Abstract

Transient thermal impedance of GaN-based high-power white light emitting diodes (LEDs) is created using a thermal transient tester. An electro-thermal simulation shows that LED junction temperature (JT) rises to a very low degree under low duty cycle pulsed current. At the same JT, emission peaks are equivalent at pulsed and continuous currents. Moreover, the difference in peak wavelength when a LED is driven by pulsed and continuous currents initially decreases then increases with increasing pulse width. Thus, selecting an appropriate pulse width decreases errors in JT measurement.

© 2013 Chinese Optics Letters

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2013

J. J. Zhang, T. Zhang, Q. Zheng, and J. Meng, J. Optoelectronics. Laser. 24, 50 (2013).

2012

L. Yue, Y. L. Gao, Y. J. Lu, L. H. Zhu, Y. Zhang, and Z. Chen, Appl. Phys. Lett. 100, 202108 (2012).

P. Xu, C. Xia, F. Wu, X. Li, Q. Sai, G. Zhou, and X. Xu, Chin. Opt. Lett. 10, 021601 (2012).

K. H. Loo, Y. M. Lai, S. C. Tan, and C. K. Tse, IEEE Trans. Power. Electron. 27, 974 (2012).

2011

R. R. Zhuang, P. Cai, and J. L. Huang, Advanced Materials Research 399, 1034 (2011).

2010

A. Keppens, W. R. Ryckaert, G. Deconinck, and P. Hanselaer, J. Appl. Phys. 108, 043104 (2010).

J. J. Li, L. H. Zhang, A. X. Wang, C.W. Zhao, and L. Lin, Proc. SPIE 7852, 78521H (2010).

2009

Y. Qin, and J. G. Zhong, Chin. Opt. Lett. 7, 1146 (2009).

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, and W. Lu, in Proceedings of SPIE-The International Society for Optical Engineering, 7518 (2009).

2004

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H. Eugene, and N. Narendran, in Proceedings of SPIEThe International Society for Optical Engineering 93, 5187 (2004).

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth. 268, 449 (2004).

Cai, P.

R. R. Zhuang, P. Cai, and J. L. Huang, Advanced Materials Research 399, 1034 (2011).

Chen, Z.

L. Yue, Y. L. Gao, Y. J. Lu, L. H. Zhu, Y. Zhang, and Z. Chen, Appl. Phys. Lett. 100, 202108 (2012).

Deconinck, G.

A. Keppens, W. R. Ryckaert, G. Deconinck, and P. Hanselaer, J. Appl. Phys. 108, 043104 (2010).

Deng, L.

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth. 268, 449 (2004).

Eugene, H.

H. Eugene, and N. Narendran, in Proceedings of SPIEThe International Society for Optical Engineering 93, 5187 (2004).

Farkas, Gabor

Vladimir Szekely, Andras Poppe, and Gabor Farkas, in Proceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 105-112, 2004 (2004).

Freyssinier, J. P.

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth. 268, 449 (2004).

Gao, Y. L.

L. Yue, Y. L. Gao, Y. J. Lu, L. H. Zhu, Y. Zhang, and Z. Chen, Appl. Phys. Lett. 100, 202108 (2012).

Gu, Y.

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth. 268, 449 (2004).

Hanselaer, P.

A. Keppens, W. R. Ryckaert, G. Deconinck, and P. Hanselaer, J. Appl. Phys. 108, 043104 (2010).

He, S. M.

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, and W. Lu, in Proceedings of SPIE-The International Society for Optical Engineering, 7518 (2009).

Huang, J. L.

R. R. Zhuang, P. Cai, and J. L. Huang, Advanced Materials Research 399, 1034 (2011).

Keppens, A.

A. Keppens, W. R. Ryckaert, G. Deconinck, and P. Hanselaer, J. Appl. Phys. 108, 043104 (2010).

Lai, Y. M.

K. H. Loo, Y. M. Lai, S. C. Tan, and C. K. Tse, IEEE Trans. Power. Electron. 27, 974 (2012).

Li, J. J.

J. J. Li, L. H. Zhang, A. X. Wang, C.W. Zhao, and L. Lin, Proc. SPIE 7852, 78521H (2010).

Li, N.

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, and W. Lu, in Proceedings of SPIE-The International Society for Optical Engineering, 7518 (2009).

Li, X.

Lin, L.

J. J. Li, L. H. Zhang, A. X. Wang, C.W. Zhao, and L. Lin, Proc. SPIE 7852, 78521H (2010).

Liu, S. S.

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, and W. Lu, in Proceedings of SPIE-The International Society for Optical Engineering, 7518 (2009).

Loo, K. H.

K. H. Loo, Y. M. Lai, S. C. Tan, and C. K. Tse, IEEE Trans. Power. Electron. 27, 974 (2012).

Lu, W.

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, and W. Lu, in Proceedings of SPIE-The International Society for Optical Engineering, 7518 (2009).

Lu, Y. J.

L. Yue, Y. L. Gao, Y. J. Lu, L. H. Zhu, Y. Zhang, and Z. Chen, Appl. Phys. Lett. 100, 202108 (2012).

Meng, J.

J. J. Zhang, T. Zhang, Q. Zheng, and J. Meng, J. Optoelectronics. Laser. 24, 50 (2013).

Narendran, N.

H. Eugene, and N. Narendran, in Proceedings of SPIEThe International Society for Optical Engineering 93, 5187 (2004).

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth. 268, 449 (2004).

