Abstract

A cost-effective technique for in-service chromatic dispersion monitoring in a 40-Gb/s optical communication system is proposed. Microwave devices are adopted to detect the electrical power of a specific frequency band. A simplified theoretical model is proposed and discussed focusing on the relationship between electrical power and chromatic dispersion at different frequency bands. The dynamic monitoring of chromatic dispersion is achievedusing devices such as PIN detector, microwave amplifier, narrow-band microwave filter, and electrical power detector. The maximum detectable chromatic dispersion is 130 ps/nm and a resolution of 5.2 ps/nm/dB has been achieved in the frequency band centered at 12 GHz.

© 2005 Chinese Optics Letters

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  2. A. E. Willner, in Proceedings of LEOS'2002 Tul1, 201 (2002).
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  5. T. E. Dimmick, G. Rossi, and D. J. Blumenthal, IEEE Photon. Technol. Lett. 12, 900 (2000).
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  8. Y. Takushima and K. Kikuchi, Electron. Lett. 37, 743 (2001).
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  10. T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).
  11. S. Wielandy, M. Fishteyn, T. Her, D. Kudelko, and C. Zhang, in Proceedings of OFC'2003 TuD5, 166 (2003).
  12. P. S. Westbrook, B. J. Eggleton, T. Her, G. Raybon, and S. Hunsche, in Proceedings of OFC'2002 WU6, 335 (2002).
  13. P. S. Westbrook, B. J. Eggleton, G. Raybon, S. Hunsche, and T. Her, IEEE Photon. Technol. Lett. 14, 346 (2002).

2004

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

2002

T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).

P. S. Westbrook, B. J. Eggleton, G. Raybon, S. Hunsche, and T. Her, IEEE Photon. Technol. Lett. 14, 346 (2002).

Q. Yu, Z. Pan, L.-S. Yan, and A. E. Willner, J. Lightwave Technol. 20, 2267 (2002).

M. N. Petersen, Z. Pan, S. Lee, S. A. Havstad, and A. E. Willner, IEEE Photon. Technol. Lett. 14, 570 (2002).

2001

Y. Takushima and K. Kikuchi, Electron. Lett. 37, 743 (2001).

2000

T. E. Dimmick, G. Rossi, and D. J. Blumenthal, IEEE Photon. Technol. Lett. 12, 900 (2000).

Blumenthal, D. J.

T. E. Dimmick, G. Rossi, and D. J. Blumenthal, IEEE Photon. Technol. Lett. 12, 900 (2000).

Dimmick, T. E.

T. E. Dimmick, G. Rossi, and D. J. Blumenthal, IEEE Photon. Technol. Lett. 12, 900 (2000).

Eggleton, B. J.

P. S. Westbrook, B. J. Eggleton, G. Raybon, S. Hunsche, and T. Her, IEEE Photon. Technol. Lett. 14, 346 (2002).

Feinberg, J.

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

Grubsky, V.

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

Havstad, S. A.

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

M. N. Petersen, Z. Pan, S. Lee, S. A. Havstad, and A. E. Willner, IEEE Photon. Technol. Lett. 14, 570 (2002).

Her, T.

P. S. Westbrook, B. J. Eggleton, G. Raybon, S. Hunsche, and T. Her, IEEE Photon. Technol. Lett. 14, 346 (2002).

Hunsche, S.

P. S. Westbrook, B. J. Eggleton, G. Raybon, S. Hunsche, and T. Her, IEEE Photon. Technol. Lett. 14, 346 (2002).

Inui, T.

T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).

Kikuchi, K.

Y. Takushima and K. Kikuchi, Electron. Lett. 37, 743 (2001).

Komukai, T.

T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).

Lee, S.

M. N. Petersen, Z. Pan, S. Lee, S. A. Havstad, and A. E. Willner, IEEE Photon. Technol. Lett. 14, 570 (2002).

Morioka, T.

T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).

Nakazawa, M.

T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).

Pan, Z.

