Abstract

The single-sided and dual-sided high reflective mirrors were deposited with ion-beam sputtering (IBS). When the incident light entered with 45 degrees, the reflectance of p-polarized light at 1064 nm exceeded 99.5%. Spectrum was gained by spectrometer and weak absorption of coatings was measured by surface thermal lensing (STL) technique. Laser-induced damage threshold (LIDT) was determined and the damage morphology was observed with Lecia-DMRXE microscope simultaneously. The profile of coatings was measured with Mark III-GPI digital interferometer. It was found that the reflectivity of mirror exceeded 99.9% and its absorption was as low as 14 ppm. The reflective bandwidth of the dual-sided sample was about 43 nm wider than that of single-sided sample, and its LIDT was as high as 28 J/cm2, which was 5 J/cm2 higher than that of single-sided sample. Moreover, the profile of dual-sided sample was better than that of substrate without coatings.

© 2005 Chinese Optics Letters

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References

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2002 (1)

1995 (1)

X. Tang, Z. Fang, and Z. Wang, Acta Opt. Sin. (in Chinese) 15, 217 (1995).

1993 (1)

C. A. Davis, Thin Solid Films 226, 30 (1993).

1992 (1)

G. A. Ai-Jumaily and S. M. Edlou, Thin Solid Films 209, 223 (1992).

1989 (1)

Acta Opt. Sin. (in Chinese) (1)

X. Tang, Z. Fang, and Z. Wang, Acta Opt. Sin. (in Chinese) 15, 217 (1995).

Appl. Opt. (2)

Thin Solid Films (2)

C. A. Davis, Thin Solid Films 226, 30 (1993).

G. A. Ai-Jumaily and S. M. Edlou, Thin Solid Films 209, 223 (1992).

Other (2)

J. K. G. Panitz, G. R. Hills, and D. R. Tallant, J. Vacuum Sci. Technol. A8, 1313 (1990).

A. Kalb, M. Midebrath, and V. Sanders, J. Vacuum Sci. Technol. A4, 436 (1986).

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