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Optica Publishing Group
  • Chinese Optics Letters
  • Vol. 15,
  • Issue 3,
  • pp. 030004-
  • (2017)

Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)

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Abstract

In this Letter, a refractive index measurement of a dielectric sample using highly focused radially polarized light is reported. Through imaging analysis of the optical field at the pupil plane of a high numerical aperture (NA) objective lens reflected by the sample under study, the Brewster angle is found. Employing a high NA objective lens allows the measurement of multiple angles of incidence from 0° to 64° in a single shot. The refractive index of the sample is estimated using the measured Brewster angle. The experimental results are compared with the theoretical images computed with the Fresnel theory, and a good agreement is obtained.

© 2017 Chinese Laser Press

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