Abstract
Refractive indices for crystals ammonium dihydrogen phosphate (ADP), 30% deuterated ADP (DADP), 50% DADP, and 70% DADP are measured from 253 to 1529 nm with 5×10−6 accuracy. Numerical fits to modified double-pole Sellmeier equation are made. Second-harmonic generation, third-harmonic generation phase matching (PM) angles, and noncritical PM (NCPM) wavelengths are calculated using the Sellmeier parameters. The deuterated crystals show smaller PM angles than pure crystal. Fourth-harmonic generation process can be realized by DADP in smaller deuterium content than deuterated potassium dihydrogen phosphate (DKDP). The measured NCPM wavelengths are consistent with the calculated value. PM characteristics are compared between DADP and DKDP.
© 2015 Chinese Laser Press
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