Abstract

Single layer lattice graphene deposited on the metal substrate can hardly be imaged by the optical microscope. In this Letter, a large field-of-view imaging ellipsometer is introduced to image single layer graphene which is deposited on a metal substrate. By adjusting the polarizer and the analyzer of imaging ellipsometer, the light reflected from surfaces of either single layer graphene or a Au film substrate can be extinguished, respectively. Thus, single layer graphene can be imaged correspondingly under brightfield or darkfield imaging modes. The method can be applied to imaging large-area graphene on a metal substrate.

© 2019 Chinese Laser Press

Terahertz imaging and spectroscopy of large-area single-layer graphene

J. L. Tomaino, A. D. Jameson, J. W. Kevek, M. J. Paul, A. M. van der Zande, R. A. Barton, P. L. McEuen, E. D. Minot, and Yun-Shik Lee
Opt. Express 19(1) 141-146 (2011)

High spatial resolution ellipsometer for characterization of epitaxial graphene

Peter E. Gaskell, Helgi S. Skulason, Wlodek Strupinski, and Thomas Szkopek
Opt. Lett. 35(20) 3336-3338 (2010)

Surface plasmon resonance for characterization of large-area atomic-layer graphene film

Henri Jussila, He Yang, Niko Granqvist, and Zhipei Sun
Optica 3(2) 151-158 (2016)

Imaging by a sub-wavelength metallic lens with large field of view

Shaoyun Yin, Chongxi Zhou, Xiangang Luo, and Chunlei Du
Opt. Express 16(4) 2578-2583 (2008)

Thickness determination of graphene on metal substrate by reflection spectroscopy

Tommi Kaplas, Aleksey Zolotukhin, and Yuri Svirko
Opt. Express 19(18) 17226-17231 (2011)