Abstract

A new nano-meter scale resolution optical imaging mode and functional prototype of photon scanning tunneling microscope (PSTM) combined with atomic force microscope (AFM) named as AF/PSTM are introduced, and the advantages of AF/PSTM are discussed. Two separated optical images (refractive index image and transmissivity image) and two AFM images (topography image and phase image) of sample can be obtained during AF/PSTM's once scanning. AF/PSTM is applicable to all transmission samples in many fields, such as nano-biology, medicine, nano-optics, nano-industry, nano-science and technology, high-education and so on.

© 2005 Chinese Optics Letters

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2001

S. Wu, S. Pan, J. Zhang, W. Liu, and J. Wang, Chin. Eng. Sci. 3, 33 (2001).

2000

C. Vannier and C. Bainier, Opt. Commun. 175, 83 (2000).

S. Wu, S. Pan, and G. Jian, Proc. SPIE 4098, 125 (2000).

1999

G. Jian, S. Pan, and Y. Wang, Electronic Microscopy Transaction (in Chinese) 18, 13 (1999).

1998

S. Wu, G. Jian, and S. Pan, Proc. SPIE 3467, 34 (1998).

S. Wu, G. Jian, and S. Pan, Acta Photon. Sin. (in Chinese) 27, 52 (1998).

S. Wu, J. Yao, G. Jian, and N. Guo, Acta Opt. Sin. (in Chinese) 18, 191 (1998).

1997

J. Yao, S. Wu, S. Gao, N. Guo, G. Shang, D. Xia, J. He, S. Chu, and C. Li, Electronic Microscope Transaction (in Chinese) 16, 222 (1997).

1995

S. Wu, Scanning 17, 18 (1995).

1986

C. Girard and A. Dereux, Rep. Prog. Phys. 59, 657 (1986).

1984

D. Courjon and C. Bainier, Rep. Prog. Phys. 57, 989 (1984).

1982

G. Binnig and H. Rohrer, Helv. Phys. Acta. 55, 726 (1982).

E. Betzig, P. L. Finn, and J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1982).

Acta Opt. Sin. (in Chinese)

S. Wu, J. Yao, G. Jian, and N. Guo, Acta Opt. Sin. (in Chinese) 18, 191 (1998).

Acta Photon. Sin. (in Chinese)

S. Wu, G. Jian, and S. Pan, Acta Photon. Sin. (in Chinese) 27, 52 (1998).

Appl. Phys. Lett.

E. Betzig, P. L. Finn, and J. S. Weiner, Appl. Phys. Lett. 60, 2484 (1982).

Chin. Eng. Sci.

S. Wu, S. Pan, J. Zhang, W. Liu, and J. Wang, Chin. Eng. Sci. 3, 33 (2001).

Electronic Microscope Transaction (in Chinese)

J. Yao, S. Wu, S. Gao, N. Guo, G. Shang, D. Xia, J. He, S. Chu, and C. Li, Electronic Microscope Transaction (in Chinese) 16, 222 (1997).

Electronic Microscopy Transaction (in Chinese)

G. Jian, S. Pan, and Y. Wang, Electronic Microscopy Transaction (in Chinese) 18, 13 (1999).

Helv. Phys. Acta.

G. Binnig and H. Rohrer, Helv. Phys. Acta. 55, 726 (1982).

Opt. Commun.

C. Vannier and C. Bainier, Opt. Commun. 175, 83 (2000).

Proc. SPIE

S. Wu, G. Jian, and S. Pan, Proc. SPIE 3467, 34 (1998).

S. Wu, S. Pan, and G. Jian, Proc. SPIE 4098, 125 (2000).

Rep. Prog. Phys.

D. Courjon and C. Bainier, Rep. Prog. Phys. 57, 989 (1984).

C. Girard and A. Dereux, Rep. Prog. Phys. 59, 657 (1986).

Scanning

S. Wu, Scanning 17, 18 (1995).

Other

S. Wu, "The Separating Method of Photon Tunneling Scanning Image" (in Chinese), Chinese Patent ZL93 1 04111.2 (1999).

S. Wu, "The Separating Method and Device of Photon Tunneling Scanning Image", Priority Japanese Patent, 3339658 (2002).

S. Wu, "The Separating Method of Image of Atomic Force / Photon Scanning Tunneling Microscope" (in Chinese) Chinese Patent, ZL96 1 11979.9 (2002).

X. Wang, G. Jian, W. Liu, S. Pan, and S. Wu, in Proceedings of 2nd Asia-Pacific Workshop on Near-Field Optics 123 (2000).

D. Pohl and D. Courjon (eds.), Near-Field Optics (NATO AST Series E242) (Kluwer, Dordrecht, 1983).

T. M. Ferrel, K. J. Warmarck, and R. C. Reddick, "Photon Scanning Tunneling Microscopy", Int. CI5: G01B11/24. United States, Patent number: 5,018,865 (1991).

S. Wu, G. Jian, S. Pan, and Y. Wang, in Proceeding of 2nd Asia-Pacific Workshop on Near-Field Optics, 79 (2000).

S. Wu, J. Zhang, Y. Huang, Y. Li, W. Sun, and S. Pan, in Proceedings of 2002 Annual Meeting of China Optics 1, 245 (2002).

S. Pan, S. Wu, W. Sun, Y. Li, Y. Zhang, and G. Jian, in Proceedings of 2002 Annual Meeting of China Optics 1, 240 (2002).

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