  18. L. M. Blinov, N. V. Dubinin, L. V. Mikhnev, and S. G. Yudin, Thin Solid Films 120, 161 (1984).

2004 (1)

R. Capan, T. H. Richardson, and D. Lacey, Thin Solid Films 468, 262 (2004).

2003 (1)

S. Ma, M. Yan, S. Li, X. Lu, G. Wang, J. Chu, and W. Wang, Acta Phys. Sin. (in Chinese) 52, 197 (2003).

2002 (1)

R. Capan, T. H. Richardson, and D. Lacey, Thin Solid Films 415, 236 (2002).

2001 (1)

Q. Zhang and R. W. Whatmore, J. Phys. D: Appl. Phys. 34, 2296 (2001).

2000 (1)

W. H. A. Majid, T. H. Richardson, D. Lacey, and A. Topacli, Thin Solid Films 376, 225 (2000).

1999 (1)

S. Ma, M. Yan, X. Lu, W. Wang, Z. Chen, P. Liu, C. Qu, S. Lin, and A. Ding, Appl. Phys. Lett. 74, 2065 (1999).

1997 (1)

S. Ma, X. Lu, J. Xu, W. Wang, and Z. Zhang, J. Phys. D: Appl. Phys. 30, 2651 (1997).

1995 (1)

S. Ma, X. Lu, J. Zheng, W. Wang, and Z. Zhang, Thin Solid Films 254, 263 (1995).

1992 (1)

T. Richardson, S. Holder, and D. Lacey, J. Mater. Chem. 2, 1155 (1992).

1991 (1)

T. Kamata, J. Umemura, T. Takenaka, and N. Koizumi, J. Phys. Chem. 95, 4092 (1991).

1989 (2)

G. G. Roberts and B. Holcroft, Thin Solid Films 180, 211 (1989).

R. Colbrook and G. G. Roberts, Thin Solid Films 179, 335 (1989).

1986 (1)

M. Yoneyama, M. Sugi, M. Saito, K. Lkegami, S. I. Kurada, and S. Iizima, Jpn. J. Appl. Phys. 25, 961 (1986).

1985 (1)

I. R. Girling, N. A. Cade, P. V. Kolinsky, J. D. Earls, G. H. Cross, and I. R. Peterson, Thin Solid Films 132, 101 (1985).

1984 (1)

L. M. Blinov, N. V. Dubinin, L. V. Mikhnev, and S. G. Yudin, Thin Solid Films 120, 161 (1984).

1982 (1)

M. Vandevyver, A. Barraud, R. Teixier, P. Maillard, and C. Gianotti, J. Colloid and Interface Science 85, 571 (1982).

1969 (1)

A. M. Glass, J. Appl. Phys. 40, 4699 (1969).

Acta Phys. Sin. (in Chinese) (1)

S. Ma, M. Yan, S. Li, X. Lu, G. Wang, J. Chu, and W. Wang, Acta Phys. Sin. (in Chinese) 52, 197 (2003).

Appl. Phys. Lett. (1)

S. Ma, M. Yan, X. Lu, W. Wang, Z. Chen, P. Liu, C. Qu, S. Lin, and A. Ding, Appl. Phys. Lett. 74, 2065 (1999).

J. Appl. Phys. (1)

A. M. Glass, J. Appl. Phys. 40, 4699 (1969).

J. Colloid and Interface Science (1)

M. Vandevyver, A. Barraud, R. Teixier, P. Maillard, and C. Gianotti, J. Colloid and Interface Science 85, 571 (1982).

J. Mater. Chem. (1)

T. Richardson, S. Holder, and D. Lacey, J. Mater. Chem. 2, 1155 (1992).

J. Phys. Chem. (1)

T. Kamata, J. Umemura, T. Takenaka, and N. Koizumi, J. Phys. Chem. 95, 4092 (1991).

J. Phys. D: Appl. Phys. (2)

Q. Zhang and R. W. Whatmore, J. Phys. D: Appl. Phys. 34, 2296 (2001).

S. Ma, X. Lu, J. Xu, W. Wang, and Z. Zhang, J. Phys. D: Appl. Phys. 30, 2651 (1997).

Jpn. J. Appl. Phys. (1)

M. Yoneyama, M. Sugi, M. Saito, K. Lkegami, S. I. Kurada, and S. Iizima, Jpn. J. Appl. Phys. 25, 961 (1986).

Thin Solid Films (8)

W. H. A. Majid, T. H. Richardson, D. Lacey, and A. Topacli, Thin Solid Films 376, 225 (2000).

L. M. Blinov, N. V. Dubinin, L. V. Mikhnev, and S. G. Yudin, Thin Solid Films 120, 161 (1984).

R. Colbrook and G. G. Roberts, Thin Solid Films 179, 335 (1989).

I. R. Girling, N. A. Cade, P. V. Kolinsky, J. D. Earls, G. H. Cross, and I. R. Peterson, Thin Solid Films 132, 101 (1985).

S. Ma, X. Lu, J. Zheng, W. Wang, and Z. Zhang, Thin Solid Films 254, 263 (1995).

G. G. Roberts and B. Holcroft, Thin Solid Films 180, 211 (1989).

R. Capan, T. H. Richardson, and D. Lacey, Thin Solid Films 468, 262 (2004).

R. Capan, T. H. Richardson, and D. Lacey, Thin Solid Films 415, 236 (2002).

Other (1)

G. Roberts, Langmuir-Blodgett Films (Plenum Press, New York, 1990).

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