Abstract

Traditional integral colorimeters use tungsten-halogen or xenon lamps for illumination, as well as correcting filters to make the instrument's spectral response meet the Luther condition. This structure causes the instruments to have relatively higher error and poor repeatability. Thus, this letter proposes a new measurement design that uses compound LEDs as the instrument's measurement light source. The new design adjusts the instrument's spectral response by modifying the spectra of the compound LEDs. A compound LED light source is designed for integral colorimeters, and an experiment is conducted to evaluate the performance of the integral colorimeter. Experiments show that the design effectively reduces the error of integral colorimeters.

© 2014 Chinese Optics Letters

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  1. B. Wang, H. Xu, and M. Luo, Chin. Opt. Lett. 10, 013301 (2012).
  2. K. Xiao, N. Liao, F. Zardawi, H. Liu, R. Van Noort, Z. Yang, M. Huang, and J. Yates, Chin. Opt. Lett. 10, 083301 (2012).
  3. Y. Intaravanne, S. Sumriddetchkajorn, and J. Nukeaw, Sensor. Actuator. B: Chem. 168, 390 (2012).
  4. Y. Intaravanne and S. Sumriddetchkajorn, Proc. SPIE 8558, 85580F (2012).
  5. G. Polyzois, I. Kostoulas, D. Nikolovieni, A. Mitsoudis, and M. Frangou, Odontology 101, 193 (2013).
  6. F. Sametoglu and O. Celikel, MAPAN-Journal of Metrology Society of India 27, 149 (2012).
  7. C. Shannon, D. Slocum, and M. Vrhel, "Method for Designing a Colorimeter having Illuminant-Weighted CIE Color-Matching Filters" U.S.Patent US7580130B2 (2009).
  8. V. A. Soloviev and M. N. Morozova, Measurement Techniques 55, 914 (2012).
  9. J. L. Gardner, Color Res. Appl. 38, 251 (2013).
  10. I. Fryc, S. W. Brown, G. P. Eppeldaure, and Y. Ohno, Proc. SPIE 5530, 150 (2004).
  11. I. Fryc, S. W. Brown, and Y. Ohno, Proc. SPIE 5941, 59411I (2005).
  12. JJG245-2005, "Illuminance Meter". China: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China (2005).
  13. JJG595-2002, "Colorimeter and color difference meter". China: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China (2002).

2013 (2)

G. Polyzois, I. Kostoulas, D. Nikolovieni, A. Mitsoudis, and M. Frangou, Odontology 101, 193 (2013).

J. L. Gardner, Color Res. Appl. 38, 251 (2013).

2012 (6)

B. Wang, H. Xu, and M. Luo, Chin. Opt. Lett. 10, 013301 (2012).

K. Xiao, N. Liao, F. Zardawi, H. Liu, R. Van Noort, Z. Yang, M. Huang, and J. Yates, Chin. Opt. Lett. 10, 083301 (2012).

F. Sametoglu and O. Celikel, MAPAN-Journal of Metrology Society of India 27, 149 (2012).

V. A. Soloviev and M. N. Morozova, Measurement Techniques 55, 914 (2012).

Y. Intaravanne, S. Sumriddetchkajorn, and J. Nukeaw, Sensor. Actuator. B: Chem. 168, 390 (2012).

Y. Intaravanne and S. Sumriddetchkajorn, Proc. SPIE 8558, 85580F (2012).

2005 (1)

I. Fryc, S. W. Brown, and Y. Ohno, Proc. SPIE 5941, 59411I (2005).

2004 (1)

I. Fryc, S. W. Brown, G. P. Eppeldaure, and Y. Ohno, Proc. SPIE 5530, 150 (2004).

Brown, S. W.

I. Fryc, S. W. Brown, and Y. Ohno, Proc. SPIE 5941, 59411I (2005).

I. Fryc, S. W. Brown, G. P. Eppeldaure, and Y. Ohno, Proc. SPIE 5530, 150 (2004).

Celikel, O.

F. Sametoglu and O. Celikel, MAPAN-Journal of Metrology Society of India 27, 149 (2012).

Eppeldaure, G. P.

I. Fryc, S. W. Brown, G. P. Eppeldaure, and Y. Ohno, Proc. SPIE 5530, 150 (2004).

Frangou, M.

G. Polyzois, I. Kostoulas, D. Nikolovieni, A. Mitsoudis, and M. Frangou, Odontology 101, 193 (2013).

Fryc, I.

