Abstract

This paper reports a detection method of two-dimensional (2D) enhancement and three-dimensional (3D) reconstruction for subtle traces with reflectance transformation imaging, which can effectively locate the trace area of interest and extract the normal data of this area directly. In millimeter- and micron-scale traces, during 3D construction, we presented a method of data screening, conversion, and amplification, which can successfully suppress noise, improve surface and edge quality, and enhance 3D effect and contrast. The method not only captures 2D and 3D morphologies of traces clearly but also obtains the sizes of these traces.

© 2021 Chinese Laser Press

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