Abstract

We theoretically study the light outcoupling efficiency of top-emitting organic light-emitting diode (OLED) with inverted structure and thin-film encapsulation. Thin-film optics is used to optimize the layer thickness to obtain high transmittance. Dipole mode is used to analyze the light outcoupling efficiency of the top-emitting OLED. Through this process, we can optimize the thin-film thickness with high transmittance and optimize the outcoupling efficiency of OLED. Compared with previous research, the current design method is a novel process.

© 2014 Chinese Optics Letters

PDF Article

References

  • View by:
  • |
  • |
  • |

  1. L. Yang, P. Wu, B. Huang, and P. Gu, Chin. Opt. Lett. 2, 299 (2004).
  2. S. Huang, Z. Ye, J. Lu, Y. Su, C. Chen, and G. He, Chin. Opt. Lett. 11, 062302 (2013).
  3. B. Geffroy, P. l. Roy, and C. Prat, Polym. Int. 55, 572 (2006).
  4. T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).
  5. X. Hu, Y. Sun, G. Yang, Y. Xiang, and J. Feng, Chin. Opt. Lett. 10, 011601 (2012).
  6. F. Zhou, Q. Wang, D. Wu, and J. Cui, Chin. Opt. Lett. 10, 022301 (2012).
  7. C. P. Chen, J. H. Lee, T.-H. Yoon, and J. C. Kim, Opt. Lett. 34, 2222 (2009).
  8. S. Hofmann, M. Thomschke, B. Lussem, and K. Leo, Opt. Express 19, A1250 (2011).
  9. T. Riedl, J. Meyer, H. Schmidt, T. Winkler, and W. Kowalsky, in Proceedings of Solid-State and Organic Lighting SOWB5 (2010).
  10. S. Nowy, J. Frischeisen, and W. Brutting, Proc. SPIE 7415, 74151C (2009).
  11. J. Shiang, T. Faircloth, and A. R. Duggal, Proc. SPIE 5214, 268 (2004).
  12. J. F. Revelli, L. W. Tutt, and B. E. Kruschwitz, Appl. Opt. 44, 3224 (2005).
  13. Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).
  14. Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, and K. Hamamoto, Appl. Phys. Lett. 100, 031108 (2012)
  15. Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, K. Hamamoto, IEICE Transactions on Electronics E94-C, 862 (2011)
  16. H. A. Macleod, Thin-Film Optical Filters (4th edn). (CRC Press, Boca Raton, 2010).
  17. W. L. Barnes, J. Mod. Opt. 45, 661 (1998).
  18. M. Furno, R. Meerheim, M. Thomschke, S. Hofmann, B. Lussem, and K. Leo, Proc. SPIE 7617, 761716 (2010).
  19. K. G. Sullivan and D. G. Hall, J. Opt. Soc. Am. B 14, 1149 (1997).

2013

2012

X. Hu, Y. Sun, G. Yang, Y. Xiang, and J. Feng, Chin. Opt. Lett. 10, 011601 (2012).

F. Zhou, Q. Wang, D. Wu, and J. Cui, Chin. Opt. Lett. 10, 022301 (2012).

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, and K. Hamamoto, Appl. Phys. Lett. 100, 031108 (2012)

2011

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, K. Hamamoto, IEICE Transactions on Electronics E94-C, 862 (2011)

S. Hofmann, M. Thomschke, B. Lussem, and K. Leo, Opt. Express 19, A1250 (2011).

2010

Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).

M. Furno, R. Meerheim, M. Thomschke, S. Hofmann, B. Lussem, and K. Leo, Proc. SPIE 7617, 761716 (2010).

2009

S. Nowy, J. Frischeisen, and W. Brutting, Proc. SPIE 7415, 74151C (2009).

C. P. Chen, J. H. Lee, T.-H. Yoon, and J. C. Kim, Opt. Lett. 34, 2222 (2009).

2007

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

2006

B. Geffroy, P. l. Roy, and C. Prat, Polym. Int. 55, 572 (2006).

2005

2004

L. Yang, P. Wu, B. Huang, and P. Gu, Chin. Opt. Lett. 2, 299 (2004).

J. Shiang, T. Faircloth, and A. R. Duggal, Proc. SPIE 5214, 268 (2004).

1998

W. L. Barnes, J. Mod. Opt. 45, 661 (1998).

1997

Barnes, W. L.

W. L. Barnes, J. Mod. Opt. 45, 661 (1998).

Brutting, W.

S. Nowy, J. Frischeisen, and W. Brutting, Proc. SPIE 7415, 74151C (2009).

Chen, C.

Chen, C. P.

Cui, J.

Duelk, M.

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, and K. Hamamoto, Appl. Phys. Lett. 100, 031108 (2012)

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, K. Hamamoto, IEICE Transactions on Electronics E94-C, 862 (2011)

Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).

Duggal, A. R.

J. Shiang, T. Faircloth, and A. R. Duggal, Proc. SPIE 5214, 268 (2004).

Faircloth, T.

J. Shiang, T. Faircloth, and A. R. Duggal, Proc. SPIE 5214, 268 (2004).

Feng, J.

Frischeisen, J.

S. Nowy, J. Frischeisen, and W. Brutting, Proc. SPIE 7415, 74151C (2009).

Furno, M.

M. Furno, R. Meerheim, M. Thomschke, S. Hofmann, B. Lussem, and K. Leo, Proc. SPIE 7617, 761716 (2010).

Geffroy, B.

B. Geffroy, P. l. Roy, and C. Prat, Polym. Int. 55, 572 (2006).

Gu, P.

Hall, D. G.