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

Q. Yu, Z. Pan, L.-S. Yan, and A. E. Willner, J. Lightwave Technol. 20, 2267 (2002).

M. N. Petersen, Z. Pan, S. Lee, S. A. Havstad, and A. E. Willner, IEEE Photon. Technol. Lett. 14, 570 (2002).

Petersen, M. N.

M. N. Petersen, Z. Pan, S. Lee, S. A. Havstad, and A. E. Willner, IEEE Photon. Technol. Lett. 14, 570 (2002).

Raybon, G.

P. S. Westbrook, B. J. Eggleton, G. Raybon, S. Hunsche, and T. Her, IEEE Photon. Technol. Lett. 14, 346 (2002).

Rossi, G.

T. E. Dimmick, G. Rossi, and D. J. Blumenthal, IEEE Photon. Technol. Lett. 12, 900 (2000).

Starodubov, D. S.

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

Suzuki, K.

T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).

Takushima, Y.

Y. Takushima and K. Kikuchi, Electron. Lett. 37, 743 (2001).

Tamura, K. R.

T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).

Uchiyama, K.

T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).

Westbrook, P. S.

P. S. Westbrook, B. J. Eggleton, G. Raybon, S. Hunsche, and T. Her, IEEE Photon. Technol. Lett. 14, 346 (2002).

Wiklner, A. E.

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

Willner, A. E.

Q. Yu, Z. Pan, L.-S. Yan, and A. E. Willner, J. Lightwave Technol. 20, 2267 (2002).

M. N. Petersen, Z. Pan, S. Lee, S. A. Havstad, and A. E. Willner, IEEE Photon. Technol. Lett. 14, 570 (2002).

Xie, Y.

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

Yan, L.-S.

Yu, Q.

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

Q. Yu, Z. Pan, L.-S. Yan, and A. E. Willner, J. Lightwave Technol. 20, 2267 (2002).

Electron. Lett.

Y. Takushima and K. Kikuchi, Electron. Lett. 37, 743 (2001).

IEEE Photon. Technol. Lett.

T. Inui, T. Komukai, M. Nakazawa, K. Suzuki, K. R. Tamura, K. Uchiyama, and T. Morioka, IEEE Photon. Technol. Lett. 14, 549 (2002).

T. E. Dimmick, G. Rossi, and D. J. Blumenthal, IEEE Photon. Technol. Lett. 12, 900 (2000).

P. S. Westbrook, B. J. Eggleton, G. Raybon, S. Hunsche, and T. Her, IEEE Photon. Technol. Lett. 14, 346 (2002).

M. N. Petersen, Z. Pan, S. Lee, S. A. Havstad, and A. E. Willner, IEEE Photon. Technol. Lett. 14, 570 (2002).

J. Lightwave Technol.

Opt. Commun.

Z. Pan, Y. Xie, S. A. Havstad, Q. Yu, A. E. Wiklner, V. Grubsky, D. S. Starodubov, and J. Feinberg, Opt. Commun. 230, 145 (2004).

Other

S. Wielandy, M. Fishteyn, T. Her, D. Kudelko, and C. Zhang, in Proceedings of OFC'2003 TuD5, 166 (2003).

P. S. Westbrook, B. J. Eggleton, T. Her, G. Raybon, and S. Hunsche, in Proceedings of OFC'2002 WU6, 335 (2002).

K. J. Park, C. J. Youn, J. H. Lee, and Y. C. Chung, in Proceedings of OFC'2002 ThGG88, 735 (2002).

A. E. Willner, in Proceedings of LEOS'2002 Tul1, 201 (2002).

T. Sugihara, K. Shimomura, K. Shimizu, Y. Kobayashi, K. Matsuoka, M. Hashimoto, T. Hashimoto, T. Hirai, S. Matsumoto, T. Ohira, M. Takabayashi, K. Yoshiara, and T. Mizuochi, in Proceedings of OFC'2002 ThAA2, 577 (2002).

Y. Yokoyama, T. Ito, and K. Fukuchi, in Proceedings of ECOC'2003 Tu 4.2.1 (2003).

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