Abstract

The single- and multi-shot damage behaviors of HfO2/SiO2 high-reflecting (HR) coatings under Nd:YAG laser exposure were investigated. Fundamental aspects of multi-shot laser damage, such as the instability due to pulse-to-pulse accumulation of absorption defect and structural defect effect, and the mechanism of laser induced defect generation, are considered. It was found in multi-shot damage, the main factors influencing laser-induced damage threshold (LIDT) are accumulation of irreversible changes of structural defects and thermal stress that induced by thermal density fluctuations.

© 2005 Chinese Optics Letters

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  1. B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).
  2. A. S. Epifanov, A. A. Manenkov, and A. M. Prokhorov, Sov. Phys. JETP 43, 377 (1976).
  3. C. W. Carr, H. B. Radousky, and S. G. Demos, Phys. Rev. 91, 127402 (2003).
  4. A. A. Manenkov and V. S. Nechitailo, Proc. SPIE 1441, 392 (1991).
  5. A. E. Chmel, Material Science and Engineering B 49, 175 (1997).
  6. ISO/DIS 11254-1.2, Optics and Optical Instruments - Lasers and Laser Related Equipment - Test Methods for Laser Induced Damage Threshold of Optical Surfaces - Part 1: 1 on 1 test.
  7. M. F. Koldunov, A. A. Manenkov, and I. L. Pocotilo, Proc. SPIE 2428, 653 (1995).
  8. J. Dijon and G. Ravel, Proc. SPIE 3578, 398 (1998).
  9. Y. A. Zhao, W. D. Gao, J. D. Shao, and Z. X. Fan, Applied Surface Science 227, 275 (2004).

2004 (1)

Y. A. Zhao, W. D. Gao, J. D. Shao, and Z. X. Fan, Applied Surface Science 227, 275 (2004).

2003 (1)

C. W. Carr, H. B. Radousky, and S. G. Demos, Phys. Rev. 91, 127402 (2003).

1998 (1)

J. Dijon and G. Ravel, Proc. SPIE 3578, 398 (1998).

1997 (1)

A. E. Chmel, Material Science and Engineering B 49, 175 (1997).

1996 (1)

B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).

1995 (1)

M. F. Koldunov, A. A. Manenkov, and I. L. Pocotilo, Proc. SPIE 2428, 653 (1995).

1991 (1)

A. A. Manenkov and V. S. Nechitailo, Proc. SPIE 1441, 392 (1991).

1976 (1)

A. S. Epifanov, A. A. Manenkov, and A. M. Prokhorov, Sov. Phys. JETP 43, 377 (1976).

Carr, C. W.

C. W. Carr, H. B. Radousky, and S. G. Demos, Phys. Rev. 91, 127402 (2003).

Chmel, A. E.

A. E. Chmel, Material Science and Engineering B 49, 175 (1997).

Demos, S. G.

C. W. Carr, H. B. Radousky, and S. G. Demos, Phys. Rev. 91, 127402 (2003).

Dijon, J.

J. Dijon and G. Ravel, Proc. SPIE 3578, 398 (1998).

Epifanov, A. S.

A. S. Epifanov, A. A. Manenkov, and A. M. Prokhorov, Sov. Phys. JETP 43, 377 (1976).

Fan, Z. X.

Y. A. Zhao, W. D. Gao, J. D. Shao, and Z. X. Fan, Applied Surface Science 227, 275 (2004).

Feit, M. D.

B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).

Gao, W. D.

Y. A. Zhao, W. D. Gao, J. D. Shao, and Z. X. Fan, Applied Surface Science 227, 275 (2004).

Herman, S.

B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).

Koldunov, M. F.

M. F. Koldunov, A. A. Manenkov, and I. L. Pocotilo, Proc. SPIE 2428, 653 (1995).

Manenkov, A. A.

M. F. Koldunov, A. A. Manenkov, and I. L. Pocotilo, Proc. SPIE 2428, 653 (1995).

A. A. Manenkov and V. S. Nechitailo, Proc. SPIE 1441, 392 (1991).

A. S. Epifanov, A. A. Manenkov, and A. M. Prokhorov, Sov. Phys. JETP 43, 377 (1976).

Nechitailo, V. S.

A. A. Manenkov and V. S. Nechitailo, Proc. SPIE 1441, 392 (1991).

Perry, M. D.

B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).

Pocotilo, I. L.

M. F. Koldunov, A. A. Manenkov, and I. L. Pocotilo, Proc. SPIE 2428, 653 (1995).

Prokhorov, A. M.

A. S. Epifanov, A. A. Manenkov, and A. M. Prokhorov, Sov. Phys. JETP 43, 377 (1976).

Radousky, H. B.

C. W. Carr, H. B. Radousky, and S. G. Demos, Phys. Rev. 91, 127402 (2003).

Ravel, G.

J. Dijon and G. Ravel, Proc. SPIE 3578, 398 (1998).

Rubenchik, A. M.

B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).

Shao, J. D.

Y. A. Zhao, W. D. Gao, J. D. Shao, and Z. X. Fan, Applied Surface Science 227, 275 (2004).

Shore, B. W.

B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).

Stuart, B. C.

B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).

Zhao, Y. A.

Y. A. Zhao, W. D. Gao, J. D. Shao, and Z. X. Fan, Applied Surface Science 227, 275 (2004).

Applied Surface Science (1)

Y. A. Zhao, W. D. Gao, J. D. Shao, and Z. X. Fan, Applied Surface Science 227, 275 (2004).

Material Science and Engineering B (1)

A. E. Chmel, Material Science and Engineering B 49, 175 (1997).

Phys. Rev. (1)

C. W. Carr, H. B. Radousky, and S. G. Demos, Phys. Rev. 91, 127402 (2003).

Phys. Rev. B (1)

B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53, 1749 (1996).

Proc. SPIE (3)

A. A. Manenkov and V. S. Nechitailo, Proc. SPIE 1441, 392 (1991).

M. F. Koldunov, A. A. Manenkov, and I. L. Pocotilo, Proc. SPIE 2428, 653 (1995).

J. Dijon and G. Ravel, Proc. SPIE 3578, 398 (1998).

Sov. Phys. JETP (1)

A. S. Epifanov, A. A. Manenkov, and A. M. Prokhorov, Sov. Phys. JETP 43, 377 (1976).

Other (1)

ISO/DIS 11254-1.2, Optics and Optical Instruments - Lasers and Laser Related Equipment - Test Methods for Laser Induced Damage Threshold of Optical Surfaces - Part 1: 1 on 1 test.

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