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Optica Publishing Group
  • Chinese Optics Letters
  • Vol. 11,
  • Issue 7,
  • pp. 073101-
  • (2013)

Stress mechanism of pulsed laser-driven damage in thin film under nanosecond ultraviolet laser irradiation

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Abstract

An analytical model is derived to describe the stress mechanism in a thin film against the laser-induced damage threshold (LIDT) based on the thermal transfer equation. Different structures of high-reflection films at 355 nm are prepared to validate this model. LIDTs are found to have a linear relationship with stress. Furthermore, predictions from the simple model agree with the experiments.

© 2013 Chinese Optics Letters

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