Poppe, Andras

Vladimir Szekely, Andras Poppe, and Gabor Farkas, in Proceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 105-112, 2004 (2004).

Qin, Y.

Ryckaert, W. R.

A. Keppens, W. R. Ryckaert, G. Deconinck, and P. Hanselaer, J. Appl. Phys. 108, 043104 (2010).

Sai, Q.

Szekely, Vladimir

Vladimir Szekely, Andras Poppe, and Gabor Farkas, in Proceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 105-112, 2004 (2004).

Tan, S. C.

K. H. Loo, Y. M. Lai, S. C. Tan, and C. K. Tse, IEEE Trans. Power. Electron. 27, 974 (2012).

Tse, C. K.

K. H. Loo, Y. M. Lai, S. C. Tan, and C. K. Tse, IEEE Trans. Power. Electron. 27, 974 (2012).

Wang, A. X.

J. J. Li, L. H. Zhang, A. X. Wang, C.W. Zhao, and L. Lin, Proc. SPIE 7852, 78521H (2010).

Wu, F.

Xia, C.

Xu, P.

Xu, X.

Yu, H.

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth. 268, 449 (2004).

Yue, L.

L. Yue, Y. L. Gao, Y. J. Lu, L. H. Zhu, Y. Zhang, and Z. Chen, Appl. Phys. Lett. 100, 202108 (2012).

Zhang, B.

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, and W. Lu, in Proceedings of SPIE-The International Society for Optical Engineering, 7518 (2009).

Zhang, J. J.

J. J. Zhang, T. Zhang, Q. Zheng, and J. Meng, J. Optoelectronics. Laser. 24, 50 (2013).

Zhang, L. H.

J. J. Li, L. H. Zhang, A. X. Wang, C.W. Zhao, and L. Lin, Proc. SPIE 7852, 78521H (2010).

Zhang, T.

J. J. Zhang, T. Zhang, Q. Zheng, and J. Meng, J. Optoelectronics. Laser. 24, 50 (2013).

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, and W. Lu, in Proceedings of SPIE-The International Society for Optical Engineering, 7518 (2009).

Zhang, Y.

L. Yue, Y. L. Gao, Y. J. Lu, L. H. Zhu, Y. Zhang, and Z. Chen, Appl. Phys. Lett. 100, 202108 (2012).

Zhao, C.W.

J. J. Li, L. H. Zhang, A. X. Wang, C.W. Zhao, and L. Lin, Proc. SPIE 7852, 78521H (2010).

Zheng, Q.

J. J. Zhang, T. Zhang, Q. Zheng, and J. Meng, J. Optoelectronics. Laser. 24, 50 (2013).

Zhong, J. G.

Zhou, G.

Zhu, L. H.

L. Yue, Y. L. Gao, Y. J. Lu, L. H. Zhu, Y. Zhang, and Z. Chen, Appl. Phys. Lett. 100, 202108 (2012).

Zhuang, R. R.

R. R. Zhuang, P. Cai, and J. L. Huang, Advanced Materials Research 399, 1034 (2011).

Advanced Materials Research

R. R. Zhuang, P. Cai, and J. L. Huang, Advanced Materials Research 399, 1034 (2011).

Appl. Phys. Lett.

L. Yue, Y. L. Gao, Y. J. Lu, L. H. Zhu, Y. Zhang, and Z. Chen, Appl. Phys. Lett. 100, 202108 (2012).

Chin. Opt. Lett.

IEEE Trans. Power. Electron.

K. H. Loo, Y. M. Lai, S. C. Tan, and C. K. Tse, IEEE Trans. Power. Electron. 27, 974 (2012).

in Proceedings of SPIE-The International Society for Optical Engineering 93, 5187 (2004).

H. Eugene, and N. Narendran, in Proceedings of SPIEThe International Society for Optical Engineering 93, 5187 (2004).

in Proceedings of SPIE-The International Society for Optical Engineering, 7518 (2009).

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, and W. Lu, in Proceedings of SPIE-The International Society for Optical Engineering, 7518 (2009).

in Proceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 105-112, 2004 (2004).

Vladimir Szekely, Andras Poppe, and Gabor Farkas, in Proceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 105-112, 2004 (2004).

J. Appl. Phys.

A. Keppens, W. R. Ryckaert, G. Deconinck, and P. Hanselaer, J. Appl. Phys. 108, 043104 (2010).

J. Cryst. Growth.

N. Narendran, Y. Gu, J. P. Freyssinier, H. Yu, and L. Deng, J. Cryst. Growth. 268, 449 (2004).

J. Optoelectronics. Laser.

J. J. Zhang, T. Zhang, Q. Zheng, and J. Meng, J. Optoelectronics. Laser. 24, 50 (2013).

Proc. SPIE

J. J. Li, L. H. Zhang, A. X. Wang, C.W. Zhao, and L. Lin, Proc. SPIE 7852, 78521H (2010).

Other

"Integrated circuits thermal measurement methodelectrical test method (single semiconductor device)," EIA/JESD51-1-1995, EIA/JEDEC Standard.

Mentor Graphics Corporation, "Thermal Transient Tester General Overview [EB/OL]", http://www.mentor.com/products/mechanical/products/ upload/ t3ster. pdf. 2011.

M. M¨arz, and P. Nance, "Thermal Modeling of Powerelectronic Systems", Infineon Technologies AG Munich, 2000.

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