I. Fryc, S. W. Brown, and Y. Ohno, Proc. SPIE 5941, 59411I (2005).

I. Fryc, S. W. Brown, G. P. Eppeldaure, and Y. Ohno, Proc. SPIE 5530, 150 (2004).

Gardner, J. L.

J. L. Gardner, Color Res. Appl. 38, 251 (2013).

Huang, M.

Intaravanne, Y.

Y. Intaravanne and S. Sumriddetchkajorn, Proc. SPIE 8558, 85580F (2012).

Y. Intaravanne, S. Sumriddetchkajorn, and J. Nukeaw, Sensor. Actuator. B: Chem. 168, 390 (2012).

Kostoulas, I.

G. Polyzois, I. Kostoulas, D. Nikolovieni, A. Mitsoudis, and M. Frangou, Odontology 101, 193 (2013).

Liao, N.

Liu, H.

Luo, M.

Mitsoudis, A.

G. Polyzois, I. Kostoulas, D. Nikolovieni, A. Mitsoudis, and M. Frangou, Odontology 101, 193 (2013).

Morozova, M. N.

V. A. Soloviev and M. N. Morozova, Measurement Techniques 55, 914 (2012).

Nikolovieni, D.

G. Polyzois, I. Kostoulas, D. Nikolovieni, A. Mitsoudis, and M. Frangou, Odontology 101, 193 (2013).

Noort, R. Van

Nukeaw, J.

Y. Intaravanne, S. Sumriddetchkajorn, and J. Nukeaw, Sensor. Actuator. B: Chem. 168, 390 (2012).

Ohno, Y.

I. Fryc, S. W. Brown, and Y. Ohno, Proc. SPIE 5941, 59411I (2005).

I. Fryc, S. W. Brown, G. P. Eppeldaure, and Y. Ohno, Proc. SPIE 5530, 150 (2004).

Polyzois, G.

G. Polyzois, I. Kostoulas, D. Nikolovieni, A. Mitsoudis, and M. Frangou, Odontology 101, 193 (2013).

Sametoglu, F.

F. Sametoglu and O. Celikel, MAPAN-Journal of Metrology Society of India 27, 149 (2012).

Soloviev, V. A.

V. A. Soloviev and M. N. Morozova, Measurement Techniques 55, 914 (2012).

Sumriddetchkajorn, S.

Y. Intaravanne and S. Sumriddetchkajorn, Proc. SPIE 8558, 85580F (2012).

Y. Intaravanne, S. Sumriddetchkajorn, and J. Nukeaw, Sensor. Actuator. B: Chem. 168, 390 (2012).

Wang, B.

Xiao, K.

Xu, H.

Yang, Z.

Yates, J.

Zardawi, F.

Chin. Opt. Lett. (2)

Color Res. Appl. (1)

J. L. Gardner, Color Res. Appl. 38, 251 (2013).

MAPAN-Journal of Metrology Society of India (1)

F. Sametoglu and O. Celikel, MAPAN-Journal of Metrology Society of India 27, 149 (2012).

Measurement Techniques (1)

V. A. Soloviev and M. N. Morozova, Measurement Techniques 55, 914 (2012).

Odontology (1)

G. Polyzois, I. Kostoulas, D. Nikolovieni, A. Mitsoudis, and M. Frangou, Odontology 101, 193 (2013).

Proc. SPIE (3)

Y. Intaravanne and S. Sumriddetchkajorn, Proc. SPIE 8558, 85580F (2012).

I. Fryc, S. W. Brown, G. P. Eppeldaure, and Y. Ohno, Proc. SPIE 5530, 150 (2004).

I. Fryc, S. W. Brown, and Y. Ohno, Proc. SPIE 5941, 59411I (2005).

Sensor. Actuator. B: Chem. (1)

Y. Intaravanne, S. Sumriddetchkajorn, and J. Nukeaw, Sensor. Actuator. B: Chem. 168, 390 (2012).

Other (3)

C. Shannon, D. Slocum, and M. Vrhel, "Method for Designing a Colorimeter having Illuminant-Weighted CIE Color-Matching Filters" U.S.Patent US7580130B2 (2009).

JJG245-2005, "Illuminance Meter". China: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China (2005).

JJG595-2002, "Colorimeter and color difference meter". China: General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China (2002).

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