Abstract
Specimens of PbTe single film are deposited on Ge substrates by vacuum
thermal evaporation. During the temperature range of 80–300 K, the
transmittance of a PbTe film within 2–15 μm is measured every 20 K by the
PerkinElmer Fourier transform infrared spectroscopy cryogenic testing system.
Then, the relationship between the refractive index and wavelength within 7–12
μm at different temperatures is received by the full spectrum inversion method
fitting. It can be seen that the relationship conforms to the Cauchy formula,
which can be fitted. Then, the relationship between the refractive index of
the PbTe film and the temperature/wavelength can be expressed as
n(λ,T)=5.82840−0.00304T+4.61458×10−6T2+8.00280/λ2+0.21544/λ4,
which is obtained by the fitting method based on the Cauchy formula. Finally,
the designed value obtained by the formula and the measured spectrum are
compared to verify the accuracy of the formula.
© 2017 Chinese Laser Press
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