Abstract

AF/RSNOM is a new kind of scanning probe microscope developed in our lab, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) working in equi-amplitude tapping mode. This paper introduces the principle of AF/RSNOM and its advantages compared with other reflection mode scanning optical microscopes (RSNOM). Compared with the former RSNOM, this tapping mode AF/RSNOM has convenient operation and fewer background signals.

© 2005 Chinese Optics Letters

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  1. P. M. Adam, P. Royer, R. Laddada, and J. L. Bijeon, Ultramicroscopy 71, 327 (1998).
  2. S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, S. Honma, and S. Kammer, Thin Solid Films 273, 122 (1996).
  3. P. K. Wei, C. C. Wei, J. H. Hsu, and W. S. Fann, Ultramicroscopy 61, 237 (1995).
  4. R. Laddada, P. M. Adam, P. Royer, and J. L. Bijeon, Opt. Eng. 37, 2142 (1998).
  5. D. Barchiesi, Opt. Commun. 154, 167 (1998).
  6. D. Barchiesi, O. Bergossi, C. Pieralli, and M. Spajer, Ultramicroscopy 71, 361 (1998).
  7. S. Madsen, S. I. Bozhevolnyi, and J. M. Hvam, Opt. Commun. 146, 277 (1998).
  8. Y. Inouye and S. Kawata, Opt. Commun. 134, 31 (1997).
  9. A. Jalocha, M. H. P. Moers, A. G. T. Ruiter, and N. F. van Hulst, Ultramicroscopy 61, 221 (1995).
  10. S. Pilevar, W. A. Atia, and C. C. Davis, Ultramicroscopy 61, 233 (1995).
  11. D. Courjon, Near-Field Microscopy and Near-Field Optics (Imperial College Press, London, 2003).

1998 (5)

R. Laddada, P. M. Adam, P. Royer, and J. L. Bijeon, Opt. Eng. 37, 2142 (1998).

D. Barchiesi, Opt. Commun. 154, 167 (1998).

D. Barchiesi, O. Bergossi, C. Pieralli, and M. Spajer, Ultramicroscopy 71, 361 (1998).

S. Madsen, S. I. Bozhevolnyi, and J. M. Hvam, Opt. Commun. 146, 277 (1998).

P. M. Adam, P. Royer, R. Laddada, and J. L. Bijeon, Ultramicroscopy 71, 327 (1998).

1997 (1)

Y. Inouye and S. Kawata, Opt. Commun. 134, 31 (1997).

1996 (1)

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, S. Honma, and S. Kammer, Thin Solid Films 273, 122 (1996).

1995 (3)

P. K. Wei, C. C. Wei, J. H. Hsu, and W. S. Fann, Ultramicroscopy 61, 237 (1995).

A. Jalocha, M. H. P. Moers, A. G. T. Ruiter, and N. F. van Hulst, Ultramicroscopy 61, 221 (1995).

S. Pilevar, W. A. Atia, and C. C. Davis, Ultramicroscopy 61, 233 (1995).

Opt. Commun. (3)

S. Madsen, S. I. Bozhevolnyi, and J. M. Hvam, Opt. Commun. 146, 277 (1998).

Y. Inouye and S. Kawata, Opt. Commun. 134, 31 (1997).

D. Barchiesi, Opt. Commun. 154, 167 (1998).

Opt. Eng. (1)

R. Laddada, P. M. Adam, P. Royer, and J. L. Bijeon, Opt. Eng. 37, 2142 (1998).

Thin Solid Films (1)

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, S. Honma, and S. Kammer, Thin Solid Films 273, 122 (1996).

Ultramicroscopy (5)

P. K. Wei, C. C. Wei, J. H. Hsu, and W. S. Fann, Ultramicroscopy 61, 237 (1995).

P. M. Adam, P. Royer, R. Laddada, and J. L. Bijeon, Ultramicroscopy 71, 327 (1998).

A. Jalocha, M. H. P. Moers, A. G. T. Ruiter, and N. F. van Hulst, Ultramicroscopy 61, 221 (1995).

S. Pilevar, W. A. Atia, and C. C. Davis, Ultramicroscopy 61, 233 (1995).

D. Barchiesi, O. Bergossi, C. Pieralli, and M. Spajer, Ultramicroscopy 71, 361 (1998).

Other (1)

D. Courjon, Near-Field Microscopy and Near-Field Optics (Imperial College Press, London, 2003).

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