Hamamoto, K.

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, and K. Hamamoto, Appl. Phys. Lett. 100, 031108 (2012)

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, K. Hamamoto, IEICE Transactions on Electronics E94-C, 862 (2011)

Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).

He, G.

Hinokuma, Y.

Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).

Hofmann, S.

S. Hofmann, M. Thomschke, B. Lussem, and K. Leo, Opt. Express 19, A1250 (2011).

M. Furno, R. Meerheim, M. Thomschke, S. Hofmann, B. Lussem, and K. Leo, Proc. SPIE 7617, 761716 (2010).

Hu, X.

Huang, B.

Huang, S.

kawabe, K.

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Kim, J. C.

Kohno, M.

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Kruschwitz, B. E.

Lee, J. H.

Leo, K.

S. Hofmann, M. Thomschke, B. Lussem, and K. Leo, Opt. Express 19, A1250 (2011).

M. Furno, R. Meerheim, M. Thomschke, S. Hofmann, B. Lussem, and K. Leo, Proc. SPIE 7617, 761716 (2010).

Lu, J.

Lussem, B.

S. Hofmann, M. Thomschke, B. Lussem, and K. Leo, Opt. Express 19, A1250 (2011).

M. Furno, R. Meerheim, M. Thomschke, S. Hofmann, B. Lussem, and K. Leo, Proc. SPIE 7617, 761716 (2010).

Maekawa, Y.

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Meerheim, R.

M. Furno, R. Meerheim, M. Thomschke, S. Hofmann, B. Lussem, and K. Leo, Proc. SPIE 7617, 761716 (2010).

Minato, T.

Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).

Miwa, K.

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Mizukoshi, S.

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Mori, N.

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Mukai, K.

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, and K. Hamamoto, Appl. Phys. Lett. 100, 031108 (2012)

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, K. Hamamoto, IEICE Transactions on Electronics E94-C, 862 (2011)

Navaretti, P.

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, and K. Hamamoto, Appl. Phys. Lett. 100, 031108 (2012)

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, K. Hamamoto, IEICE Transactions on Electronics E94-C, 862 (2011)

Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).

Nowy, S.

S. Nowy, J. Frischeisen, and W. Brutting, Proc. SPIE 7415, 74151C (2009).

Ono, S.

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Prat, C.

B. Geffroy, P. l. Roy, and C. Prat, Polym. Int. 55, 572 (2006).

Revelli, J. F.

Roy, P. l.

B. Geffroy, P. l. Roy, and C. Prat, Polym. Int. 55, 572 (2006).

Shiang, J.

J. Shiang, T. Faircloth, and A. R. Duggal, Proc. SPIE 5214, 268 (2004).

Su, Y.

Sullivan, K. G.

Sun, Y.

Thomschke, M.

S. Hofmann, M. Thomschke, B. Lussem, and K. Leo, Opt. Express 19, A1250 (2011).

M. Furno, R. Meerheim, M. Thomschke, S. Hofmann, B. Lussem, and K. Leo, Proc. SPIE 7617, 761716 (2010).

Tsujimura, T.

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Tutt, L. W.

Velez, C.

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, and K. Hamamoto, Appl. Phys. Lett. 100, 031108 (2012)

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, K. Hamamoto, IEICE Transactions on Electronics E94-C, 862 (2011)

Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).

Wang, Q.

Wu, D.

Wu, P.

Xiang, Y.

Yang, G.

Yang, L.

Ye, Z.

Yoon, T.-H.

Zang, Z.

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, and K. Hamamoto, Appl. Phys. Lett. 100, 031108 (2012)

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, K. Hamamoto, IEICE Transactions on Electronics E94-C, 862 (2011)

Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).

Zhou, F.

Zhu, W.

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Appl. Opt.

Appl. Phys. Lett.

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, and K. Hamamoto, Appl. Phys. Lett. 100, 031108 (2012)

Chin. Opt. Lett.

IEEE Photon. Technol. Lett.

Z. Zang, T. Minato, P. Navaretti, Y. Hinokuma, M. Duelk, C. Velez, K. Hamamoto, IEEE Photon. Technol. Lett. 22, 721 (2010).

IEICE Transactions on Electronics

Z. Zang, K. Mukai, P. Navaretti, M. Duelk, C. Velez, K. Hamamoto, IEICE Transactions on Electronics E94-C, 862 (2011)

J. Mod. Opt.

W. L. Barnes, J. Mod. Opt. 45, 661 (1998).

J. Opt. Soc. Am. B

Opt. Express

Opt. Lett.

Polym. Int.

B. Geffroy, P. l. Roy, and C. Prat, Polym. Int. 55, 572 (2006).

Proc. of SID

T. Tsujimura, W. Zhu, S. Mizukoshi, N. Mori, K. Miwa, S. Ono, Y. Maekawa, K. kawabe, and M. Kohno, Proc. of SID 38, 84 (2007).

Proc. SPIE

S. Nowy, J. Frischeisen, and W. Brutting, Proc. SPIE 7415, 74151C (2009).

J. Shiang, T. Faircloth, and A. R. Duggal, Proc. SPIE 5214, 268 (2004).

M. Furno, R. Meerheim, M. Thomschke, S. Hofmann, B. Lussem, and K. Leo, Proc. SPIE 7617, 761716 (2010).

Other

H. A. Macleod, Thin-Film Optical Filters (4th edn). (CRC Press, Boca Raton, 2010).

T. Riedl, J. Meyer, H. Schmidt, T. Winkler, and W. Kowalsky, in Proceedings of Solid-State and Organic Lighting SOWB5 (2010).

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.