Abstract

An intelligent method for improving position linearity of position-sensitive detector (PSD), based on support vector machines (SVMs), is developed. The SVM is established based on the structural risk minimization principle rather than minimizing the empirical error commonly implemented in neural networks. SVM can achieve higher generalization performance. Training SVM is equivalent to solving a linearly constrained quadratic programming problem, thus the solution of SVM is always unique and globally optimal. The improving position linearity procedure has been illustrated using a two-dimensional (2D) PSD. It is pointed out that the position linearity of the measuring system with a proper SVM correction is improved by two orders of magnitude in the measurement range.

© 2005 Chinese Optics Letters

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  1. J. Henry and J. Livingstone, IEEE Sensors Journal 3, 519 (2003).
  2. B. Lin, M. Huang, X. Shun, and X. Cao, Proc. SPIE 4919, 512 (2002).
  3. P. Schaefer, R. D. Williams, G. K. Davis, and R. A. Ross, IEEE Trans. Instru. Meas. 47, 914 (1998).
  4. X. Wang and M. Ye, Proc. SPIE 4919, 452 (2002).
  5. X. Wang and M. Ye, Optical Technique (in Chinese) 28, 174 (2002).
  6. C. T. Mo, C. Z. Chen, L. L. Zhang, and F. J. Sun, Chin. J. Lasers (in Chinese) 31, 427 (2004).
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  9. K. Duan, S. S Keerthi, and A. N. Poo, Neurocomputing 51, 41 (2003).

2004

C. T. Mo, C. Z. Chen, L. L. Zhang, and F. J. Sun, Chin. J. Lasers (in Chinese) 31, 427 (2004).

2003

K. Duan, S. S Keerthi, and A. N. Poo, Neurocomputing 51, 41 (2003).

J. Henry and J. Livingstone, IEEE Sensors Journal 3, 519 (2003).

2002

B. Lin, M. Huang, X. Shun, and X. Cao, Proc. SPIE 4919, 512 (2002).

X. Wang and M. Ye, Proc. SPIE 4919, 452 (2002).

X. Wang and M. Ye, Optical Technique (in Chinese) 28, 174 (2002).

1999

R. Dietrich, M. Opper, and H. Sompolinsky, Phys. Rev. Lett. 82, 2975 (1999).

1998

P. Schaefer, R. D. Williams, G. K. Davis, and R. A. Ross, IEEE Trans. Instru. Meas. 47, 914 (1998).

Cao, X.

B. Lin, M. Huang, X. Shun, and X. Cao, Proc. SPIE 4919, 512 (2002).

Chen, C. Z.

C. T. Mo, C. Z. Chen, L. L. Zhang, and F. J. Sun, Chin. J. Lasers (in Chinese) 31, 427 (2004).

Davis, G. K.

P. Schaefer, R. D. Williams, G. K. Davis, and R. A. Ross, IEEE Trans. Instru. Meas. 47, 914 (1998).

Dietrich, R.

R. Dietrich, M. Opper, and H. Sompolinsky, Phys. Rev. Lett. 82, 2975 (1999).

Duan, K.

K. Duan, S. S Keerthi, and A. N. Poo, Neurocomputing 51, 41 (2003).

Henry, J.

J. Henry and J. Livingstone, IEEE Sensors Journal 3, 519 (2003).

Huang, M.

B. Lin, M. Huang, X. Shun, and X. Cao, Proc. SPIE 4919, 512 (2002).

Keerthi, S. S

K. Duan, S. S Keerthi, and A. N. Poo, Neurocomputing 51, 41 (2003).

Lin, B.

B. Lin, M. Huang, X. Shun, and X. Cao, Proc. SPIE 4919, 512 (2002).

Livingstone, J.

J. Henry and J. Livingstone, IEEE Sensors Journal 3, 519 (2003).

Mo, C. T.

C. T. Mo, C. Z. Chen, L. L. Zhang, and F. J. Sun, Chin. J. Lasers (in Chinese) 31, 427 (2004).

Opper, M.

R. Dietrich, M. Opper, and H. Sompolinsky, Phys. Rev. Lett. 82, 2975 (1999).

Poo, A. N.

K. Duan, S. S Keerthi, and A. N. Poo, Neurocomputing 51, 41 (2003).

Ross, R. A.

P. Schaefer, R. D. Williams, G. K. Davis, and R. A. Ross, IEEE Trans. Instru. Meas. 47, 914 (1998).

Schaefer, P.

P. Schaefer, R. D. Williams, G. K. Davis, and R. A. Ross, IEEE Trans. Instru. Meas. 47, 914 (1998).

Shun, X.

B. Lin, M. Huang, X. Shun, and X. Cao, Proc. SPIE 4919, 512 (2002).

Sompolinsky, H.

R. Dietrich, M. Opper, and H. Sompolinsky, Phys. Rev. Lett. 82, 2975 (1999).

Sun, F. J.

C. T. Mo, C. Z. Chen, L. L. Zhang, and F. J. Sun, Chin. J. Lasers (in Chinese) 31, 427 (2004).

Wang, X.

X. Wang and M. Ye, Proc. SPIE 4919, 452 (2002).

X. Wang and M. Ye, Optical Technique (in Chinese) 28, 174 (2002).

Williams, R. D.

P. Schaefer, R. D. Williams, G. K. Davis, and R. A. Ross, IEEE Trans. Instru. Meas. 47, 914 (1998).

Ye, M.

X. Wang and M. Ye, Optical Technique (in Chinese) 28, 174 (2002).

X. Wang and M. Ye, Proc. SPIE 4919, 452 (2002).

Zhang, L. L.

C. T. Mo, C. Z. Chen, L. L. Zhang, and F. J. Sun, Chin. J. Lasers (in Chinese) 31, 427 (2004).

Chin. J. Lasers (in Chinese)

C. T. Mo, C. Z. Chen, L. L. Zhang, and F. J. Sun, Chin. J. Lasers (in Chinese) 31, 427 (2004).

IEEE Sensors Journal

J. Henry and J. Livingstone, IEEE Sensors Journal 3, 519 (2003).

IEEE Trans. Instru. Meas.

P. Schaefer, R. D. Williams, G. K. Davis, and R. A. Ross, IEEE Trans. Instru. Meas. 47, 914 (1998).

Neurocomputing

K. Duan, S. S Keerthi, and A. N. Poo, Neurocomputing 51, 41 (2003).

Optical Technique (in Chinese)

X. Wang and M. Ye, Optical Technique (in Chinese) 28, 174 (2002).

Phys. Rev. Lett.

R. Dietrich, M. Opper, and H. Sompolinsky, Phys. Rev. Lett. 82, 2975 (1999).

Proc. SPIE

X. Wang and M. Ye, Proc. SPIE 4919, 452 (2002).

B. Lin, M. Huang, X. Shun, and X. Cao, Proc. SPIE 4919, 512 (2002).

Other

V. N. Vapnik, The Nature of Statistical Learning Theory (in Chinese) X. G. Zhang (trans.) (Tsinghua University Publishing Company, Beijing, 2000).

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