Abstract

An algorithm is presented for multi-sensor image fusion using discrete wavelet frame transform (DWFT). The source images to be fused are firstly decomposed by DWFT. The fusion process is the combining of the source coefficients. Before the image fusion process, image segmentation is performed on each source image in order to obtain the region representation of each source image. For each source image, the salience of each region in its region representation is calculated. By overlapping all these region representations of all the source images, we produce a shared region representation to label all the input images. The fusion process is guided by these region representations. Region match measure of the source images is calculated for each region in the shared region representation. When fusing the similar regions, weighted averaging mode is performed; otherwise selection mode is performed. Experimental results using real data show that the proposed algorithm outperforms the traditional pyramid transform based or discrete wavelet transform (DWT) based algorithms in multi-sensor image fusion.

© 2005 Chinese Optics Letters

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2003

N. Frank and N. Richard, in Proc. IEEE Conf. Computer Vision and Pattern Recognition 2, 19 (2003).

2002

G. Qu, D. Zhang, and P. Yan, Electron. Lett. 38, 313 (2002).

1999

P. K. Varshney, H. M. Chen, L. C. Ramac, M. Uner, D. Ferris, and M. Alford, in IEEE Proc. Int. Conf. Image Processing 3, 532 (1999).

Z. Zhang and R. S. Blum, Proceedings of IEEE 87, 1315 (1999).

1998

L. C. Ramac, M. K. Uner, and P. K. Varshney, Proc. SPIE 3376, 110 (1998).

1996

A. Laine and J. Fan, IEEE Trans. Image Processing 5, 771 (1996).

1995

M. Unser, IEEE Trans. Image Processing 4, 1549 (1995).

H. Li, B. S. Manjunath, and S. K Mitra, Graphical Models and Image Processing 57, 235 (1995).

1992

P. J. Burt, in SPIE Proc. of the Society for Information Display Conference 467, (1992).

1989

A. Toet, Pattern Recognition 9, 245 (1989).

S. G. Mallat, IEEE Trans. Pattern Analysis and Machine Intelligence 11, 674 (1989).

Alford, M.

P. K. Varshney, H. M. Chen, L. C. Ramac, M. Uner, D. Ferris, and M. Alford, in IEEE Proc. Int. Conf. Image Processing 3, 532 (1999).

Blum, R. S.

Z. Zhang and R. S. Blum, Proceedings of IEEE 87, 1315 (1999).

Burt, P. J.

P. J. Burt, in SPIE Proc. of the Society for Information Display Conference 467, (1992).

Chen, H. M.

P. K. Varshney, H. M. Chen, L. C. Ramac, M. Uner, D. Ferris, and M. Alford, in IEEE Proc. Int. Conf. Image Processing 3, 532 (1999).

Fan, J.

A. Laine and J. Fan, IEEE Trans. Image Processing 5, 771 (1996).

Ferris, D.

P. K. Varshney, H. M. Chen, L. C. Ramac, M. Uner, D. Ferris, and M. Alford, in IEEE Proc. Int. Conf. Image Processing 3, 532 (1999).

Frank, N.

N. Frank and N. Richard, in Proc. IEEE Conf. Computer Vision and Pattern Recognition 2, 19 (2003).

Laine, A.

A. Laine and J. Fan, IEEE Trans. Image Processing 5, 771 (1996).

Li, H.

H. Li, B. S. Manjunath, and S. K Mitra, Graphical Models and Image Processing 57, 235 (1995).

Mallat, S. G.

S. G. Mallat, IEEE Trans. Pattern Analysis and Machine Intelligence 11, 674 (1989).

Manjunath, B. S.

H. Li, B. S. Manjunath, and S. K Mitra, Graphical Models and Image Processing 57, 235 (1995).

Mitra, S. K

H. Li, B. S. Manjunath, and S. K Mitra, Graphical Models and Image Processing 57, 235 (1995).

Qu, G.

G. Qu, D. Zhang, and P. Yan, Electron. Lett. 38, 313 (2002).

Ramac, L. C.

P. K. Varshney, H. M. Chen, L. C. Ramac, M. Uner, D. Ferris, and M. Alford, in IEEE Proc. Int. Conf. Image Processing 3, 532 (1999).

L. C. Ramac, M. K. Uner, and P. K. Varshney, Proc. SPIE 3376, 110 (1998).

Richard, N.

N. Frank and N. Richard, in Proc. IEEE Conf. Computer Vision and Pattern Recognition 2, 19 (2003).

Toet, A.

A. Toet, Pattern Recognition 9, 245 (1989).

Uner, M.

P. K. Varshney, H. M. Chen, L. C. Ramac, M. Uner, D. Ferris, and M. Alford, in IEEE Proc. Int. Conf. Image Processing 3, 532 (1999).

Uner, M. K.

L. C. Ramac, M. K. Uner, and P. K. Varshney, Proc. SPIE 3376, 110 (1998).

Unser, M.

M. Unser, IEEE Trans. Image Processing 4, 1549 (1995).

Varshney, P. K.

P. K. Varshney, H. M. Chen, L. C. Ramac, M. Uner, D. Ferris, and M. Alford, in IEEE Proc. Int. Conf. Image Processing 3, 532 (1999).

L. C. Ramac, M. K. Uner, and P. K. Varshney, Proc. SPIE 3376, 110 (1998).

Yan, P.

G. Qu, D. Zhang, and P. Yan, Electron. Lett. 38, 313 (2002).

Zhang, D.

G. Qu, D. Zhang, and P. Yan, Electron. Lett. 38, 313 (2002).

Zhang, Z.

Z. Zhang and R. S. Blum, Proceedings of IEEE 87, 1315 (1999).

Electron. Lett.

G. Qu, D. Zhang, and P. Yan, Electron. Lett. 38, 313 (2002).

Graphical Models and Image Processing

H. Li, B. S. Manjunath, and S. K Mitra, Graphical Models and Image Processing 57, 235 (1995).

IEEE Trans. Image Processing

A. Laine and J. Fan, IEEE Trans. Image Processing 5, 771 (1996).

M. Unser, IEEE Trans. Image Processing 4, 1549 (1995).

IEEE Trans. Pattern Analysis and Machine Intelligence

S. G. Mallat, IEEE Trans. Pattern Analysis and Machine Intelligence 11, 674 (1989).

in IEEE Proc. Int. Conf. Image Processing

P. K. Varshney, H. M. Chen, L. C. Ramac, M. Uner, D. Ferris, and M. Alford, in IEEE Proc. Int. Conf. Image Processing 3, 532 (1999).

in Proc. IEEE Conf. Computer Vision and Pattern Recognition

N. Frank and N. Richard, in Proc. IEEE Conf. Computer Vision and Pattern Recognition 2, 19 (2003).

Pattern Recognition

A. Toet, Pattern Recognition 9, 245 (1989).

Proc. SPIE

P. J. Burt, in SPIE Proc. of the Society for Information Display Conference 467, (1992).

L. C. Ramac, M. K. Uner, and P. K. Varshney, Proc. SPIE 3376, 110 (1998).

Proceedings of IEEE

Z. Zhang and R. S. Blum, Proceedings of IEEE 87, 1315 (1999).

Other

S. G. Mallat, A Wavelet Tour of Signal Processing (Academic Press, San Diego, California, 1998).

P. J. Burt and R. J. Kolczynski, in IEEE Proc. of 4th Int. Conf. on Computer Vision 173 (1993).

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